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公开(公告)号:US1839955A
公开(公告)日:1932-01-05
申请号:US51002731
申请日:1931-01-20
Applicant: HILGER LTD ADAM
Inventor: HENDRI DOWELL JOHN
IPC: G02B27/14
CPC classification number: G02B27/1013 , G02B27/144 , G02B27/145
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公开(公告)号:US2298875A
公开(公告)日:1942-10-13
申请号:US40152741
申请日:1941-07-08
Applicant: HILGER LTD ADAM
Inventor: HENDRI DOWELL JOHN
IPC: G01B5/004
CPC classification number: G01B5/004
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公开(公告)号:US2548548A
公开(公告)日:1951-04-10
申请号:US2526448
申请日:1948-05-05
Applicant: HILGER LTD ADAM
Inventor: GEORGE MENZIES ALEXANDER CHARL , HENDRI DOWELL JOHN
IPC: G01J3/20
CPC classification number: G01J3/20
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公开(公告)号:US1653234A
公开(公告)日:1927-12-20
申请号:US2070525
申请日:1925-04-04
Applicant: HILGER LTD ADAM
Inventor: THOMAS SMITH , HENDRI DOWELL JOHN
IPC: G01B9/02
CPC classification number: G01B9/02
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5.Method and apparatus for testing and finishing optical elements 失效
Title translation: 用于测试和整理光学元件的方法和设备公开(公告)号:US1653233A
公开(公告)日:1927-12-20
申请号:US2070425
申请日:1925-04-04
Applicant: HILGER LTD ADAM
Inventor: THOMAS SMITH , HENDRI DOWELL JOHN
IPC: G01B9/02
CPC classification number: G01B9/02
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