公开(公告)号：US09905410B2

公开(公告)日：2018-02-27

申请号：US14959795

申请日：2015-12-04

Applicant: Agilent Technologies, Inc.

Inventor： Trygve Ristroph ,  Julia Zaks

IPC: H01J49/40 ,  H01J49/00

CPC classification number: H01J49/40 ,  H01J49/009

Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes a multi-channel ion detector to detect ions traveling in separate flight paths, spatially dispersed along a drift axis and/or a transverse axis, in a flight tube of a TOF analyzer. The ion beams may be dispersed by drift energy, deflection along the drift and/or transverse axis, ion mass, or a combination of two or more of the foregoing. The dispersion may be carried out before, at, or after an ion accelerator of the TOF analyzer. Ion packets may be accelerated into the flight tube at a multi-pulse firing rate. Tandem MS may be implemented on parallel ion beams simultaneously.

公开(公告)号：US09627190B2

公开(公告)日：2017-04-18

申请号：US14671521

申请日：2015-03-27

Applicant: Agilent Technologies, Inc.

Inventor： Julia Zaks ,  Trygve Ristroph

IPC: H01J49/40 ,  H01J49/06 ,  H01J49/00

CPC classification number: H01J49/401 ,  H01J49/0027 ,  H01J49/06

Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.

公开(公告)号：US20160284531A1

公开(公告)日：2016-09-29

申请号：US14671521

申请日：2015-03-27

Applicant: Agilent Technologies, Inc.

Inventor： Julia Zaks ,  Trygve Ristroph

IPC: H01J49/40 ,  H01J49/06 ,  H01J49/00

CPC classification number: H01J49/401 ,  H01J49/0027 ,  H01J49/06

Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes an ion dispersion device and a position-sensitive ion detector or an energy-sensitive ion detector to enable measurement of time of flight and kinetic energy of ions arriving at the detector. The measurements may be utilized to improve accuracy in calculating ion masses.

Abstract translation: 飞行时间质谱仪（TOF-MS）使用离子分散装置和位置敏感离子检测器或能量敏感离子检测器来测量到达检测器的离子的飞行时间和动能。 可以使用测量来提高计算离子质量的精度。

公开(公告)号：US20160225602A1

公开(公告)日：2016-08-04

申请号：US14959795

申请日：2015-12-04

Applicant: Agilent Technologies,Inc.

Inventor： Trygve Ristroph ,  Julia Zaks

IPC: H01J49/40

CPC classification number: H01J49/40 ,  H01J49/009

Abstract: A time-of-flight mass spectrometer (TOF-MS) utilizes a multi-channel ion detector to detect ions traveling in separate flight paths, spatially dispersed along a drift axis and/or a transverse axis, in a flight tube of a TOF analyzer. The ion beams may be dispersed by drift energy, deflection along the drift and/or transverse axis, ion mass, or a combination of two or more of the foregoing. The dispersion may be carried out before, at, or after an ion accelerator of the TOF analyzer. Ion packets may be accelerated into the flight tube at a multi-pulse firing rate. Tandem MS may be implemented on parallel ion beams simultaneously.

Abstract translation: 飞行时间质谱仪（TOF-MS）利用多通道离子检测器来检测在TOF分析仪的飞行管中沿着漂移轴和/或横向轴线分散的分开的飞行路径中的离子行进 。 离子束可以通过漂移能量分散，沿着漂移和/或横向轴线的偏转，离子质量或上述两种或更多种的组合。 分散体可以在TOF分析仪的离子加速剂之前，之中或之后进行。 离子包可以以多脉冲发射速率加速到飞行管中。 串联MS可以同时在并行离子束上实现。