公开(公告)号：US20120147362A1

公开(公告)日：2012-06-14

申请号：US13323456

申请日：2011-12-12

Applicant: Blake Crowther ,  James Peterson

Inventor： Blake Crowther ,  James Peterson

IPC: G01J1/42

CPC classification number: G01J1/029 ,  G01J1/0295 ,  G01J1/0425 ,  G01J1/0474 ,  G01J1/0488 ,  G01J1/4228 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0294 ,  G01J3/0297 ,  G01J3/2803 ,  G01J3/42 ,  G02B6/4206

Abstract: For transferring optical energy, a first multimode wave guide transmits radiant energy with a homogenized beam to a first plurality of optical sensors of an array of optical sensors. The array measures the homogenized radiant energy. Each optical sensor of the first plurality of optical sensors measures a pixelized portion of the homogenized radiant energy. A method and system also perform the functions of the apparatus.

Abstract translation: 为了传送光能，第一多模波导将具有均匀化光束的辐射能传递到光学传感器阵列的第一多个光学传感器。 阵列测量均匀的辐射能。 第一多个光学传感器的每个光学传感器测量均匀辐射能的像素化部分。 一种方法和系统还执行该装置的功能。

公开(公告)号：US07642516B2

公开(公告)日：2010-01-05

申请号：US11870341

申请日：2007-10-10

Applicant: Juergen Stein ,  Guntram Pausch ,  Karen Saucke

Inventor： Juergen Stein ,  Guntram Pausch ,  Karen Saucke

IPC: G01T1/15

CPC classification number: H05B33/0818 ,  G01J1/02 ,  G01J1/0295 ,  G01J1/08 ,  G01J1/30 ,  G01T1/40 ,  H05B33/0854 ,  Y02B20/346

Abstract: Method for correction of the temperature dependency of a light quantity L emitted by a light emitting diode (LED), being operated in pulsed mode with substantially constant pulse duration tP, and measured in a light detector, using a predetermined parameter X, correlated to the temperature T of the LED in a predetermined ratio, whereby a correction factor K is determined from the parameter X, preferably using a calibration table, especially preferred using an analytic predetermined function, whereby the measured emitted light quantity L is corrected for the temperature contingent fluctuations of the emitted light quantity, whereby the parameter X is determined from at least two output signals of the LED, which are related to each other in a predetermined manner.

Abstract translation: 用于校正由发光二极管（LED）发射的光量L的温度依赖性的方法，其以脉冲模式以基本恒定的脉冲持续时间tP操作，并且在光检测器中使用预定参数X测量，所述预定参数X与 LED的温度T以预定比例从参数X确定，优选使用校准表，使用分析预定功能是特别优选的，由此测量的发射光量L被校正为温度偶然波动 从而根据预定方式彼此相关的LED的至少两个输出信号来确定参数X。

公开(公告)号：US07554662B1

公开(公告)日：2009-06-30

申请号：US11648060

申请日：2006-12-29

Applicant: Martin M. Liphardt ,  Ping He ,  Blaine D. Johs ,  Craig M. Herzinger

Inventor： Martin M. Liphardt ,  Ping He ,  Blaine D. Johs ,  Craig M. Herzinger

IPC: G01J4/00

CPC classification number: G01N21/211 ,  G01J1/02 ,  G01J1/0295 ,  G01J1/04 ,  G01J1/0451 ,  G01N21/55 ,  G02B27/46

Abstract: Systems which utilize electromagnetic radiation to investigate samples and include at least one spatial filter which has an aperture having a hole therethrough with a non-unity aspect ratio.

Abstract translation: 利用电磁辐射来研究样品并且包括至少一个空间滤光器的系统，所述至少一个空间滤光器具有孔，所述孔具有非均匀纵横比的通孔。

公开(公告)号：US20070200052A1

公开(公告)日：2007-08-30

申请号：US11649877

申请日：2007-01-05

Applicant: Volker Seyfried ,  Frank Schreiber

Inventor： Volker Seyfried ,  Frank Schreiber

IPC: G02B27/40

CPC classification number: H01L27/14806 ,  G01J1/02 ,  G01J1/0295 ,  G01J1/04 ,  G01J1/0414 ,  G01J1/0437 ,  G01J1/0444 ,  G01J1/0488 ,  G01J1/08 ,  G01J1/10

Abstract: An apparatus, a microscope having an apparatus, and a method for calibration of a photosensor chip (19) are disclosed. The apparatus has a photosensor chip (19) which has a multiplicity of light-sensitive elements. A reference light source (30) is provided and directs the light at at least one part of the photosensor chip (19). In addition, an open-loop or closed-loop control unit (19a) is provided and determines and corrects variances between the individual light-sensitive elements.

Abstract translation: 公开了一种装置，具有装置的显微镜和用于校准光传感器芯片（19）的方法。 该装置具有光传感器芯片（19），其具有多个感光元件。 提供参考光源（30）并将光引导到光传感器芯片（19）的至少一部分。 此外，提供开环或闭环控制单元（19a），并确定和校正各个感光元件之间的差异。

公开(公告)号：US20060243909A1

公开(公告)日：2006-11-02

申请号：US11384574

申请日：2006-03-20

Applicant: Stephen Cerwin ,  David Chang

Inventor： Stephen Cerwin ,  David Chang

IPC: G01J1/00

CPC classification number: G01J1/42 ,  G01J1/02 ,  G01J1/0295 ,  G01J1/04 ,  G01J1/0422 ,  G01J1/044 ,  G01J1/0459

Abstract: A sensitive photon detection system generates an electronic photon sensor signal as a K factor times a number N photons per unit time. The system is configured by combining a separate optical amplifier with a gain factor K1 with a photo detector with a gain factor K2 such that K may be realized as the product of K1 and K2. The values of K1 and K2 are chosen to meet a predetermined K while optimizing a signal quality of the photon sensor signal. The optical amplifier may be preceded by a photon gathering device and/or a light chopping device to further optimize system performance. Further, the photon sensor signal may be further processed analog circuitry or may be digitized and processed using digital signal processing to generate an enhanced photon sensor signal with enhanced signal quality by adding gain and/or bandwidth limiting.

Abstract translation: 敏感光子检测系统产生电子光子传感器信号作为每单位时间数N个光子的K因子。 该系统通过将具有增益因子K 1的单独光学放大器与增益因子K 2的光电检测器组合，使得可以实现K作为K 1和K 2的乘积来配置该系统。 选择K 1和K 2的值以在优化光子传感器信号的信号质量的同时满足预定的K。 光放大器之前可以有光子收集装置和/或光斩波装置，以进一步优化系统性能。 此外，光子传感器信号可以进一步处理模拟电路，或者可以使用数字信号处理进行数字化和处理，以通过增加增益和/或带宽限制来产生增强的信号质量的增强的光子传感器信号。

公开(公告)号：US20050263680A1

公开(公告)日：2005-12-01

申请号：US11128119

申请日：2005-05-10

Applicant: Juergen Stein ,  Guntram Pausch ,  Karen Saucke

Inventor： Juergen Stein ,  Guntram Pausch ,  Karen Saucke

IPC: G12B13/00 ,  H01J7/24 ,  H05B33/08

CPC classification number: H05B33/0818 ,  G01J1/02 ,  G01J1/0295 ,  G01J1/08 ,  G01J1/30 ,  G01T1/40 ,  H05B33/0854 ,  Y02B20/346

Abstract: Method for correction of the temperature dependency of a light quantity L emitted by a light emitting diode (LED), being operated in pulsed mode with substantially constant pulse duration tP, and measured in a light detector, using a predetermined parameter X, correlated to the temperature T of the LED in a predetermined ratio, whereby a correction factor K is determined from the parameter X, preferably using a calibration table, especially preferred using an analytic predetermined function, whereby the measured emitted light quantity L is corrected for the temperature contingent fluctuations of the emitted light quantity, whereby the parameter X is determined from at least two output signals of the LED, which are related to each other in a predetermined manner.

Abstract translation: 用于校正由发光二极管（LED）发射的光量L的温度依赖性的方法，其以脉冲模式以基本上恒定的脉冲持续时间t P P运行，并且在光检测器中测量，使用 预定参数X，以预定比例与LED的温度T相关，由此，优选使用校准表，从参数X确定校正因子K，特别优选使用分析预定功能，由此测量的发射光量 根据发射光量的温度偶然波动来校正L，由此根据预定方式彼此相关的LED的至少两个输出信号来确定参数X.

公开(公告)号：US20240271995A1

公开(公告)日：2024-08-15

申请号：US18405386

申请日：2024-01-05

Applicant: Yokogawa Electric Corporation ,  Yokogawa Test & Measurement Corporation

Inventor： Kouichi Kataoka

IPC: G01J1/02 ,  G01J1/42

CPC classification number: G01J1/0295 ,  G01J1/42

Abstract: A measuring instrument with built-in calibration data is capable of traceable measurement. The measuring instrument with built-in calibration data includes a sensor, a calibration data manager storing calibration data of the measuring instrument with built-in calibration data, a setting data manager storing a setting condition of the measuring instrument with built-in calibration data, a memory capable of storing a measurement value measured by the sensor, and a traceability determiner. The calibration data includes calibration results and calibration conditions, the calibration results indicating a difference in measurement results from a higher-level standard. Each calibration result is associated with the calibration condition at the time at which the calibration result was acquired. The traceability determiner compares the setting condition and the measurement value to the calibration conditions, calculates, in a case in which there exists a calibration condition that matches the setting condition and the measurement value, a calibrated measurement value by correcting the measurement value with the calibration result associated with the calibration condition, and stores the calculated calibrated measurement value in the memory.

公开(公告)号：US11815519B2

公开(公告)日：2023-11-14

申请号：US16632321

申请日：2018-07-16

Applicant: Siemens Healthcare Diagnostics Inc.

Inventor： Patrick Wissmann ,  Benjamin S. Pollack

IPC: G06T7/12 ,  G01N35/00 ,  G01J1/02 ,  G06T7/00 ,  G06T7/80 ,  G06V10/143 ,  G06V20/69 ,  G06V10/60

CPC classification number: G01N35/00732 ,  G01J1/0295 ,  G01N35/00623 ,  G01N35/00693 ,  G06T7/0012 ,  G06T7/80 ,  G06V10/143 ,  G06V20/698 ,  G06V10/60

Abstract: A quality check module for characterizing a specimen and/or a specimen container including stray light compensation. The quality check module includes an imaging location within the quality check module configured to receive a specimen container containing a specimen, one or more image capture devices configured to capture images of the imaging location from one or more viewpoints, and one or more light sources configured to provide back lighting for the one or more image capture devices, and one or more stray light patches located in an area receiving stray light from the one or more light sources enabling stray light affecting the images to be compensated for and to provide a stray light compensated image. Calibration methods, methods of characterizing a specimen, specimen testing apparatus including a quality check module, and specimen container carriers including one or more stray light patches are provided, as are other aspects.

公开(公告)号：US20230332942A1

公开(公告)日：2023-10-19

申请号：US18028764

申请日：2021-08-24

Applicant: Mitsubishi Electric Corporation

Inventor： Masaaki SHIMATANI ,  Shimpei OGAWA ,  Shoichiro FUKUSHIMA ,  Satoshi OKUDA

IPC: G01J1/02 ,  H01L31/036 ,  G01R31/12

CPC classification number: G01J1/0295 ,  H01L31/036 ,  G01R31/129

Abstract: An electromagnetic wave detector includes a semiconductor layer, a two-dimensional material layer, a first electrode portion, a second electrode portion, and a ferroelectric layer. Two-dimensional material layer is electrically connected to semiconductor layer. First electrode portion is electrically connected to two-dimensional material layer. Second electrode portion is electrically connected to two-dimensional material layer with semiconductor layer interposed therebetween. Ferroelectric layer is electrically connected to at least any one of first electrode portion, second electrode portion and semiconductor layer. Electromagnetic wave detector is configured such that an electric field generated from ferroelectric layer is shielded with respect to two-dimensional material layer. Alternatively, ferroelectric layer is arranged so as not to be overlapped with two-dimensional material layer in plan view.

公开(公告)号：US20230304854A1

公开(公告)日：2023-09-28

申请号：US17975675

申请日：2022-10-28

Applicant: Guangzhou Diligine Photonics Co., Ltd.

Inventor： Qiang XUE ,  Quan ZHOU ,  Wenjie LIU

IPC: G01J1/02 ,  G01J1/42 ,  G01J1/04

CPC classification number: G01J1/0295 ,  G01J1/4257 ,  G01J1/0411

Abstract: An optical-path calibration module is provided. The optical-path calibration module defines a first light inlet, a second light inlet, and a first light outlet, and a first light-splitting device is disposed in the optical-path calibration module. The first light inlet is configured to receive a calibration beam of a calibration light-source or be closed. The second light inlet is configured to receive a target-light-source beam or the calibration beam from the calibration light-source. The first light outlet is configured to emit a detection beam to a photoelectric sensor. An angle of 45° is defined between the first light-splitting device and each of the first light inlet and the second light inlet.