公开(公告)号：US5640283A

公开(公告)日：1997-06-17

申请号：US546426

申请日：1995-10-20

Applicant: David Wheeler Warren

Inventor： David Wheeler Warren

IPC: G02B17/06 ,  G02B23/06 ,  G02B17/00 ,  G02B5/10

CPC classification number: G02B23/06 ,  G02B17/0642 ,  G02B17/0663

Abstract: An all reflective telescope system generally includes two spherical mirrors, one mild aspheric mirror and one aspheric mirror all centered about a common telescope axis and imaging on a focal surface for easy manufacture, very long focal length, wide field of view, high resolution, compact volume and low weight particularly well suited for space observations, and in a detailed form includes a sectional concave hyberboloidal primary mirror, a circular mild convex ellipsoidal secondary mirror, a sectional concave spherical tertiary mirror and a sectional convex spherical quaternary mirror for focusing an extended distant object onto a concave cylindrical focal surface having a linear array of charge coupled detectors for high resolution imagery, the telescope having high performance operation near diffraction limits and operating at detector resolution limits.

Abstract translation: 所有反射式望远镜系统通常包括两个球面镜，一个温和的非球面镜和一个非球面镜，全部以公共望远镜轴为中心，并在焦面上成像，便于制造，非常长的焦距，宽视野，高分辨率，紧凑 体积小，重量轻，特别适用于空间观察，详细形式包括截面凹形主体镜，圆形温和凸椭圆形次镜，截面凹球面三级镜和用于聚焦延伸远距离 物体到具有用于高分辨率图像的电荷耦合检测器的线性阵列的凹圆柱形焦点表面上，望远镜在衍射极限附近具有高性能操作并且在检测器分辨率极限下操作。

公开(公告)号：US20090237657A1

公开(公告)日：2009-09-24

申请号：US12052705

申请日：2008-03-20

Applicant: David Wheeler Warren

Inventor： David Wheeler Warren

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/18

Abstract: A spectrometer apparatus includes a refractor element, a slit, a detector, a diffraction grating, and a corrector lens. The refractor element includes a rear surface and a front surface. The slit provides an optical path to the rear surface of the refractor element, and is configured to transmit an image incident thereupon along the optical path. The detector is positioned facing the rear surface of the refractor element. The diffraction grating faces the front surface of the refractor element, and is configured to spectrally disperse and reimage the image of the slit toward the front surface of the refractor element. The corrector lens is positioned between the refractor element and the diffraction grating such that the image is provided to the detector corrected for a spherical aberration caused by a separation distance between the detector and the rear surface of the refractor element.

Abstract translation: 光谱仪装置包括折光元件，狭缝，检测器，衍射光栅和校正透镜。 折射元件包括后表面和前表面。 狭缝提供到折射元件的后表面的光路，并且被配置为传输沿着光路入射的图像。 检测器面向折射器元件的后表面定位。 衍射光栅面向折射元件的前表面，并且被配置为使光束的图像朝向折射元件的前表面光谱分散并重新成像。 校正透镜位于折射元件和衍射光栅之间，使得将图像提供给由检测器和折射元件的后表面之间的间隔距离引起的球面像差校正的检测器。

公开(公告)号：US20110292374A1

公开(公告)日：2011-12-01

申请号：US12791604

申请日：2010-06-01

Applicant: Nielson Wade Schulenburg ,  David Wheeler Warren ,  Donald J. Rudy ,  Michael G. Martino ,  Mark Alan Chatelain ,  Michael Arthur Rocha

Inventor： Nielson Wade Schulenburg ,  David Wheeler Warren ,  Donald J. Rudy ,  Michael G. Martino ,  Mark Alan Chatelain ,  Michael Arthur Rocha

IPC: G01J3/40 ,  G01J3/00 ,  G01J3/28

CPC classification number: G01J5/522 ,  G01J3/2823 ,  G01J5/0003 ,  G01J5/047 ,  G01J5/0846 ,  G01J5/10 ,  G01J2005/0077

Abstract: A method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissive and/or emissive configurations. Temperatures of the sample material and heater are determined at the different heater temperatures for each configuration using, in each instance, radiance measurements taken after the temperatures of the heater and sample material have both stabilized. The transmissivity of the sample material is determined using the temperatures determined in the transmissive configuration and spectral-spatial data collected at selected points of interest over the sample material. The emissivity of the sample material is determined using the temperatures determined in the emissive configuration, the spectral-spatial data collected at selected points of interest over the sample material, and the transmissivity. The reflectivity of the sample material is determined using the emissivity and transmissivity.

Abstract translation: 用于测量光谱特征的方法包括捕获光谱空间数据，其包括样品材料和加热器的光谱平坦，高发射表面部分上的辐射测量，用于透射和/或发射配置的至少两个不同的加热器温度。 在每个配置的不同加热器温度下，使用在每种情况下，在加热器和样品材料的温度均稳定之后进行的辐射测量来确定样品材料和加热器的温度。 使用在透射配置中确定的温度和在样品材料上的所选感兴趣点处收集的光谱 - 空间数据来确定样品材料的透射率。 使用在发射配置中确定的温度，在选定的样品材料上收集的光谱 - 空间数据和透射率来确定样品材料的发射率。 使用发射率和透射率确定样品材料的反射率。

公开(公告)号：US08304730B2

公开(公告)日：2012-11-06

申请号：US12791604

申请日：2010-06-01

Applicant: Nielson Wade Schulenburg ,  David Wheeler Warren ,  Donald J. Rudy ,  Michael G. Martino ,  Mark Alan Chatelain ,  Michael Arthur Rocha

Inventor： Nielson Wade Schulenburg ,  David Wheeler Warren ,  Donald J. Rudy ,  Michael G. Martino ,  Mark Alan Chatelain ,  Michael Arthur Rocha

IPC: G01J5/00

CPC classification number: G01J5/522 ,  G01J3/2823 ,  G01J5/0003 ,  G01J5/047 ,  G01J5/0846 ,  G01J5/10 ,  G01J2005/0077

Abstract: A method for measuring spectral characteristics includes capturing spectral-spatial data that includes radiance measurements over spectrally flat, highly emissive surface portions of a sample material and heater at least two different heater temperatures for transmissive and/or emissive configurations. Temperatures of the sample material and heater are determined at the different heater temperatures for each configuration using, in each instance, radiance measurements taken after the temperatures of the heater and sample material have both stabilized. The transmissivity of the sample material is determined using the temperatures determined in the transmissive configuration and spectral-spatial data collected at selected points of interest over the sample material. The emissivity of the sample material is determined using the temperatures determined in the emissive configuration, the spectral-spatial data collected at selected points of interest over the sample material, and the transmissivity. The reflectivity of the sample material is determined using the emissivity and transmissivity.

Abstract translation: 用于测量光谱特征的方法包括捕获光谱空间数据，其包括样品材料和加热器的光谱平坦，高发射表面部分上的辐射测量，用于透射和/或发射配置的至少两个不同的加热器温度。 在每个配置的不同加热器温度下，使用在每种情况下，在加热器和样品材料的温度均稳定之后进行的辐射测量来确定样品材料和加热器的温度。 使用在透射配置中确定的温度和在样品材料上的所选感兴趣点处收集的光谱 - 空间数据来确定样品材料的透射率。 使用在发射配置中确定的温度，在选定的样品材料上收集的光谱 - 空间数据和透射率来确定样品材料的发射率。 使用发射率和透射率确定样品材料的反射率。

公开(公告)号：US07609381B2

公开(公告)日：2009-10-27

申请号：US12052705

申请日：2008-03-20

Applicant: David Wheeler Warren

Inventor： David Wheeler Warren

IPC: G01J3/28 ,  G01J3/18

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/18

Abstract: A spectrometer apparatus includes a refractor element, a slit, a detector, a diffraction grating, and a corrector lens. The refractor element includes a rear surface and a front surface. The slit provides an optical path to the rear surface of the refractor element, and is configured to transmit an image incident thereupon along the optical path. The detector is positioned facing the rear surface of the refractor element. The diffraction grating faces the front surface of the refractor element, and is configured to spectrally disperse and reimage the image of the slit toward the front surface of the refractor element. The corrector lens is positioned between the refractor element and the diffraction grating such that the image is provided to the detector corrected for a spherical aberration caused by a separation distance between the detector and the rear surface of the refractor element.

Abstract translation: 光谱仪装置包括折光元件，狭缝，检测器，衍射光栅和校正透镜。 折射元件包括后表面和前表面。 狭缝提供到折射元件的后表面的光路，并且被配置为传输沿着光路入射的图像。 检测器面向折射器元件的后表面定位。 衍射光栅面向折射元件的前表面，并且被配置为使光束的图像朝向折射元件的前表面光谱分散并重新成像。 校正透镜位于折射元件和衍射光栅之间，使得将图像提供给由检测器和折射元件的后表面之间的间隔距离引起的球面像差校正的检测器。