Use of a fluorescent material to detect failure or deteriorated performance of a fluorometer

    公开(公告)号:US10732112B2

    公开(公告)日:2020-08-04

    申请号:US15902657

    申请日:2018-02-22

    Abstract: A system and method for self-checking a fluorometer for failure or deteriorated performance includes fluorescent reference standards mounted on a support to move with respect to one or more fixed fluorometers. The intensity of the fluorescent emission of the fluorescent reference standard is initially measured with the fluorometer, and, after a prescribed interval of usage of the fluorometer, a test measurement of the intensity of the fluorescent emission of the fluorescent standard is taken with the fluorometer. The test measurement is compared to the initial measurement, and failure or deteriorated performance of the fluorometer is determined based on a deviation of the test measurement from the initial measurement.

    ANALYZER SAMPLE DETECTION METHOD AND SYSTEM
    42.
    发明申请

    公开(公告)号:US20200225163A1

    公开(公告)日:2020-07-16

    申请号:US16828274

    申请日:2020-03-24

    Applicant: SciAps, Inc.

    Inventor: David R. Day

    Abstract: A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle. A camera receives light from the illumination source reflected off the sample for detecting the presence of the sample.

    Analyzer sample detection method and system

    公开(公告)号:US10697895B2

    公开(公告)日:2020-06-30

    申请号:US15982373

    申请日:2018-05-17

    Applicant: SciAps, Inc.

    Inventor: David R. Day

    Abstract: A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle and receives light from the illumination source reflected off the sample also via the detection fiber bundle for detecting the presence of the sample.

    LIGHT COLLECTION ARRANGEMENT FOR OPTICAL EMISSION SPECTROSCOPY

    公开(公告)号:US20200149962A1

    公开(公告)日:2020-05-14

    申请号:US16681323

    申请日:2019-11-12

    Inventor: Esa RÄIKKÖNEN

    Abstract: In accordance with an example embodiment of the invention, a detector assembly for an analyzer device for analysis of elemental composition of a sample using optical emission spectroscopy is provided. The detector assembly comprises an exciter for generating an excitation focused at a target position to invoke an optical emission from a surface of the sample at the target position; and a light collection arrangement for transferring the optical emission to a spectrometer. The light collection arrangement comprises a concave spherical mirror, an optical receiver arranged in an image point in the principal axis of the concave spherical mirror and a folding mirror including at least one aperture. The exciter is arranged with respect to the light collection arrangement such that the excitation is transferred towards the target position through said at least one aperture, and the folding mirror is arranged between the concave spherical mirror and the optical receiver such that the folding mirror folds the principal axis of the concave spherical mirror towards the target position and such that said at least one aperture is aligned with the principal axis of the concave spherical mirror to allow transferring optical emission reflected from the concave spherical mirror therethrough towards the optical receiver.

    METHOD AND DEVICE FOR SPECTRAL ANALYSIS OF A CHEMICAL COMPOSITION OF MOLTEN METALS

    公开(公告)号:US20200116642A1

    公开(公告)日:2020-04-16

    申请号:US16626898

    申请日:2018-06-29

    Abstract: The invention relates to the field of spectral analysis of the chemical composition of ferrous and non-ferrous metals and can be used in metallurgical factories to monitor the ongoing production of molten (liquid) electrically conductive materials directly in the melting units.A method for optical emission spectral analysis of the chemical composition of an electrically conductive metal melt includes the following steps: immersion of a refractory probe with a sampler into a container with a metal melt at an angle to its surface, ingress of the metal melt into the sampler due to the ferrostatic pressure and stabilization of its level due to an inert gas flow, excitation of plasma torch using electric spark from an electrode located inside the sampler, transfer of the plasma glow through the optical channel to the input of the spectrometer, receiving a spectrum of the chemical elements in the metal, processing this spectrum in the computer to evaluate composition and the mass fraction of the chemical elements in the melt, wherein when measuring the level of the liquid sample in the sampler is stabilized and maintained at the level of the lateral opening in the wall of the sampler due to the flow of inert gas, which is continuously fed into the probe and comes out as bubbles through the hole directly into the melt medium. The technical effect: increase in sensitivity and accuracy of spectral analysis of electrically conductive melts, increase in reliability and simplification of the device for plasma excitation.

    SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
    48.
    发明申请

    公开(公告)号:US20200096389A1

    公开(公告)日:2020-03-26

    申请号:US16612469

    申请日:2018-04-02

    Abstract: A spectrometry device includes: an integrating sphere which includes an inner wall surface and an attachment hole; an adapter which includes a guide hole guiding the measurement target light and is disposed in the integrating sphere; a plate which includes a first surface covering the guide hole from the outside of the integrating sphere and allowing a sample to be mounted thereon and a second surface and through which the measurement target light is transmitted; a holder which includes a concave portion mounting the plate thereon and is attached to the attachment hole; and a spectral detector configured to detect the measurement target light. The concave portion includes a bottom surface facing the second surface and a side surface surrounding the periphery of the plate. The bottom surface and the side surface are coated with a reflective material reflecting the measurement target light.

    MULTI-SPECTRAL METHOD FOR DETECTION OF ANOMALIES DURING POWDER BED FUSION ADDITIVE MANUFACTURING

    公开(公告)号:US20200061710A1

    公开(公告)日:2020-02-27

    申请号:US16540243

    申请日:2019-08-14

    Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.

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