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公开(公告)号：US10928249B2
公开(公告)日：2021-02-23
申请号：US16347259
申请日：2017-11-13
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Makoto Kono
Abstract: A spectroscopic measurement device emits light to a measurement target and measures the measurement light output from the measurement target in accordance with the light emission. A spectroscopic measurement device includes: a first housing having a light shielding property and configured to house a light source that emits light and having a first opening through which the light emitted from the light source passes; a second housing having a light shielding property and having a second opening through which the measurement light passes and configured to house a spectrometer that receives the measurement light that has passed through the second opening; and an attachment configured to detachably hold the first housing and the second housing.
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公开(公告)号：US10520362B2
公开(公告)日：2019-12-31
申请号：US16347270
申请日：2017-11-13
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Makoto Kono
Abstract: A spectroscopic measurement device emits light to a measurement target and measures the measurement light output from the measurement target in accordance with the light emission. A spectroscopic measurement device includes: a first housing having a light shielding property and configured to house a light source that emits light and having a first opening through which the light emitted from the light source passes; a second housing having a light shielding property and having a second opening through which the measurement light passes and configured to house a spectrometer that receives the measurement light that has passed through the second opening; and a junction configured to join the first housing and the second housing such that relative positions of the first housing and the second housing can be changed.
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公开(公告)号：US11060911B2
公开(公告)日：2021-07-13
申请号：US16348172
申请日：2017-11-13
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Makoto Kono
Abstract: A spectroscopic measurement device emits light to a measurement target and measures the measurement light output from the measurement target in accordance with the light emission. A spectroscopic measurement device includes: a first housing having a light shielding property and configured to house a light source that emits light and having a first opening through which the light emitted from the light source passes; a second housing having a light shielding property and having a second opening through which the measurement light passes and configured to house a spectrometer that receives the measurement light that has passed through the second opening; and an arm member configured to relatively rotatably join the first housing and the second housing. A proximal end side of the arm member is rotatably joined with the second housing. The first housing is attached to a distal end side of the arm member.
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公开(公告)号：US12113080B2
公开(公告)日：2024-10-08
申请号：US17285201
申请日：2019-09-11
Applicant: HAMAMATSU PHOTONICS K.K.
Inventor： Ryo Takiguchi , Makoto Kono , Keiichi Ota , Tetsuya Taka
IPC: H01L27/146
CPC classification number: H01L27/1462 , H01L27/14643
Abstract: A solid-state imaging device according to the disclosure includes a semiconductor substrate which has a main surface having a plurality of photosensitive regions, and an insulating film which is provided on the main surface of the semiconductor substrate. When the main surface of the semiconductor substrate is taken as a reference surface, a thickness of the insulating film from the reference surface is 0.5 μm or more, a surface (a main surface) of the insulating film on the side opposite to the main surface is a surface having flatness, and a plurality of types of bottom surfaces of which depths from the reference surface are different from each other are provided on the main surface of the semiconductor substrate in the photosensitive regions.
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