Spectrophotometer
    71.
    发明授权

    公开(公告)号:US11054308B2

    公开(公告)日:2021-07-06

    申请号:US16616151

    申请日:2018-04-24

    Abstract: Observation light can be applied to a position for measurement without providing large space in a spectrophotometer, and the position for measurement can be easily known. A slit is disposed at a position optically conjugate with the position for measurement in the spectrophotometer. Light from an object to be measured passes through the slit, travels along a measurement optical path, and is subject to wavelength dispersion by a wavelength dispersing element. An observation light source is retracted outside the measurement optical path at the time of measuring a spectral spectrum. At the time of observing the position for measurement, the observation light source is inserted into the measurement optical path, and emits observation light toward the slit. Alternatively, light from an object to be measured passes through the slit, and is diffracted by a grating. The observation light source is disposed on an optical path of zeroth light. The observation light source emits observation light toward the grating at the time of observing the position for measurement.

    SHORT PULSEWIDTH REPETITION RATE NANOSECOND TRANSIENT ABSORPTION SPECTROMETER

    公开(公告)号:US20210172799A1

    公开(公告)日:2021-06-10

    申请号:US16613717

    申请日:2018-05-24

    Abstract: A high-sensitivity nanosecond to millisecond transient absorption spectrometer for measurements of miniscule signals under low excitation intensities includes an excitation source generating a frequency greater than 100 Hz, pulsewidth less than 5 ns excitation pulse for exciting a light absorbing sample, a probe light source for generating a photon flux probe light beam producing an average irradiance greater than 1 μW m−2 nm−1 for measuring the transient absorption spectrum of the sample before and after excitation by the excitation source, a DC-coupled detector capable of measuring light for enabling synchronous measurement of both the transmission of the probe light beam and the change in transmission of the probe light beam between a signal with the excitation pulse present and a signal in the absence of the excitation pulse, and a digital oscilloscope with a trigger rearm time capable of collecting every trigger event at high frequencies including 1 MHz, for enabling sequential noise subtraction protocols.

    Methods and apparatus for waveguide metrology

    公开(公告)号:US11029206B2

    公开(公告)日:2021-06-08

    申请号:US16670976

    申请日:2019-10-31

    Abstract: Embodiments described herein relate to apparatus for measuring and characterizing performance of augmented and virtual reality waveguide structures utilizing glass substrates. The waveguide performance measuring systems generally include a light source configured to direct light towards an incoupling grating area on waveguide and one or more light detectors configured to collect light from an outcoupling grating area on a second side of the waveguide. The light source and one or more light detectors are disposed on one or more adjustable stages positioned about the waveguide. In certain embodiments, the one or more adjustable stages are configured to move in a linear fashion or revolve and/or rotate around the waveguide in an orbital motion.

    Spectroscope and method for producing spectroscope

    公开(公告)号:US11022493B2

    公开(公告)日:2021-06-01

    申请号:US16600936

    申请日:2019-10-14

    Abstract: A spectrometer includes a light detection element having a substrate made of a semiconductor material, a light passing part provided in the substrate, and a light detection part put in the substrate, a support having a base wall part opposing the light detection element, and side wall parts integrally formed with the base wall part, the light detection element being fixed to the side wall parts, the support being provided with a wiring electrically connected to the light detection part, and a dispersive part provided on a surface of the base wall part on a side of a space. An end part of the wiring is connected to a terminal of the light detection element. An end part of the wiring is positioned on a surface in the base wall part on an opposite side from the side of the space.

    Interlaced diffractive grating
    76.
    发明授权

    公开(公告)号:US11002603B2

    公开(公告)日:2021-05-11

    申请号:US16774318

    申请日:2020-01-28

    Applicant: Thorlabs, Inc.

    Abstract: An interlaced diffraction grating system and process are disclosed. The interlaced grating system includes an optical dispersive grating with alternating bands of unique grating densities wherein the number of unique grating densities is greater than or equal to two. The optical dispersive grating may be reflective or transmissive, and it may be fabricated by mechanical ruling, holography, or reactive ion etching of a binary mask. An interlaced grating allows additional utility for both point spectroscopic detection as well as hyperspectral imaging.

    Etalon based optical spectrometer
    77.
    发明授权

    公开(公告)号:US10996109B1

    公开(公告)日:2021-05-04

    申请号:US16655983

    申请日:2019-10-17

    Abstract: Conventional etalon based spectrometers have either a limited range of evaluation wavelengths or require continuous scanning of the etalon. Conventional etalon based spectrometers also have limited contrast between the peak transmission of a frequency on resonance and the minimum transmission of a frequency off resonance. An improved optical spectrometer includes a cylindrical lens configured to converge the input beam of light in only one direction, whereby the input beam of light is focused along a focal line. Accordingly, a first etalon receives the input beam of light, and transmits a series of sub-beams, each sub-beam transmitted at a different angle from the normal, and each sub-beam including multiple frequencies based on the FSR, whereby a secondary dispersive element receives each sub-beam, and disperses each sub-beam into individual frequencies. Ideally, a second etalon receives and transmits the sub-beams with increased contrast, and a second thickness of the second etalon is substantially identical to the first thickness of the first etalon.

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