公开(公告)号：US10323987B2

公开(公告)日：2019-06-18

申请号：US15873795

申请日：2018-01-17

Applicant: Apple Inc.

Inventor： Miikka M. Kangas ,  Michael J. Bishop ,  Robert Chen ,  David I. Simon ,  Harold L. Sontag, III ,  George Dee Skidmore

IPC: G01J4/00 ,  G01J5/08 ,  G01J5/02 ,  G01J5/20 ,  G01J4/04

Abstract: This relates to sensor systems, detectors, imagers, and readout integrated circuits (ROICs) configured to selectively detect one or more frequencies or polarizations of light, capable of operating with a wide dynamic range, or any combination thereof. In some examples, the detector can include one or more light absorbers; the patterns and/or properties of a light absorber can be configured based on the desired measurement wavelength range and/or polarization direction. In some examples, the detector can comprise a plurality of at least partially overlapping light absorbers for enhanced dynamic range detection. In some examples, the detector can be capable of electrostatic tuning for one or more flux levels by varying the response time or sensitivity to account for various flux levels. In some examples, the ROIC can be capable of dynamically adjusting at least one of the frame rate integrating capacitance, and power of the illumination source.

公开(公告)号：US10309834B2

公开(公告)日：2019-06-04

申请号：US15570557

申请日：2016-04-14

Applicant: RAINTREE SCIENTIFIC INSTRUMENTS (SHANGHAI) CORPORATION

Inventor： Fengjiao Zhong ,  Haijun Gao ,  Jiangtao Dang

IPC: G01J4/04 ,  G01M11/02

Abstract: The present disclosure discloses a calibrating method, apparatus, and corresponding measurement system for a composite waveplate. The calibrating method comprises: A. determining a first matrix characterizing the composite waveplate, the first matrix including at least one unknown number; B. determining a theoretical relationship between a light intensity and an alignment angle offset value of the composite waveplate based on the first matrix; and C. calibrating based on the theoretical relationship between a light intensity and an alignment angle offset value of the composite waveplate determined in step (B) and actually measured light intensity data to obtain a second matrix that may characterize the composite waveplate and does not contain the unknown number. The technical solution of the present disclosure may greatly reduce the amount of unknown numbers when calibrating a composite waveplate or a measuring system, thereby lowering the difficulty of calibration and improving the precision of calibration.

公开(公告)号：US20190086597A1

公开(公告)日：2019-03-21

申请号：US16081913

申请日：2017-02-28

Applicant: AUTOCLONING TECHNOLOGY, LTD. ,  PHOTONIC LATTICE, INC. ,  SOPHIA SCHOOL CORPORATION ,  KEIO UNIVERSITY

Inventor： Shojiro KAWAKAMI ,  Takayuki KAWASHIMA ,  Takafumi CHIBA ,  Toshikazu IJIRO ,  Hiroyuki TSUDA ,  Hiroshi TAKAHASHI

IPC: G02B5/30 ,  G02B5/18 ,  G02B1/00 ,  G01N21/21 ,  G01J4/04 ,  G02B1/02

Abstract: To provide a volume-type optical element in which a self-cloning photonic crystal is used. An optical element is provided with half-wave plates of photonic crystals formed on the xy plane and laminated in the z-axis direction in a three-dimensional space x, y, z. The groove direction of the photonic crystals is a curved line, and the angle in relation to the y-axis direction changes continuously in the range of 0°-180°. Light entering the optical element in the axial direction is emitted from the optical element upon being divided and converted into clockwise circularly polarized light in the direction facing the x-axis by a given angle from the z-axis and anticlockwise circularly polarized light in the direction facing the −x-axis by a given angle from the z-axis. Laminating or placing a quarter-wave plate comprising a photonic crystal on one or both surfaces makes it possible to divide light entering from the z-axis direction of the optical element into two orthogonal linearly polarized lights.

公开(公告)号：US10215642B2

公开(公告)日：2019-02-26

申请号：US13986602

申请日：2013-05-17

Applicant: George C. Giakos

Inventor： George C. Giakos

IPC: G01J4/04 ,  G01N21/23

Abstract: A system and method for detection of a target object/material includes identifying a polarimetric signal for a plurality of aspect angles. One/two-dimensional Mueller matrix image or one/two-dimensional Stokes vector image can be processed using power spectral analysis, wavelet and fractal analysis for further image, having increased discrimination with reduced false-ratio. In addition, each of the angular polarization states due to their association with a particular aspect angle are then cross-correlated to generate a two-dimensional image that relates the level of correlation with the aspect angle. Finally, the output information, including statistical parameters are fed to the input of a neural-fuzzy network for further optimization and image enhancement.

公开(公告)号：US20190056273A1

公开(公告)日：2019-02-21

申请号：US16024415

申请日：2018-06-29

Applicant: Polaris Sensor Technologies, Inc.

Inventor： J. Larry Pezzaniti

IPC: G01J4/02 ,  G01J3/02 ,  G02B5/30 ,  G01J4/04

CPC classification number: G01J4/02 ,  G01J3/0208 ,  G01J3/0229 ,  G01J4/04 ,  G01J5/58 ,  G01J2005/586 ,  G02B3/0006 ,  G02B5/30 ,  G02B5/3025 ,  G02B5/3058

Abstract: A short wave infrared polarimeter comprising a pixelated polarizer array and an Indium-Gallium-Arsenide (“InGaAs”) focal plane array. The short wave infrared polarimeter optionally includes a micro-lens array and/or an aperture layer

公开(公告)号：US10209528B1

公开(公告)日：2019-02-19

申请号：US14545713

申请日：2015-06-09

Applicant: J.A. WOOLLAM CO., INC.

Inventor： Martin M. Liphardt

IPC: G01J4/00 ,  G02B27/09 ,  G02B5/20 ,  G01J4/04

Abstract: A combination of a focusing element, and a filtering element which naturally adjusts the cross-sectional area of a beam of electromagnetic radiation passed through the focusing element as a function of wavelength over a specified range of wavelengths, wherein the filtering element is not uniform, but rather varies as a selection from the group consisting of: optical density and/or thickness is greatest near the center thereof; and optical density and/or thickness is smallest near the center thereof; and can demonstrate neutral density characteristics outside the specified range of wavelengths. The combination of a focusing element, and a filtering element can optionally be present in an ellipsometer or polarimeter system.

公开(公告)号：US20190049745A1

公开(公告)日：2019-02-14

申请号：US16162275

申请日：2018-10-16

Applicant: Raytheon Company

Inventor： Eric C. Fest ,  Jon E. Leigh

IPC: G02B27/28 ,  G02B5/30 ,  G02B5/20 ,  G06T7/33 ,  G01J4/04

Abstract: Polarized pixelated filter sub-array is reconfigured to reduce sensitivity to misalignment. The condition number increases more slowly than the standard polarized pixelated filter sub-array as the misalignment increases. In different embodiments, the filter sub-array is configured such that the condition number has a finite bound at ½ pixel misalignment. The angular values of the polarizer filter array are determined to minimize the sensitivity of the condition number of the data reduction matrix to misalignment. This can be achieved by selecting angular values that minimize the expected value of the condition number E(CN) over the range of misalignment.

公开(公告)号：US20190025196A1

公开(公告)日：2019-01-24

申请号：US16041789

申请日：2018-07-21

Applicant: Ningbo Molian Materials Technology Inc.

Inventor： Xiao-ping WANG ,  Xiao-dong XIANG

IPC: G01N21/21 ,  H01S3/10 ,  G01J4/04

Abstract: A material transport property measurement system includes an ellipsometry system, a heat capacity measurement system, and a controller. The ellipsometry system has a light source to generate a light which passes through a polarizer and shines on a sample. The sample reflects the light to an integrated polarization analyzer, which includes multiple polarizers with different polarization angles distributed from 0 to 180 degrees. A detector assembly includes multiple detectors corresponding to the multiple polarizers to detect light passing through the respective polarizers and generate multiple first electrical signals. The heat capacity measurement system measures a temperature parameter of the sample using a non-contact method, and outputs a second electrical signal. The controller analyzes the second and the multiple first electrical signals to obtain the transport properties of the material. A material transport property measurement method is also provided.

公开(公告)号：US10175160B1

公开(公告)日：2019-01-08

申请号：US15932748

申请日：2018-04-20

Applicant: J.A. Woollam Co., Inc.

Inventor： Stefan Schoeche ,  Jeremy A. Van Derslice ,  Jeffrey S. Hale ,  Craig M. Herzinger

IPC: G01J4/00 ,  G01N21/21 ,  G01J3/447 ,  G01B11/06 ,  G01J4/04

Abstract: Methodology of characterizing pore size distribution in a porous thin film having a surface, or in a surface region of a porous semi-infinite bulk substrate having a surface, involving applying a mathematical model of a sample based on effective medium approaches, such as the Bruggeman effective medium approach.

公开(公告)号：US10132684B1

公开(公告)日：2018-11-20

申请号：US15330430

申请日：2016-09-20

Applicant: J.A. WOOLLAM CO., INC

Inventor： Jeremy A. Van Derslice ,  Martin M. Liphardt

IPC: G01J3/42 ,  G01J4/04 ,  G01J3/18 ,  G01J3/14 ,  G01J1/42

Abstract: Reflectometer, spectrophotometer, ellipsometer, and polarimeter systems having a supercontinuum laser source of coherent electromagnetic radiation over a range of about 400-about 2500 nm, a stage for supporting a sample and a detector of electromagnetic radiation, wherein the supercontinuum source provides a coherent beam of electromagnetic radiation which interacts with a sample, and the detector system comprises functional combinations of gratings and/or combination dichroic beam splitter-prisms, which themselves can be optimized as regards wavelength dispersion characteristics, directs wavelengths in various ranges to various detectors that are well suited to detect them.