MICRO ELECTRO-MECHANICAL STRAIN DISPLACEMENT SENSOR AND USAGE MONITORING SYSTEM

    公开(公告)号:US20240077369A1

    公开(公告)日:2024-03-07

    申请号:US18227440

    申请日:2023-07-28

    Inventor: Paul D OKULOV

    Abstract: A low power consumption multi-contact micro electro-mechanical strain/displacement sensor and miniature autonomous self-contained systems for recording of stress and usage history with direct output suitable for fatigue and load spectrum analysis are provided. In aerospace applications the system can assist in prediction of fatigue of a component subject to mechanical stresses as well as in harmonizing maintenance and overhauls intervals. In alternative applications, i.e. civil structures, general machinery, marine and submarine vessels, etc., the system can autonomously record strain history, strain spectrum or maximum values of the strain over a prolonged period of time using an internal power supply or a power supply combined with an energy harvesting device. The sensor is based on MEMS technology and incorporates a micro array of flexible micro or nano-size cantilevers. The system can have extremely low power consumption while maintaining precision and temperature/humidify independence.

    Device and method for controlled emission of radiation

    公开(公告)号:US11874100B2

    公开(公告)日:2024-01-16

    申请号:US17275485

    申请日:2019-09-12

    CPC classification number: G01B11/14 G01B17/00 G01L1/04

    Abstract: Embodiments of present disclosure relates to method and device for controlled emission of radiation. Device comprises probe unit, sensor unit and switch unit. Probe unit is configured to emit radiation on surface of object. Probe unit is supported, via an elastic, to supporting structure of device. Sensor unit is placed at predefined distance from probe unit, along supporting structure, to establish contact with surface. Sensor unit comprises flexible material, mounted to supporting structure, with cavity and first force sensing unit placed in cavity of flexible material. First force sensing unit is configured to detect first force transferred from surface sensor unit. Switch unit is configured to control emission of radiation on surface, based on first force detected by first force sensing unit, upon contact of sensor unit with surface and identification of probe unit to be one of in contact with surface or at minimal distance from surface.

Patent Agency Ranking