公开(公告)号：US08830453B2

公开(公告)日：2014-09-09

申请号：US13729300

申请日：2012-12-28

Applicant: Jun Zhu ,  Jing-Lei Zhu ,  Kai-Li Jiang ,  Chen Feng ,  Ji-Qing Wei ,  Guo-Fan Jin ,  Shou-Shan Fan

Inventor： Jun Zhu ,  Jing-Lei Zhu ,  Kai-Li Jiang ,  Chen Feng ,  Ji-Qing Wei ,  Guo-Fan Jin ,  Shou-Shan Fan

IPC: G01J1/00 ,  G01J1/42

CPC classification number: G01J1/42 ,  G01J1/0411 ,  G01J1/08 ,  G01J1/4228 ,  G01J1/4257 ,  G01J1/58 ,  G01J2001/4247

Abstract: A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.

Abstract translation: 用于测量光的强度分布的方法包括提供位于基底表面上的碳纳米管阵列的步骤。 碳纳米管阵列具有远离衬底的顶表面。 具有基板的碳纳米管阵列位于惯性环境或真空环境中。 光源照射碳纳米管阵列的顶面，使碳纳米管阵列发出可见光。 设置反射器，可见光被反射器反射。 成像元件对由反射器反射的可见光进行成像，以获得光源的强度分布。

公开(公告)号：US20130329213A1

公开(公告)日：2013-12-12

申请号：US13729300

申请日：2012-12-28

Applicant: JUN ZHU ,  JING-LEI ZHU ,  KAI-LI JIANG ,  CHEN FENG ,  JI-QING WEI ,  GUO-FAN JIN ,  SHOU-SHAN FAN

Inventor： JUN ZHU ,  JING-LEI ZHU ,  KAI-LI JIANG ,  CHEN FENG ,  JI-QING WEI ,  GUO-FAN JIN ,  SHOU-SHAN FAN

IPC: G01J1/42

CPC classification number: G01J1/42 ,  G01J1/0411 ,  G01J1/08 ,  G01J1/4228 ,  G01J1/4257 ,  G01J1/58 ,  G01J2001/4247

Abstract: A method for measuring intensity distribution of light includes a step of providing a carbon nanotube array located on a surface of a substrate. The carbon nanotube array has a top surface away from the substrate. The carbon nanotube array with the substrate is located in an inertia environment or a vacuum environment. A light source irradiates the top surface of the carbon nanotube array, to make the carbon nanotube array radiate a visible light. A reflector is provided, and the visible light is reflected by the reflector. An imaging element images the visible light reflected by the reflector, to obtain an intensity distribution of the light source.

Abstract translation: 用于测量光的强度分布的方法包括提供位于基底表面上的碳纳米管阵列的步骤。 碳纳米管阵列具有远离衬底的顶表面。 具有基板的碳纳米管阵列位于惯性环境或真空环境中。 光源照射碳纳米管阵列的顶面，使碳纳米管阵列发出可见光。 设置反射器，可见光被反射器反射。 成像元件对由反射器反射的可见光进行成像，以获得光源的强度分布。

公开(公告)号：US20130327960A1

公开(公告)日：2013-12-12

申请号：US13729285

申请日：2012-12-28

Applicant: JUN ZHU ,  JING-LEI ZHU ,  KAI-LI JIANG ,  CHEN FENG ,  JI-QING WEI ,  GUO-FAN JIN ,  SHOU-SHAN FAN

Inventor： JUN ZHU ,  JING-LEI ZHU ,  KAI-LI JIANG ,  CHEN FENG ,  JI-QING WEI ,  GUO-FAN JIN ,  SHOU-SHAN FAN

IPC: G01J1/58

CPC classification number: G01J1/58 ,  G01J1/0411 ,  G01J1/08 ,  G01J1/4228 ,  G01J1/4257 ,  G01J2001/4247

Abstract: A system for measuring intensity distribution of light includes a carbon nanotube array located on a surface of a substrate, a reflector and an imaging element. The carbon nanotube array absorbs photons of a light source and radiates a visible light. The reflector is used to reflect the visible light, and the reflector is spaced from the carbon nanotube array. The carbon nanotube array is located between the reflector and the substrate. The imaging element is used to image the visible light. The imaging element is spaced from the substrate.

Abstract translation: 用于测量光的强度分布的系统包括位于基板，反射器和成像元件的表面上的碳纳米管阵列。 碳纳米管阵列吸收光源的光子并辐射可见光。 反射器用于反射可见光，并且反射器与碳纳米管阵列间隔开。 碳纳米管阵列位于反射器和基板之间。 成像元件用于对可见光进行成像。 成像元件与衬底间隔开。