Method of insitu monitoring of supercritical fluid process conditions
    4.
    发明申请
    Method of insitu monitoring of supercritical fluid process conditions 失效
    超临界流体工艺条件的现场监测方法

    公开(公告)号:US20040113079A1

    公开(公告)日:2004-06-17

    申请号:US10320835

    申请日:2002-12-16

    CPC classification number: G01N21/359 G01N21/3504

    Abstract: A method and apparatus are provided for in situ monitoring and analyzing of process parameters for semiconductor fabrication processes including cleaning semiconductor wafers utilizing a supercritical fluid or a high pressure liquid such as CO2. The method and apparatus utilize a spectrometer having a reflective mirror proximate the vessel holding the high pressure fluid. NIR radiation transmitted into the vessel through a window and out of the vessel through an opposed window is reflected and detected and measured and the composition of the fluid in the pressure vessel is determined allowing the user to control process parameters based on the measured composition.

    Abstract translation: 提供了一种用于半导体制造工艺的工艺参数的现场监测和分析的方法和装置,包括利用超临界流体或诸如CO 2的高压液体清洗半导体晶片。 该方法和装置利用具有靠近保持高压流体的容器的反射镜的光谱仪。 通过窗口传输到容器中并通过相对的窗口传出容器的NIR辐射被反射和检测和测量,并且确定压力容器中的流体的组成,允许用户基于测量的组成来控制工艺参数。

    PROCESS FOR DEPOSITING A FILM ON A NANOMETER STRUCTURE
    9.
    发明申请
    PROCESS FOR DEPOSITING A FILM ON A NANOMETER STRUCTURE 失效
    在纳米结构上沉积薄膜的方法

    公开(公告)号:US20020090458A1

    公开(公告)日:2002-07-11

    申请号:US09755266

    申请日:2001-01-05

    CPC classification number: B05D1/18 B05D2401/90 C23C18/00

    Abstract: A process of depositing a thin film on a nanometer structure in which a coating, which may be an aerogel material or metallic seed layer, is prepared. The coating is combined with a supercritical composition to form a supercritical coating composition. The supercritical coating composition is deposited upon a nanometer structure under supercritical conditions. Supercritical conditions are removed whereby the supercritical composition is removed and the coating solidifies into a thin solid film.

    Abstract translation: 在纳米结构上沉积薄膜的方法,其中制备可以是气凝胶材料或金属种子层的涂层。 将涂层与超临界组合物组合以形成超临界涂料组合物。 超临界涂料组合物在超临界条件下沉积在纳米结构上。 去除超临界条件,由此除去超临界组合物,并将涂层固化成薄的固体膜。

    Solid CO2 cleaning
    10.
    发明申请
    Solid CO2 cleaning 失效
    固体二氧化碳清洗

    公开(公告)号:US20040112406A1

    公开(公告)日:2004-06-17

    申请号:US10320836

    申请日:2002-12-16

    CPC classification number: B08B7/0021 H01L21/02063 Y10S134/902

    Abstract: A method and apparatus are provided for removing solid and/or liquid residues from electronic components such as semiconductor wafers utilizing liquid or supercritical carbon dioxide which is solidified on the surface of the wafer and then vaporized and removed from the system. In a preferred embodiment the solidification and vaporizing steps are repeated (cycled) before removal of the CO2 from the vessel. The residues are carried away with the vaporized carbon dioxide.

    Abstract translation: 提供了一种方法和装置,用于从诸如半导体晶片的电子部件中除去固体和/或液体残留物,其中所述液体或超临界二氧化碳在晶片的表面上固化,然后蒸发并从系统中除去。 在优选的实施方案中,在从容器中除去CO 2之前重复(循环)固化和蒸发步骤。 残余物被蒸发的二氧化碳带走。

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