公开(公告)号：US4842404A

公开(公告)日：1989-06-27

申请号：US144556

申请日：1988-01-13

Applicant: C. Richard Duda

Inventor： C. Richard Duda

IPC: G01J1/42 ,  G01J4/00

CPC classification number: G01J1/4257 ,  G01J1/04 ,  G01J1/0429 ,  G01J1/4228 ,  G01J3/0254

Abstract: An apparatus for monitoring the light energy power level of a beam of light, includes beamsplitters on the axis of the light beam for directing portions of the light beam in first and second paths respectively orthogonal to the axis while transmitting the remaining portion of the light beam therethrough. First and second photodetectors having similar spectral responsivity intercept the first and second light beam portions respectively, and detect and signal the light energy power level of the respective first and second light beam portions. Analysis circuitry coupled to the first and second photodetectors and responsive to the output signals therefrom to calculate the total light energy power level of the light beam. The apparatus resolves linearly polarized light into two orthogonal components while permitting most of the light to exit. This exit beam can be analyzed in terms of the incident beam or monitored for measurement or control purposes.

Abstract translation: 一种用于监测光束的光能功率水平的装置，包括在光束轴上的分束器，用于将光束的部分引导到分别垂直于轴线的第一和第二路径中，同时透射光束的剩余部分 通过。 具有相似光谱响应性的第一和第二光电探测器分别截取第一和第二光束部分，并且检测并发出相应的第一和第二光束部分的光能功率电平。 分析电路耦合到第一和第二光电检测器并响应于其输出信号来计算光束的总光能功率水平。 该装置将线性偏振光分解成两个正交分量，同时允许大部分光离开。 该出射光束可以根据入射光束进行分析，或者进行监测以用于测量或控制目的。

公开(公告)号：US4498012A

公开(公告)日：1985-02-05

申请号：US463258

申请日：1983-02-02

Applicant: C. Richard Duda

Inventor： C. Richard Duda

IPC: G01J1/42

CPC classification number: G01J1/4228 ,  G01J1/0414

Abstract: A visible spectrum radiation measuring apparatus achieving an absolute measurement utilizing a plurality of inversion layer silicon photodiodes in a configuration wherein light reflected from the surface of a photodiode impinges on another photodiode, and its respective reflected light impinges on another photodiode, such that each time the light impinges on a photodiode surface a portion is absorbed, and that ultimately most of the light of the beam being measured is absorbed.

Abstract translation: 一种可见光谱辐射测量装置，利用多个反型层硅光电二极管实现绝对测量，其结构是由光电二极管的表面反射的光线照射在另一个光电二极管上，并且其各自的反射光照射在另一个光电二极管上，使得每次 光照射在光电二极管表面上，一部分被吸收，并且最终所测量的光束的大部分光被吸收。