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公开(公告)号：US11852549B2
公开(公告)日：2023-12-26
申请号：US17676450
申请日：2022-02-21
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , David Matthew Berg , Pierre Michel Bouzi , William John Furnas , Jacob Immerman , Jeremiah Robert Jacobson , Katherine Anne Lindberg , Glenn Abram Newcomer , Evan Lewis Olson , Viktor Stepanov , Nathaniel David Wetmore
CPC classification number: G01L1/24 , G02B5/04 , G02B5/3016 , G01N21/21 , G01N2021/4153 , G01N2021/4792
Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.
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公开(公告)号：US20220317041A1
公开(公告)日：2022-10-06
申请号：US17709792
申请日：2022-03-31
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , Pierre Michel Bouzi , William John Furnas , Jacob Immerman , Jeremiah Robert Jacobson , Katherine Anne Lindberg , Evan Lewis Olson , Nathaniel David Wetmore
Abstract: Systems and methods of performing a stress measurement of a chemically strengthened glass using a light-scattering polarimetry system include adjusting the intensity of a light beam from a light source in an illumination system using a rotatable half-wave plate and a first polarizer operably disposed between the light source and a rotating light diffuser that has a rotation time tR. The first polarizer is aligned with a second polarizer in a downstream optical compensator to have matching polarization directions by rotating the rotatable half-wave plate to a position where the exposure time tE falls within an exposure range tR≤tE. The method also includes performing an exposure using the exposure time tE to obtain the stress measurement. One or both of the half-wave plate and first polarizer can be tilted to avoid deleterious back-reflected light from entering the light source.
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公开(公告)号：US11860090B2
公开(公告)日：2024-01-02
申请号：US17709792
申请日：2022-03-31
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , Pierre Michel Bouzi , William John Furnas , Jacob Immerman , Jeremiah Robert Jacobson , Katherine Anne Lindberg , Evan Lewis Olson , Nathaniel David Wetmore
CPC classification number: G01N21/47 , G01J4/00 , G01J4/04 , G01N2021/4735 , G01N2021/4792
Abstract: Systems and methods of performing a stress measurement of a chemically strengthened glass using a light-scattering polarimetry system include adjusting the intensity of a light beam from a light source in an illumination system using a rotatable half-wave plate and a first polarizer operably disposed between the light source and a rotating light diffuser that has a rotation time tR. The first polarizer is aligned with a second polarizer in a downstream optical compensator to have matching polarization directions by rotating the rotatable half-wave plate to a position where the exposure time tE falls within an exposure range tR≤tE. The method also includes performing an exposure using the exposure time tE to obtain the stress measurement. One or both of the half-wave plate and first polarizer can be tilted to avoid deleterious back-reflected light from entering the light source.
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Patent Agency Ranking
4.发明申请公开(公告)号：US20200300615A1
公开(公告)日：2020-09-24
申请号：US16825338
申请日：2020-03-20
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , Pierre Michel Bouzi , William John Furnas , Jeremiah Robert Jacobson , Glenn Abram Newcomer , Evan Lewis Olson , Babak Robert Raj , Rostislav Vatchev Roussev , Viktor Stepanov , Nathaniel David Wetmore
Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.
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公开(公告)号：US20250085177A1
公开(公告)日：2025-03-13
申请号：US18825641
申请日：2024-09-05
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , David Matthew Berg , Pierre Michel Bouzi , William John Furnas , Jacob Immerman , Jeremiah Robert Jacobson , Katherine Anne Lindberg , Andrew Allen Lindstrand , Glenn Abram Newcomer , Evan Lewis Olson , Babak Robert Raj , Nathaniel David Wetmore
Abstract: Apparatus includes a sample holder with a cavity and a plurality of devices configured to hold a curvature of a curved substrate in a fixed configuration. Apparatus includes two prisms with a viewing apparatus of the sample holder configured to translate therebetween. Methods can include disposing the curved substrate in the sample holder, transmitting a first beam, translating the sample holder, and transmitting a second beam. Alternatively, apparatus include a light scattering-polarimetry sub-system configured to emit a first beam to impinge an end surface of coupling prism and detect at least a portion of the first beam impinging the first surface of the coupling prism. The apparatus includes an evanescent prism coupling spectroscopy sub-system configured to emit a second beam to impinge a first surface of the coupling system and detect at least a portion of the second beam impinging the second surface of the coupling prism.
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6.发明公开公开(公告)号：US20240175812A1
公开(公告)日：2024-05-30
申请号：US18520807
申请日：2023-11-28
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , David Matthew Berg , Pierre Michel Bouzi , William John Furnas , Christopher David Gee , Jacob Immerman , Andrew Allen Lindstrand , Glenn Abram Newcomer , Evan Lewis Olson , Melbourne Thompson Turnbull, IV , Nathaniel David Wetmore
CPC classification number: G01N21/47 , G01N21/255 , G01N2021/1734 , G01N2021/1765 , G01N2021/4792 , G01N2201/06113 , G01N2201/0634 , G01N2201/0668 , G01N2201/125
Abstract: A scattered light polarimetry (LSP) sub-system of a hybrid system for characterizing stress in a chemically-strengthened (CS) substrate having a top-surface and a near-surface waveguide, includes a LSP light source system, an LSP light source actuator coupled to the LSP light source system, and an optical compensator within an optical path of a LSP laser beam emitted by the LSP light source system. The optical compensator includes a half-wave plate, a half-wave plate actuator, a diffuser, and a diffuser actuator. The LSP sub-system further includes a LSP detector system in optical communication with the optical compensator through an LSP coupling prism having a LSP coupling surface, a focusing lens and a focusing lens actuator, and a support plenum having a surface and a measurement aperture, the support plenum configured to support the CS substrate at a measurement plane at the measurement aperture, and to operably support the LSP coupling prism.
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公开(公告)号：US20220276106A1
公开(公告)日：2022-09-01
申请号：US17676450
申请日：2022-02-21
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , David Matthew Berg , Pierre Michel Bouzi , William John Furnas , Jacob Immerman , Jeremiah Robert Jacobson , Katherine Anne Lindberg , Glenn Abram Newcomer , Evan Lewis Olson , Viktor Stepanov , Nathaniel David Wetmore
Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source system optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements and enhanced configurations of the EPCS and LPS sub-systems to improve measurement accuracy are also disclosed.
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公开(公告)号：US11105612B2
公开(公告)日：2021-08-31
申请号：US16825338
申请日：2020-03-20
Applicant: CORNING INCORPORATED
Inventor： Ryan Claude Andrews , Pierre Michel Bouzi , William John Furnas , Jeremiah Robert Jacobson , Glenn Abram Newcomer , Evan Lewis Olson , Babak Robert Raj , Rostislav Vatchev Roussev , Viktor Stepanov , Nathaniel David Wetmore
Abstract: The hybrid measurement system includes an evanescent prism coupling spectroscopy (EPCS) sub-system and a light-scattering polarimetry (LSP) sub-system. The EPCS sub-system includes an EPCS light source optically coupled to an EPCS detector system through an EPCS coupling prism. The LSP sub-system includes an LSP light source optically coupled to an optical compensator, which in turn is optically coupled to a LSP detector system via a LSP coupling prism. A support structure supports the EPCS and LSP coupling prisms to define a coupling prism assembly, which supports the two prisms at a measurement location. Stress measurements made using the EPCS and LSP sub-systems are combined to fully characterize the stress properties of a transparent chemically strengthened substrate. Methods of processing the EPCS and LSP measurements to improve measurement accuracy are also disclosed.
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