公开(公告)号：US11790520B2

公开(公告)日：2023-10-17

申请号：US17834508

申请日：2022-06-07

Applicant: FLIR Systems AB

Inventor： Ariel Nagauker ,  Chen Yahudayin

IPC: G06T7/00 ,  H04N5/33 ,  G06T17/00 ,  G01J5/10 ,  G01J5/00

CPC classification number: G06T7/0006 ,  G01J5/10 ,  G06T17/00 ,  H04N5/33 ,  G01J2005/0077 ,  G01J2005/106 ,  G06T2207/10048 ,  G06T2207/20081 ,  G06T2207/20084 ,  G06T2207/20092 ,  G06T2207/30116

Abstract: Techniques for facilitating testing analytics of imaging systems and methods using molds are provided. In one example, a system includes a mold temperature controller configured to apply a thermal signature to a mold of a target. The system further includes a focal plane array configured to capture an infrared image of the mold. The system further includes an image analytics device configured to determine thermal analytics associated with the mold based on the infrared image. Related devices and methods are also provided.

公开(公告)号：US20220392054A1

公开(公告)日：2022-12-08

申请号：US17834508

申请日：2022-06-07

Applicant: FLIR Systems AB

Inventor： Ariel Nagauker ,  Chen Yahudayin

IPC: G06T7/00 ,  H04N5/33 ,  G06T17/00 ,  G01J5/10

Abstract: Techniques for facilitating testing analytics of imaging systems and methods using molds are provided. In one example, a system includes a mold temperature controller configured to apply a thermal signature to a mold of a target. The system further includes a focal plane array configured to capture an infrared image of the mold. The system further includes an image analytics device configured to determine thermal analytics associated with the mold based on the infrared image. Related devices and methods are also provided.