Multispectral filter
    1.
    发明授权

    公开(公告)号:US12111211B2

    公开(公告)日:2024-10-08

    申请号:US18323463

    申请日:2023-05-25

    Inventor: Michael Klimek

    CPC classification number: G01J3/2823 G01J3/0294 G01J3/2803 G01J2003/2826

    Abstract: An optical device may comprise an array of sensor elements that includes a plurality of pixels and a multispectral filter disposed on the array of sensor elements. The multispectral filter may be configured to pass a first transmission percentage of light of a particular spectral range to a first set of pixels of the plurality of pixels and pass a second transmission percentage of light of the particular spectral range to a second set of pixels of the plurality of pixels.

    Spectroscopic analysis device and spectroscopic analysis method

    公开(公告)号:US12050128B2

    公开(公告)日:2024-07-30

    申请号:US17755550

    申请日:2020-10-20

    Abstract: A spectroscopic analysis device (1) according to the present disclosure includes a controller (40) that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L1) irradiated by an irradiator (10) with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

    On-chip temperature-insensitive read-out

    公开(公告)号:US12018984B2

    公开(公告)日:2024-06-25

    申请号:US17776032

    申请日:2020-11-18

    Abstract: A temperature compensation method for wavelength monitoring using spectrometers on photonic integrated chips and a related temperature-compensated wavelength monitoring device include an optical filter of the chip filters a source signal to provide at least one spectral reference line to a first spectrometer to detect thermal wavelength drifts thereof. At least one spectral line to be monitored is received by the same or another spectrometer of the chip to detect wavelength shifts thereof. The detected thermal drift of the reference line is compared to calibrated thermal drifts for the reference line which is associated with a calibrated thermal drift for the spectral response curve of the spectrometer receiving the spectral line to be monitored. A thermal drift rate for the response curve of the optical filter differs from a thermal drift rate for the response curve of the first spectrometer at least by an amount.

    LIGHTING SYSTEM CALIBRATION
    6.
    发明公开

    公开(公告)号:US20240003740A1

    公开(公告)日:2024-01-04

    申请号:US18036458

    申请日:2021-11-18

    Abstract: A method is provided of calibrating a lighting system to enable conversion between i) light output settings for a plurality of lighting channels of the lighting system, each channel having a respective color spectrum from a first set of color spectra, and ii) a light intensity at an area of interest for each of a second set of color spectra. The method derives a calibration matrix, based on a set default light outputs from the lighting channels, a mapping to light spectra to be measured, and light intensities measured at those light spectra. This calibration procedure takes advantage of the fact that using the same measurement device conventionally used for a simple calibration, it is possible to retrieve not only the total measured PPFD, but also partial PPFD values per spectral range.

    FILTER INCIDENCE NARROW-BAND INFRARED SPECTROMETER

    公开(公告)号:US20230366811A1

    公开(公告)日:2023-11-16

    申请号:US18130567

    申请日:2023-04-04

    CPC classification number: G01N21/3504 G01J3/0294

    Abstract: A system and methods for optically detecting a target gas are disclosed and described. An imaging system can include a narrow-band optical interference filter with a center wavelength that corresponds to a feature in an absorption spectrum of a target gas at a normal angle of incidence. An optical component can receive incoming light from the target gas that has passed through the narrow-band optical interference filter, where the narrow-band optical interference filter is tilted relative to the optical component, which tilt shifts the wavelength of light from each target point that is able to pass through the narrow-band optical interference filter. A camera can receive the incoming light that has been focused by the optical component. Multiple image frames are collected for different orientations of the system with respect to the target and analyzed to perform hyperspectral charactetization of target gas absorption.

    Dedicated Transformation Spectroscopy
    9.
    发明申请

    公开(公告)号:US20180195904A1

    公开(公告)日:2018-07-12

    申请号:US15738798

    申请日:2016-06-28

    Applicant: IMEC VZW

    Abstract: The invention relates to a multi-channel spectrometer device (10) for detecting/quantifying a predetermined analyte (5) in a medium (6). The device (10) comprises an input (11) for receiving radiation (7), a first plurality of optical modulators (12) adapted for transforming the radiation (7) in accordance with a first transfer function, and a second plurality of optical modulators (13) adapted for transforming the radiation (7) in accordance with a second transfer function. The spectrometer device also comprises a detector (15) for generating output signals (4) indicative for the intensity of each transformed radiation signal. The ratio of the number of optical modulators in the first plurality and the number of optical modulators in the second plurality is determined by the ratio of a reference spectrum of the predetermined analyte transformed by the first transfer function and the reference spectrum transformed by the second transfer function.

    RADIATION MEASURING SYSTEMS AND METHODS THEREOF

    公开(公告)号:US20180188109A1

    公开(公告)日:2018-07-05

    申请号:US15907359

    申请日:2018-02-28

    Abstract: A radiation measuring device for measuring electromagnetic radiation originating from an external source. The radiation measuring device includes, a spectrometer, a pyranometer, a pyrgeometer, a diffuser, and a control unit. The spectrometer and a pyranometer are positioned in a sensor zone of a housing of the radiation measuring device. The spectrometer measures visible shortwave radiation and near-infrared shortwave radiation received at the sensor zone. The pyranometer measures shortwave radiation received at the sensor zone. The pyrgeometer is positioned in another sensor zone of the housing and measures longwave radiation received at the other sensor zone. The control unit receives radiation measurements from the spectrometer, pyranometer, and pyrgeometer. A corrected amount of radiation received at the sensor zones of the radiation measuring device is determined from the received radiation measurements. Other embodiments are described and claimed.

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