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公开(公告)号：US20150223323A1
公开(公告)日：2015-08-06
申请号：US14173106
申请日：2014-02-05
Applicant: Colin Patrick O'Flynn
Inventor： Colin Patrick O'Flynn
CPC classification number: H05K1/0253 , H05K1/111 , H05K2201/094 , H05K2201/09409 , H05K2201/09427 , Y02P70/611
Abstract: A PCB footprint consisting of a plurality of pads, positioned such that many different electronic components can be mounted which would otherwise require a custom circuit board. One or more of the leads can be connected via a low-impedance path to a ground plane, making a suitable platform for prototyping high-frequency designs.
Abstract translation: 由多个焊盘组成的PCB封装，定位成使得可以安装许多不同的电子部件，否则其将需要定制的电路板。 一个或多个引线可以通过低阻抗路径连接到接地平面，为高频设计的原型设计提供了一个合适的平台。
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2.发明申请Method and Apparatus for Detection of Counterfeit, Defective or Damaged Devices 审中-公开用于检测假冒，有害或损坏的设备的方法和装置公开(公告)号：US20170067961A1
公开(公告)日：2017-03-09
申请号：US14846065
申请日：2015-09-04
Applicant: Colin Patrick O'Flynn
Inventor： Colin Patrick O'Flynn
IPC: G01R31/317 , G01R31/30 , G01R31/3177
CPC classification number: G01R31/31703 , G01R31/3004 , G01R31/31718
Abstract: Methods and apparatus are provided for determining if an embedded system or integrated circuit is operating correctly, or if the device is faulty or counterfeit. Measurements of power consumption are used to determine the state of the device under test, these measurements being performed at multiple operating or environmental conditions to increase the ability of the apparatus to detect faulty and counterfeit devices.
Abstract translation: 提供了用于确定嵌入式系统或集成电路是否正常工作或者设备是否有故障或伪造的方法和装置。 功耗的测量用于确定被测设备的状态，这些测量在多个操作或环境条件下进行，以增加设备检测故障和伪造设备的能力。
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3.发明申请公开(公告)号：US20150301109A1
公开(公告)日：2015-10-22
申请号：US14255924
申请日：2014-04-17
Applicant: Colin Patrick O'Flynn
Inventor： Colin Patrick O'Flynn
IPC: G01R31/319 , G01R31/28
CPC classification number: G01R31/3191 , G01R31/2851 , G01R31/31707 , G01R31/31726 , H03M1/08
Abstract: Methods and apparatus are provided for sampling an indicator of the internal state of an embedded system or integrated circuit, where the indicator is sampled in a manner synchronous to the internal clock of the embedded system or integrated circuit. The resulting samples can be used for determining secret data within the embedded system or integrated circuit, detecting failures, or detecting counterfeit devices.
Abstract translation: 提供了用于对嵌入式系统或集成电路的内部状态的指示符进行采样的方法和装置，其中以与嵌入式系统或集成电路的内部时钟同步的方式对指示符进行采样。 所得到的样本可用于确定嵌入式系统或集成电路中的秘密数据，检测故障或检测假冒设备。
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4.发明授权公开(公告)号：US09429624B2
公开(公告)日：2016-08-30
申请号：US14255924
申请日：2014-04-17
Applicant: Colin Patrick O'Flynn
Inventor： Colin Patrick O'Flynn
IPC: G06F7/02 , H04M13/00 , G01R31/319 , G01R31/28 , G01R31/317 , H03M1/08
CPC classification number: G01R31/3191 , G01R31/2851 , G01R31/31707 , G01R31/31726 , H03M1/08
Abstract: Methods and apparatus are provided for sampling an indicator of the internal state of an embedded system or integrated circuit, where the indicator is sampled in a manner synchronous to the internal clock of the embedded system or integrated circuit. The resulting samples can be used for determining secret data within the embedded system or integrated circuit, detecting failures, or detecting counterfeit devices.
Abstract translation: 提供了用于对嵌入式系统或集成电路的内部状态的指示符进行采样的方法和装置，其中以与嵌入式系统或集成电路的内部时钟同步的方式对指示符进行采样。 所得到的样本可用于确定嵌入式系统或集成电路中的秘密数据，检测故障或检测假冒设备。
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