公开(公告)号：US20220212256A1

公开(公告)日：2022-07-07

申请号：US17655636

申请日：2022-03-21

Applicant: The Penn State Research Foundation

Inventor： Abdalla R. Nassar ,  Alexander J. Dunbar ,  Edward W. Reutzel

IPC: B22F10/20 ,  G01J3/02 ,  G01J3/443 ,  B33Y50/02

Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.

公开(公告)号：US11571747B2

公开(公告)日：2023-02-07

申请号：US17655636

申请日：2022-03-21

Applicant: The Penn State Research Foundation

Inventor： Abdalla R. Nassar ,  Alexander J. Dunbar ,  Edward W. Reutzel

IPC: G01J3/02 ,  B22F10/20 ,  G01J3/443 ,  B33Y50/02 ,  B33Y10/00 ,  G01J3/12 ,  B22F10/30

Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.

公开(公告)号：US11311943B2

公开(公告)日：2022-04-26

申请号：US16540243

申请日：2019-08-14

Applicant: The Penn State Research Foundation

Inventor： Abdalla R. Nassar ,  Alexander J. Dunbar ,  Edward W. Reutzel

IPC: G01J3/02 ,  B22F10/20 ,  G01J3/443 ,  B33Y50/02 ,  B33Y10/00 ,  G01J3/12 ,  B22F10/30

Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.

公开(公告)号：US11940325B2

公开(公告)日：2024-03-26

申请号：US17870051

申请日：2022-07-21

Applicant: The Penn State Research Foundation

Inventor： Abdalla R. Nassar ,  Alexander J. Dunbar ,  Edward W. Reutzel

IPC: G01J3/02 ,  B22F10/20 ,  B22F10/25 ,  B22F10/28 ,  B22F12/44 ,  B22F12/45 ,  B22F12/90 ,  B33Y50/02 ,  G01J3/36 ,  G01J3/443 ,  B22F10/30 ,  B22F10/366 ,  B22F10/38 ,  B33Y10/00 ,  G01J3/12

CPC classification number: G01J3/36 ,  B22F10/20 ,  B22F10/25 ,  B22F10/28 ,  B22F12/44 ,  B22F12/45 ,  B22F12/90 ,  B33Y50/02 ,  G01J3/0208 ,  G01J3/443 ,  B22F10/30 ,  B22F10/366 ,  B22F10/38 ,  B33Y10/00 ,  G01J2003/1213

Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.

公开(公告)号：US20230204420A1

公开(公告)日：2023-06-29

申请号：US17870051

申请日：2022-07-21

Applicant: The Penn State Research Foundation

Inventor： Abdalla R. Nassar ,  Alexander J. Dunbar ,  Edward W. Reutzel

IPC: G01J3/36 ,  G01J3/02 ,  G01J3/443 ,  B33Y50/02 ,  B22F10/25 ,  B22F10/28 ,  B22F12/44 ,  B22F12/45 ,  B22F12/90 ,  B22F10/20

CPC classification number: G01J3/36 ,  G01J3/0208 ,  G01J3/443 ,  B33Y50/02 ,  B22F10/25 ,  B22F10/28 ,  B22F12/44 ,  B22F12/45 ,  B22F12/90 ,  B22F10/20 ,  B33Y10/00

Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.

公开(公告)号：US20200061710A1

公开(公告)日：2020-02-27

申请号：US16540243

申请日：2019-08-14

Applicant: The Penn State Research Foundation

Inventor： Abdalla R. Nassar ,  Alexander J. Dunbar ,  Edward W. Reutzel

IPC: B22F3/105 ,  G01J3/02 ,  G01J3/443 ,  B33Y50/02

Abstract: Embodiments of the systems can be configured to receive electromagnetic emissions of a substrate (e.g., a build material of a part being made via additive manufacturing) by a detector (e.g., a multi-spectral sensor) and generate a ratio of the electromagnetic emissions to perform spectral analysis with a reduced dependence on location and orientation of a surface of the substrate relative to the multi-spectral sensor. The additive manufacturing process can involve use of a laser to generate a laser beam for fusion of the build material into the part. The system can be configured to set the multi-spectral sensor off-axis with respect to the laser (e.g., an optical path of the multi-spectral sensor is at an angle that is different than the angle of incidence of the laser beam). This can allow the multi-spectral sensor to collect spectral data simultaneously as the laser is used to build the part.