公开(公告)号：US20250078370A1

公开(公告)日：2025-03-06

申请号：US18955660

申请日：2024-11-21

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  John James Shedletsky ,  Isaac Sukin ,  Simon Kozlov

IPC: G06T11/60 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T7/00 ,  G06T7/11 ,  G06T7/13 ,  G06T7/60 ,  G06V10/44

Abstract: One variation of a method for automatically generating a common measurement across multiple assembly units includes: displaying a first image—recorded at an optical inspection station—within a user interface; receiving manual selection of a particular feature in a first assembly unit represented in the first image; receiving selection of a measurement type for the particular feature; extracting a first real dimension of the particular feature in the first assembly unit from the first image according to the measurement type; for each image in a set of images, identifying a feature—analogous to the particular feature—in an assembly unit represented in the image and extracting a real dimension of the feature in the assembly unit from the image according to the measurement type; and aggregating the first real dimension and a set of real dimensions extracted from the set of images into a digital container.

公开(公告)号：US20240331134A1

公开(公告)日：2024-10-03

申请号：US18623870

申请日：2024-04-01

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  John James Shedletsky ,  Isaac Sukin ,  Simon Kozlov ,  Juyong Do ,  Arseni Kravchenko ,  Ken Hua ,  Nic Weidinger

IPC: G06T7/00 ,  G06V10/75

CPC classification number: G06T7/001 ,  G06T7/0006 ,  G06V10/751 ,  G06T2200/24 ,  G06T2207/20092 ,  G06T2207/30108

Abstract: A method includes: identifying a first set of key features in a first inspection image characterizing geometric properties of a set of predefined features; extracting a first set of real dimensions of the first set of key features from the first inspection image; projecting the first set of real dimensions proximal the first set of key features onto the first inspection image; receiving confirmation of a first subset of key features, in the first set of key features, from a user; identifying the first subset of key features in a second inspection image; identifying a second set of key features in the second inspection image characterizing properties of the set of predefined features, the second set of key features distinct from unconfirmed features in the first set of key features; and extracting a second set of real dimensions of the second set of key features from the second inspection image.

公开(公告)号：US20240257427A1

公开(公告)日：2024-08-01

申请号：US18623890

申请日：2024-04-01

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  John James Shedletsky ,  Isaac Sukin ,  Simon Kozlov ,  Juyong Do ,  Arseni Kravchenko ,  Ken Hua ,  Nic Weidinger

IPC: G06T11/60 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T7/00 ,  G06T7/11 ,  G06T7/13 ,  G06T7/60 ,  G06V10/44

CPC classification number: G06T11/60 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T7/0004 ,  G06T7/001 ,  G06T7/11 ,  G06T7/13 ,  G06T7/60 ,  G06V10/44 ,  G06F2203/04806 ,  G06T2200/24 ,  G06T2207/10004 ,  G06T2207/10016 ,  G06T2207/20092 ,  G06T2207/20164 ,  G06T2207/20221 ,  G06T2207/30108 ,  G06V2201/06

Abstract: A method includes: identifying a first set of key features in a first inspection image characterizing geometric properties of a set of predefined features; extracting a first set of real dimensions of the first set of key features from the first inspection image; projecting the first set of real dimensions proximal the first set of key features onto the first inspection image; receiving confirmation of a first subset of key features, in the first set of key features, from a user; identifying the first subset of key features in a second inspection image; identifying a second set of key features in the second inspection image characterizing properties of the set of predefined features, the second set of key features distinct from unconfirmed features in the first set of key features; and extracting a second set of real dimensions of the second set of key features from the second inspection image.