中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

88 records (took 0.035 seconds)

    SENSOR APPARATUS TO DETERMINE A VALUE OF A CHEMICAL PARAMETER BASED ON A COLOR SHADE AND METHODS THEREOF
    53.
    发明申请
    SENSOR APPARATUS TO DETERMINE A VALUE OF A CHEMICAL PARAMETER BASED ON A COLOR SHADE AND METHODS THEREOF 有权
    用于确定基于颜色沙哑的化学参数的值的传感器装置及其方法

    公开(公告)号：US20160091433A1

    公开(公告)日：2016-03-31

    申请号：US14497384

    申请日：2014-09-26

    Applicant: AMIT S. BAXI ,  VINCENT S. MAGESHKUMAR

    Inventor： AMIT S. BAXI ,  VINCENT S. MAGESHKUMAR

    IPC: G01N21/78 ,  G01N21/80 ,  G01N21/25

    CPC classification number: G01N21/78 ,  G01N21/251 ,  G01N21/255 ,  G01N21/80 ,  G01N2021/0181 ,  G01N2021/7773 ,  G01N2201/0627 ,  G01N2201/0635 ,  G01N2201/125 ,  G01N2201/13

    Abstract: Apparatus and methods may provide for determining a value of chemical parameter. One or more light emitters may be positioned within a housing to emit light through an aperture of the housing. The emitted light may illuminate a color area of a structure that is separable from the housing, such as a test strip, a printed color reference, and so on. A color sensor may be positioned within the housing to capture reflected light and to convert the reflected light to an initial digitized color space that may be usable to determine a color shade of a color area. The reflected light may, for example, be captured independently at least of a dimension (e.g., predetermined size, shape, etc.) of the color area.

    Abstract translation: 装置和方法可以提供用于确定化学参数的值。 一个或多个光发射器可以定位在壳体内以通过壳体的孔发光。 发射的光可以照亮可与壳体分离的结构的颜色区域，例如测试条，印刷的颜色基准等。 颜色传感器可以定位在壳体内以捕获反射光并将反射光转换成可用于确定颜色区域的色调的初始数字化颜色空间。 反射光可以例如至少独立地捕捉颜色区域的尺寸（例如，预定尺寸，形状等）。

    METHOD AND SYSTEM FOR REAL TIME INSPECTION OF A SILICON WAFER
    57.
    发明申请
    METHOD AND SYSTEM FOR REAL TIME INSPECTION OF A SILICON WAFER 审中-公开
    用于实时检测硅波的方法和系统

    公开(公告)号：US20150069247A1

    公开(公告)日：2015-03-12

    申请号：US14394616

    申请日：2013-04-14

    Applicant: NANYANG TECHNOLOGICAL UNIVERSITY

    Inventor： Anand Krishna Asundi ,  Chi Seng Ng

    IPC: G01N21/95 ,  G01N21/88

    CPC classification number: G01N21/9501 ,  G01N21/23 ,  G01N21/8806 ,  G01N21/9505 ,  G01N2021/8848 ,  G01N2201/062 ,  G01N2201/125

    Abstract: There is provided a method and system for real time inspection of a silicon wafer. The method includes using an infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer, the image showing stress patterns; and assessment of the stress patterns. The stress patterns in a form of at least one butterfly pattern indicates a presence of at least one of: at least one trapped particle, trapped gases and at least one de-bonding region. No computer/algorithm processing is carried out to locate defects/de-bondings at the bonded interface. Furthermore, the stress fields being generated can be used to approximate the size of the de-bonding region/trapped particle. The system employs the infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer.

    Abstract translation: 提供了一种用于硅晶片实时检测的方法和系统。 该方法包括使用红外平面偏振器来获得硅晶片的键合界面的图像，该图像显示出应力模式; 并评估压力模式。 至少一个蝶形图案形式的应力模式表示存在至少一种捕获的颗粒，捕获的气体和至少一个去粘合区域中的至少一种。 不进行计算机/算法处理来定位键合界面处的缺陷/去粘合。 此外，产生的应力场可以用于近似去结合区域/捕获的颗粒的尺寸。 该系统采用红外平面偏振器来获得硅晶片的键合界面的图像。

    Universal Rapid Diagnostic Test Reader with Trans-Visual Sensitivity
    58.
    发明申请
    Universal Rapid Diagnostic Test Reader with Trans-Visual Sensitivity 审中-公开
    具有跨视觉灵敏度的通用快速诊断测试读取器

    公开(公告)号：US20150056719A1

    公开(公告)日：2015-02-26

    申请号：US14313615

    申请日：2014-06-24

    Applicant: Neven Karlovac ,  Onur Mudanyali ,  Sophie Lorraine Gerrick ,  Ray Carlisle Delcher ,  Derek Kuochao Tseng

    Inventor： Neven Karlovac ,  Onur Mudanyali ,  Sophie Lorraine Gerrick ,  Ray Carlisle Delcher ,  Derek Kuochao Tseng

    IPC: G01N21/59 ,  H04N7/18 ,  H04N5/235 ,  G01N21/55

    CPC classification number: G01N21/59 ,  G01N21/55 ,  G01N21/8483 ,  G01N33/48785 ,  G01N2021/1765 ,  G01N2201/062 ,  G01N2201/125 ,  H04M1/72527 ,  H04M2250/52 ,  H04N5/2354 ,  H04N7/18

    Abstract: A universal rapid diagnostics test reader is disclosed and described herein that includes a set of control electronics, a digital camera component, an illumination component, a housing component, and a rapid diagnostics test tray, wherein the tray can hold at least one rapid diagnostics test having a shape and a size in a fixed position relative to the digital camera component and the illumination component, and wherein the reader can accommodate more than one different rapid diagnostics test. Methods are also disclosed that include: providing at least one first rapid diagnostics test having a first physical size, first feature and first format; providing at least one second rapid diagnostics test having a second physical size, second feature and second format; inserting the first rapid diagnostics test in a universal rapid diagnostics test reader; analyzing the first rapid diagnostics test using the universal rapid diagnostics test reader; removing the first rapid diagnostics test from the reader; inserting the second rapid diagnostics test in a universal rapid diagnostics test reader without any mechanical adjustments of the reader or without the use of any additional parts or additional inserts; and analyzing the second rapid diagnostics test using the universal rapid diagnostics test reader.

    Abstract translation: 本文公开和描述了一种通用快速诊断测试读取器，其包括一组控制电子设备，数字照相机部件，照明部件，外壳部件和快速诊断测试托盘，其中托盘可以容纳至少一个快速诊断测试 具有相对于数字照相机部件和照明部件的固定位置的形状和尺寸，并且其中读取器可容纳多于一种不同的快速诊断测试。 还公开了包括：提供具有第一物理尺寸，第一特征和第一格式的至少一个第一快速诊断测试的方法; 提供具有第二物理尺寸，第二特征和第二格式的至少一个第二快速诊断测试; 将第一个快速诊断测试插入通用快速诊断测试读取器; 使用通用快速诊断测试阅读器分析第一次快速诊断测试; 从阅读器中删除第一个快速诊断测试; 将第二个快速诊断测试插入通用快速诊断测试读取器，无需读取器的任何机械调整或不使用任何附加部件或附加插入件; 并使用通用快速诊断测试读取器分析第二次快速诊断测试。

Patent Agency Ranking