中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

261 records (took 0.018 seconds)

    APPARATUS AND METHOD FOR INSPECTING SEALS OF ITEMS
    82.
    发明申请
    APPARATUS AND METHOD FOR INSPECTING SEALS OF ITEMS 有权
    检查物品密封的装置和方法

    公开(公告)号：US20150241360A1

    公开(公告)日：2015-08-27

    申请号：US14441856

    申请日：2013-11-12

    Applicant: FOCALSPEC OY

    Inventor： Karri Niemela ,  Heimo Keranen

    IPC: G01N21/90

    CPC classification number: G01N21/9054 ,  G01N21/95 ,  G01N21/9508 ,  G01N2201/061 ,  G01N2201/0683

    Abstract: A measuring apparatus (200) is provided for inspecting a seal (50) of an item (20). The measuring apparatus (200) includes a radiation source (510, 520) for providing radiation for illuminating the seal (50) of the item (20), a detector (530, 540) for receiving radiation from the item (20) for generating a corresponding detected signal, and a processing arrangement (160) for processing the detected signal to generate an output signal indicative of a state of the seal (50). The radiation source (510, 520) is arranged to focus the radiation into a plurality of focal points at the seal (50) of the item (20), wherein the focal points are mutually spatially spaced apart. Moreover, the detector (530, 540) is arranged to image one or more of the focal points and to be selectively sensitive to an intensity of radiation received from the one or more focal points to generate a detected signal. Furthermore, the measuring apparatus (200) includes a processing arrangement (160) for receiving the detected signal and for processing the detected signal to generate the output signal indicative of the state of the seal (50).

    Abstract translation: 设置有用于检查物品（20）的密封件（50）的测量装置（200）。 测量装置（200）包括用于提供用于照射物品（20）的密封件（50）的辐射的辐射源（510,520），用于接收物品（20）的辐射的检测器（530,540），用于产生 相应的检测信号，以及处理装置（160），用于处理检测信号以产生指示密封状态的输出信号（50）。 辐射源（510,520）被布置成将辐射聚焦在物品（20）的密封件（50）处的多个焦点中，其中焦点在空间上相互间隔开。 此外，检测器（530,540）布置成对一个或多个焦点进行成像，并且对从一个或多个焦点接收的辐射强度选择性敏感以产生检测信号。 此外，测量装置（200）包括处理装置（160），用于接收检测到的信号并处理检测信号以产生指示密封状态的输出信号（50）。

    Method Using Laser Ellipsometry for Determining the Quality of Liquid Product Containing Polyphenols
    83.
    发明申请
    Method Using Laser Ellipsometry for Determining the Quality of Liquid Product Containing Polyphenols 审中-公开
    使用激光椭圆光度法测定含多酚的液体产品的质量的方法

    公开(公告)号：US20150185135A1

    公开(公告)日：2015-07-02

    申请号：US14141602

    申请日：2013-12-27

    Applicant: Paul A. Martino

    Inventor： Paul A. Martino

    IPC: G01N21/21 ,  G01N21/01 ,  G01J4/00

    CPC classification number: G01N21/211 ,  G01B11/0641 ,  G01N21/01 ,  G01N21/4133 ,  G01N2021/0106 ,  G01N2021/213 ,  G01N2201/06113 ,  G01N2201/0683

    Abstract: The objective is to develop a method for determining the quality of a liquid product containing polyphenols. The present invention is a method that is a significant improvement over existing methods that use conventional laboratory instrumentation to study the quality of liquid products. The method uses an adsorption cell with a small mirror as a reflecting surface and acts as a substrate for the adsorption of the liquid's polyphenols on its surface. The polyphenol's film thickness is measured by laser ellipsometry. Light from a monochromatic light source is reflected from the thin film of polyphenol, which changes the light's optical properties and are sensed using the principles of ellipsometry. The changes in state of polarized light are translated into graphical illustrations of measured and computed parameters that can be recognized and interpreted as distinctive properties of liquid product quality.

    Abstract translation: 目的是开发一种用于测定含有多酚的液体产品的质量的方法。 本发明是一种比使用常规实验室仪器研究液体产品质量的现有方法的显着改进方法。 该方法使用具有小反射镜的吸附单元作为反射面，作为表面吸附液体多酚的基板。 通过激光椭圆测量法测量多酚的膜厚度。 来自单色光源的光从多酚的薄膜反射，其改变光的光学性质并且使用椭偏仪的原理来感测。 偏振光状态的变化被转换为可以被识别和解释为液体产品质量的独特性质的测量和计算参数的图示。

    Apparatus and Methods for Concentration Determination Using Polarized Light
    84.
    发明申请
    Apparatus and Methods for Concentration Determination Using Polarized Light 有权
    使用偏振光进行浓度测定的仪器和方法

    公开(公告)号：US20150153287A1

    公开(公告)日：2015-06-04

    申请号：US14617303

    申请日：2015-02-09

    Applicant: DEKA Products Limited Partnership

    Inventor： Jacob W. Scarpaci ,  Jason M. Sachs ,  Simon C. Helmore

    IPC: G01N21/90 ,  G01N21/21

    CPC classification number: G01N21/21 ,  A61M1/14 ,  G01J4/04 ,  G01N21/90 ,  G01N2201/0612 ,  G01N2201/0683

    Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/−45 degrees relative to the first and second light source polarization axes.

    Abstract translation: 使用偏振光进行浓度测定的方法和装置。 该装置包括具有第一光源偏振轴的第一偏振光源和具有大致垂直于第一光源偏振轴的第二光源偏振轴的第二偏振光源。 此外，具有第一偏振光接收偏振轴并被配置为测量从第一光接收偏振器透射的光的强度的第一偏振光接收器和具有基本上垂直于第一光的第二偏振光接收偏振轴的第二偏振光接收器 接收器偏振轴并且被配置为测量从第二光接收偏振器透射的光的强度，其中第一和第二光接收偏振轴相对于第一和第二光源偏振轴通常为+/- 45度。

    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
    85.
    发明申请
    DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD 有权
    缺陷检查装置和缺陷检查方法

    公开(公告)号：US20150146200A1

    公开(公告)日：2015-05-28

    申请号：US14396908

    申请日：2013-04-24

    Applicant: Hitachi High-Technologies Corporation

    Inventor： Toshifumi Honda ,  Yuta Urano ,  Takahiro Jingu ,  Akira Hamamatsu

    IPC: G01N21/95 ,  G01J1/04

    CPC classification number: G01N21/8806 ,  G01J1/0474 ,  G01J1/44 ,  G01N21/9501 ,  G01N21/956 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/0683 ,  G01N2201/0697 ,  G01N2201/10 ,  G01N2201/12

    Abstract: To detect an infinitesimal defect, highly precisely measure the dimensions of the detect, a detect inspection device is configured to comprise: a irradiation unit which irradiate light in a linear region on a surface of a sample; a detection unit which detect light from the linear region; and a signal processing unit which processes a signal obtained by detecting light and detecting a defect. The detection unit includes: an optical assembly which diffuses the light from the sample in one direction and forms an image in a direction orthogonal to the one direction; and a detection assembly having an array sensor in which detection pixels are positioned two-dimensionally, which detects the light diffused in the one direction and imaged in the direction orthogonal to the one direction, adds output signals of each of the detection pixels aligned in the direction in which the light is diffused, and outputs same.

    Abstract translation: 为了检测无限小的缺陷，高度精确地测量检测器的尺寸，检测检查装置被配置为包括：照射单元，其照射样品表面上的线性区域中的光; 检测单元，其检测来自所述线性区域的光; 以及信号处理单元，其处理通过检测光而获得的信号并检测缺陷。 检测单元包括：光学组件，其在一个方向上扩散来自样品的光并在与该一个方向正交的方向上形成图像; 以及检测组件，其具有阵列传感器，其中检测像素被二维地定位，其检测沿与所述一个方向正交的方向成像的沿所述一个方向漫射的光，并将每个所述检测像素的输出信号相加， 光漫射的方向，并输出。

    Simple sugar concentration sensor and method
    86.
    发明授权
    Simple sugar concentration sensor and method 有权
    简单的糖浓度传感器和方法

    公开(公告)号：US08743355B2

    公开(公告)日：2014-06-03

    申请号：US13950054

    申请日：2013-07-24

    Applicant: Valentin Korman

    Inventor： Valentin Korman

    IPC: G01N33/48

    CPC classification number: A61B5/14532 ,  A61B5/1455 ,  A61B5/14558 ,  A61B5/6815 ,  A61B5/7225 ,  A61B2560/0443 ,  A61B2562/0238 ,  G01N21/21 ,  G01N2201/062 ,  G01N2201/0683

    Abstract: A glucose sensor comprising an optical energy source having an emitter with an emission pattern; a first polarizer intersecting the emission pattern; a second polarizer spaced a distance from the first polarizer and intersecting the emission pattern, the second polarizer rotated relative to the first polarizer by a first rotational amount Θ; a first optical detector intersecting the emission pattern; a second optical detector positioned proximal to the second polarizer, the first polarizer and the second polarizer being positioned between the optical energy source and the second optical detector, the second optical detector intersecting the emission pattern; a compensating circuit coupled to the second optical detector; and a subtractor circuit coupled to the compensating circuit and the first optical detector.

    Abstract translation: 一种葡萄糖传感器，包括具有发射器的光能源，其具有发射图案; 与发射图案相交的第一偏振片; 与第一偏振器间隔开一定距离并与发射图案相交的第二偏振器，第二偏振器相对于第一偏振器相对于第一偏转器旋转第一旋转量Θ; 与发射图案相交的第一光学检测器; 位于第二偏振器附近的第二光学检测器，第一偏振器和第二偏振器位于光能源和第二光学检测器之间，第二光学检测器与发射图案相交; 耦合到所述第二光学检测器的补偿电路; 以及耦合到所述补偿电路和所述第一光学检测器的减法器电路。

    Spatially precise optical treatment or measurement of targets through intervening birefringent layers
    87.
    发明申请
    Spatially precise optical treatment or measurement of targets through intervening birefringent layers 失效
    空间精确的光学处理或通过中间双折射层测量目标

    公开(公告)号：US20100045983A1

    公开(公告)日：2010-02-25

    申请号：US12196455

    申请日：2008-08-22

    Applicant: Fang Huang

    Inventor： Fang Huang

    IPC: G01J4/00

    CPC classification number: G01N21/23 ,  G01N2021/214 ,  G01N2201/0683

    Abstract: A treatment pattern (such as a focused spot, an image, or an interferogram) projected on a treatment target may lose precision if the treatment beam must pass through a birefringent layer before reaching the target. In the general case, the birefringent layer splits the treatment beam into ordinary and extraordinary components, which propagate in different directions and form two patterns, displaced from each other, at the target layer. The degree of birefringence and the orientation of the optic axis, which influence the amount of displacement, often vary between workpieces or between loci on the same workpiece. This invention measures the orientation of the optic axis and uses the data to adjust the treatment beam incidence direction, the treatment beam polarization, or both to superpose the ordinary and extraordinary components into a single treatment pattern at the target, preventing the birefringent layer from causing the pattern to be blurred or doubled.

    Abstract translation: 投影在治疗对象上的治疗方式（例如聚焦点，图像，或干涉图）如果在到达目标物体之前必须通过双折射层，则可能失去精度。 在一般情况下，双折射层将处理束分裂成普通和非凡的分量，其在不同方向上传播并在目标层处形成两个相互置换的图案。 影响位移量的光轴的双折射度和取向通常在工件之间或同一工件上的轨迹之间变化。 本发明测量光轴的取向，并使用该数据来调整治疗光束入射方向，治疗束偏振或两者以将普通和非凡成分叠加成靶上的单一处理图案，防止双折射层引起 模式被模糊或加倍。

Patent Agency Ranking