-
41.发明授权公开(公告)号：US10732112B2
公开(公告)日：2020-08-04
申请号：US15902657
申请日：2018-02-22
Applicant: Gen-Probe Incorporated
Inventor： Haitao Li , David Opalsky , R. Eric Heinz , Norbert D. Hagen
Abstract: A system and method for self-checking a fluorometer for failure or deteriorated performance includes fluorescent reference standards mounted on a support to move with respect to one or more fixed fluorometers. The intensity of the fluorescent emission of the fluorescent reference standard is initially measured with the fluorometer, and, after a prescribed interval of usage of the fluorometer, a test measurement of the intensity of the fluorescent emission of the fluorescent standard is taken with the fluorometer. The test measurement is compared to the initial measurement, and failure or deteriorated performance of the fluorometer is determined based on a deviation of the test measurement from the initial measurement.
-
公开(公告)号：US20200225163A1
公开(公告)日：2020-07-16
申请号：US16828274
申请日：2020-03-24
Applicant: SciAps, Inc.
Inventor： David R. Day
Abstract: A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle. A camera receives light from the illumination source reflected off the sample for detecting the presence of the sample.
-
43.发明授权公开(公告)号：US10712275B2
公开(公告)日：2020-07-14
申请号：US16325894
申请日：2017-08-25
Applicant: The Texas A&M University System
Inventor： Peter M. Rentzepis , Thomas Cesario
IPC: G01N21/64 , G01J3/06 , G01J3/18 , G01J3/42 , G01J3/44 , G01J3/443 , G01J3/02 , G01J3/10 , G01N21/65
Abstract: A hand-held synchronous scan spectrometer for in situ analysis of bacteria, viruses, and fungi includes a housing that contains a light source, a first monochromator positioned to receive light from the light source and operable to direct a wavelength of the light from the light source towards a sample, a second monochromator positioned to receive fluoresced light from the sample and light from first monochromator, and a detector disposed within the housing and positioned to receive light output from the second monochromator. The hand-held synchronous scan spectrometer can include a display that is integrated into the housing or can utilize a display of a removable display device (e.g., a cell phone, PDA, tablet, and the like).
-
公开(公告)号：US10697895B2
公开(公告)日：2020-06-30
申请号：US15982373
申请日：2018-05-17
Applicant: SciAps, Inc.
Inventor： David R. Day
Abstract: A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle and receives light from the illumination source reflected off the sample also via the detection fiber bundle for detecting the presence of the sample.
-
公开(公告)号：US10692705B2
公开(公告)日：2020-06-23
申请号：US15351916
申请日：2016-11-15
Applicant: Tokyo Electron Limited
Inventor： Mihail Mihaylov , Xinkang Tian , Ching-Ling Meng , Jason Ferns , Joel Ng , Badru D. Hyatt , Zheng Yan , Vi Vuong
Abstract: An advanced optical sensor and method for detection of optical events in a plasma processing system. The method includes detecting at least one light emission signal in a plasma processing chamber. The at least one detected light emission signal including light emissions from an optical event. The method further includes processing the at least one light emission signal and detecting a signature of the optical event from the processed light emission signal.
-
Patent Agency Ranking
公开(公告)号：US20200149962A1
公开(公告)日：2020-05-14
申请号：US16681323
申请日：2019-11-12
Inventor： Esa RÄIKKÖNEN
Abstract: In accordance with an example embodiment of the invention, a detector assembly for an analyzer device for analysis of elemental composition of a sample using optical emission spectroscopy is provided. The detector assembly comprises an exciter for generating an excitation focused at a target position to invoke an optical emission from a surface of the sample at the target position; and a light collection arrangement for transferring the optical emission to a spectrometer. The light collection arrangement comprises a concave spherical mirror, an optical receiver arranged in an image point in the principal axis of the concave spherical mirror and a folding mirror including at least one aperture. The exciter is arranged with respect to the light collection arrangement such that the excitation is transferred towards the target position through said at least one aperture, and the folding mirror is arranged between the concave spherical mirror and the optical receiver such that the folding mirror folds the principal axis of the concave spherical mirror towards the target position and such that said at least one aperture is aligned with the principal axis of the concave spherical mirror to allow transferring optical emission reflected from the concave spherical mirror therethrough towards the optical receiver.
-
公开(公告)号：US20200116642A1
公开(公告)日：2020-04-16
申请号：US16626898
申请日：2018-06-29
Abstract: The invention relates to the field of spectral analysis of the chemical composition of ferrous and non-ferrous metals and can be used in metallurgical factories to monitor the ongoing production of molten (liquid) electrically conductive materials directly in the melting units.A method for optical emission spectral analysis of the chemical composition of an electrically conductive metal melt includes the following steps: immersion of a refractory probe with a sampler into a container with a metal melt at an angle to its surface, ingress of the metal melt into the sampler due to the ferrostatic pressure and stabilization of its level due to an inert gas flow, excitation of plasma torch using electric spark from an electrode located inside the sampler, transfer of the plasma glow through the optical channel to the input of the spectrometer, receiving a spectrum of the chemical elements in the metal, processing this spectrum in the computer to evaluate composition and the mass fraction of the chemical elements in the melt, wherein when measuring the level of the liquid sample in the sampler is stabilized and maintained at the level of the lateral opening in the wall of the sampler due to the flow of inert gas, which is continuously fed into the probe and comes out as bubbles through the hole directly into the melt medium. The technical effect: increase in sensitivity and accuracy of spectral analysis of electrically conductive melts, increase in reliability and simplification of the device for plasma excitation.
-
公开(公告)号：US20200096389A1
公开(公告)日：2020-03-26
申请号：US16612469
申请日：2018-04-02
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Kenichiro IKEMURA , Kazuya IGUCHI , Shigeru EURA , Akihiro NAKAMURA
Abstract: A spectrometry device includes: an integrating sphere which includes an inner wall surface and an attachment hole; an adapter which includes a guide hole guiding the measurement target light and is disposed in the integrating sphere; a plate which includes a first surface covering the guide hole from the outside of the integrating sphere and allowing a sample to be mounted thereon and a second surface and through which the measurement target light is transmitted; a holder which includes a concave portion mounting the plate thereon and is attached to the attachment hole; and a spectral detector configured to detect the measurement target light. The concave portion includes a bottom surface facing the second surface and a side surface surrounding the periphery of the plate. The bottom surface and the side surface are coated with a reflective material reflecting the measurement target light.
-
49.发明申请公开(公告)号：US20200061710A1
公开(公告)日：2020-02-27
申请号：US16540243
申请日：2019-08-14
Applicant: The Penn State Research Foundation
Inventor： Abdalla R. Nassar , Alexander J. Dunbar , Edward W. Reutzel
Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.
-
50.发明申请公开(公告)号：US20200049560A1
公开(公告)日：2020-02-13
申请号：US16293026
申请日：2019-03-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jeongil MUN , Hyung Joo LEE , Jongwoo SUN
Abstract: An optical emission spectroscopy system may include a reference light source, an analyzer to receive and analyze light transmitted from the reference light source, and a calibrator to calibrate light emitted from the reference light source. The calibrator may change a calibration ratio in accordance with an incidence angle of the light.
-
-
-
-
-
-
-
-
-
Search Results
772
records
(took 0.014 seconds)
