公开(公告)号：US20250086853A1

公开(公告)日：2025-03-13

申请号：US18580304

申请日：2022-07-12

Applicant: PPG Industries Ohio, Inc.

Inventor： Bilge Carritte ,  Natalie M. Scott ,  Alison M. Norris

IPC: G06T11/00 ,  G01J3/02 ,  G01J3/46 ,  G06F3/0482 ,  G06F3/04845 ,  G06T11/60

Abstract: A computer-implemented method can include providing via a digital display a graphical user interface including one or more selectable elements for retrieving spectrophotometer data measured from a target asset. The method also includes receiving spectrophotometer data from an end user of the graphical user interface, and retrieving from a database a plurality of closest match colors corresponding to the spectrophotometer data. In addition, the method can include displaying a plurality of selectable color tiles corresponding to the retrieved closest match colors, and further displaying an image for each of one or more selectable sub-component options corresponding to one or more alternate formulas for at least one of the selectable color tiles. The method further includes displaying both the adjusted formula and related sub-components corresponding to the user modifications, as well as options to select the color as a coating for eventual application.

公开(公告)号：US20250085168A1

公开(公告)日：2025-03-13

申请号：US18821001

申请日：2024-08-30

Applicant: Excelitas Technologies Singapore Pte. Ltd.

Inventor： Hendrik Kupper ,  Dirk Steigel ,  Henrik Ernst

IPC: G01J5/35 ,  H10N15/10

Abstract: Described herein are techniques for reducing spike noise arising in pyroelectric infrared sensors due to charge build up. The sensors developed by the inventors and described herein rely on the use of dummy elements positioned to prevent or limit charge build-up in the unused space. A first sensing element comprises a first portion of the first layer of conductive material, a first portion of the layer of pyroelectric material, a first portion of the second layer of conductive material and a first absorption region coupled to the first portion of the first layer of conductive material. A dummy element comprises a second portion of the first layer of conductive material, a second portion of the layer of pyroelectric material and a second portion of the second layer of conductive material. The first layer of conductive material defines a first gap between the first portion of the first layer of conductive material and the second portion of the first layer of conductive material.

公开(公告)号：US20250085166A1

公开(公告)日：2025-03-13

申请号：US18959448

申请日：2024-11-25

Applicant: Lam Research Corporation

Inventor： Francisco Jose Camargo ,  Jonathan Ross Angell

IPC: G01J5/08 ,  G01J5/00 ,  G01K1/02 ,  G01N33/00

Abstract: Various embodiments include heat and volatile-organic-compounds detecting systems. In one example, the heat-detecting system includes at least one heat sensor mounted externally to a device, such as a local power-box (LPB). The heat sensor has an area-of-detection to detect heat emitted from at least one face of the LPB at one or more locations. The heat-detecting system also includes a high-absorptance infrared-collector (HAIC) formed within the LPB to collect excessive heat generated by a component within the LPB. The excessive heat is correlated to a pre-determined temperature level, and a temperature of the collected excessive heat is measured by the heat sensor. Each of the heat sensor and the HAIC are coupled to a control module. Other apparatuses, designs, and methods are disclosed.

公开(公告)号：US20250085164A1

公开(公告)日：2025-03-13

申请号：US18773672

申请日：2024-07-16

Applicant: ZOLIX INSTRUMENTS Co., Ltd. ,  Zolix Analytical Instruments Co., Ltd.

Inventor： Zemin Lei ,  Fei Tong ,  Suxia Zhang ,  Haixia Chen

IPC: G01J3/02 ,  G01J3/18 ,  G01J3/28

Abstract: A wavelength calibration method for a grating spectrometer is provided, including: moving a plurality of characteristic peaks of a calibration light source to a central position of a detector of the spectrometer respectively, and determining a functional relationship between a grating rotation angle of the rotatable grating and a central wavelength; and determining parameters γ, f, a, b, c in the following physical model, the physical model being used to calculate a corresponding wavelength at each pixel within an imaging range of the detector when the central wavelength is determined, λ ′ = sin ⁢ ( Ψ - γ 2 ) + sin ⁢ ( Ψ + γ 2 + arctan ⁢ ( a ⁡ ( n ⁢ x ) 2 + b ⁡ ( n ⁢ x ) + c f ) ) 1 ⁢ 0 - 6 · m · N wherein Ψ is the grating rotation angle corresponding to the central wavelength as determined via the functional relationship, γ is built-in angle of the spectrometer, f is a focal distance of the spectrometer, m is grating diffraction order, N is the number of grating rulings (unit: line/mm), nx is a distance between a corresponding pixel and a central pixel.

公开(公告)号：US20250085163A1

公开(公告)日：2025-03-13

申请号：US18957402

申请日：2024-11-22

Applicant: Richard Fauconier

Inventor： Richard Fauconier

IPC: G01J3/02

Abstract: One embodiment of a method for restricting laser beams entering an aperture to a chosen dyad and measuring their separation. The method works with frequency-modulated coherent light, and one embodiment uses a moveable, variable-aperture apparatus (FIG. 1) in conjunction with a converging lens (6) and a detector (7). Key elements of other embodiments are described.

公开(公告)号：US20250085162A1

公开(公告)日：2025-03-13

申请号：US18885774

申请日：2024-09-16

Applicant: PixArt Imaging Inc.

Inventor： TSO-SHENG TSAI ,  KUEI-YANG TSENG ,  YUEH-LIN CHUNG

IPC: G01J1/44

Abstract: There is provided an optical sensor including an SPAD pixel array, multiple counters and a processor. The multiple counters count photon events of the SPAD pixel array to output an event-based vision sensor (EVS) frame per EVS period. The processor determines an index state of each pixel of the SPAD pixel array by comparing a counting value of each pixel respectively at a predetermined number of checking points with two predetermined thresholds, and calculates an index change of the index state associated with each pixel between adjacent EVS frames. The processor further changes the EVS period and/or adds a count offset to the counting value of each pixel to improve sensitivity of the event-based vision sensor.

公开(公告)号：US12247881B2

公开(公告)日：2025-03-11

申请号：US17171458

申请日：2021-02-09

Applicant: Sapphire IP, Inc.

Inventor： Michael Piscitelli

IPC: G01J3/50 ,  G01J1/44 ,  G02B5/10

Abstract: An apparatus is provided for measuring far-field luminous intensity and color characteristics of a light source that includes a lamp test location for receiving a lamp for testing and a mirror positioned in a fixed light receiving position relative to the lamp test location and positioned in a fixed light transmitting position for reflecting a light beam from the lamp at a predetermined angle relative to the light receiving position. A measurement screen is positioned in a location relative to the mirror to receive the parabolically-condensed light image reflected from the mirror at the predetermined angle and a light detector is positioned to capture a light image reflected from the measurement screen. The light detector is configured to convert the reflected light image on the measurement screen to a digital signal and output the digital signal. A computer is configured for receiving and processing the digital signal corresponding to the reflected light image and calibrated for measuring luminous intensity according to an algorithm programmed in the computer.

公开(公告)号：US12247879B2

公开(公告)日：2025-03-11

申请号：US18434658

申请日：2024-02-06

Applicant: Samsung Electronics Co., Ltd.

Inventor： Radwanul Hasan Siddique ,  Daniel Assumpcao ,  Hyuck Choo ,  Hyochul Kim

IPC: G01J3/18 ,  G01J3/02 ,  G01J3/28 ,  G01J3/44

Abstract: Optical spectrometers may be used to determine the spectral components of electromagnetic waves. Spectrometers may be large, bulky devices and may require waves to enter at a nearly direct angle of incidence in order to record a measurement. What is disclosed is an ultra-compact spectrometer with nanophotonic components as light dispersion technology. Nanophotonic components may contain metasurfaces and Bragg filters. Each metasurface may contain light scattering nanostructures that may be randomized to create a large input angle, and the Bragg filter may result in the light dispersion independent of the input angle. The spectrometer may be capable of handling about 200 nm bandwidth. The ultra-compact spectrometer may be able to read image data in the visible (400-600 nm) and to read spectral data in the near-infrared (700-900 nm) wavelength range. The surface area of the spectrometer may be about 1 mm2, allowing it to fit on mobile devices.

公开(公告)号：US12247877B2

公开(公告)日：2025-03-11

申请号：US17637242

申请日：2020-07-09

Applicant: FiSens GmbH

Inventor： Christian Waltermann ,  Philip Erik Guhlke ,  Jan Koch ,  Wolfgang Schippers

IPC: G01J3/18 ,  G02B6/124 ,  G02B6/42 ,  G01D5/353 ,  G01J3/02 ,  G01J9/00 ,  G02B6/02

Abstract: The invention relates to a device for optical applications, which has an optical waveguide (10), to which a light source (11) can be connected. The optical waveguide (10) is designed in such a way that light emitted by the connectable light source (11) propagates along a light propagation axis (12). A wavelength-sensitive grating structure (13) in the optical waveguide (10) has detectors (20), which are arranged in such a way that the detectors absorb partial amounts of the light of the light source (11) that is scattered by the wavelength-sensitive grating structure (13). The grating structure (13) in the optical waveguide (10) is constructed of periodically arranged ellipsoid structural elements (14). The ellipsoid structural elements (14) have a different index of refraction than the material of the optical waveguide (10) surrounding the ellipsoid structural elements. The ellipsoid structural elements (14) have a longitudinal axis and a short axis, which are substantially perpendicular to the light propagation axis (12). Depending on the wavelength, partial amounts of the light scattered by the grating structure (13) are coupled out of the optical waveguide (10). The light hits the detectors (20). An absorbing or partially reflecting filter (30) is arranged between at least one of the detectors (20) and the optical waveguide (10). The detectors (20) have measuring elements for the intensity of the partial amount of the light that hits the detector (20) in question. An evaluation element is provided, which determines a wavelength from the intensity ratio of the plurality of detectors (20). The detectors (20) are arranged in such a way that the detectors either are arranged opposite each other on different sides of the long axes of the

公开(公告)号：US20250081642A1

公开(公告)日：2025-03-06

申请号：US18954159

申请日：2024-11-20

Applicant: Taiwan Semiconductor Manufacturing Company Limited

Inventor： Yeh-Hsun FANG ,  Zhi-Wei ZHUANG ,  Li-Hsin CHU

IPC: H01L27/146 ,  G01J1/44 ,  H01L23/00

Abstract: A method of forming a semiconductor device includes: forming a patterned hard mask layer on a semiconductor substrate; performing a first etching process to form a recess in an exposed portion of the semiconductor substrate, using a first etchant that includes a first halogen species; performing a second etching process using a second etchant that includes a second halogen species, such that the second halogen species forms a barrier layer in the semiconductor substrate, surrounding the recess; and growing a detection region in the recess using an epitaxial growth process. The barrier layer is configured to reduce diffusion of the first halogen species into the detection region.