公开(公告)号：US20230368368A1

公开(公告)日：2023-11-16

申请号：US18197571

申请日：2023-05-15

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Simon Kozlov ,  Ana Ulin ,  Mikhail Okunev ,  Isaac Sukin

IPC: G06T7/00 ,  G06T7/10

CPC classification number: G06T7/001 ,  G06T7/10 ,  G06T3/0068 ,  G06T2200/24 ,  G06T2207/20021 ,  G06T2207/20081

Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.

公开(公告)号：US20250078370A1

公开(公告)日：2025-03-06

申请号：US18955660

申请日：2024-11-21

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  John James Shedletsky ,  Isaac Sukin ,  Simon Kozlov

IPC: G06T11/60 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T7/00 ,  G06T7/11 ,  G06T7/13 ,  G06T7/60 ,  G06V10/44

Abstract: One variation of a method for automatically generating a common measurement across multiple assembly units includes: displaying a first image—recorded at an optical inspection station—within a user interface; receiving manual selection of a particular feature in a first assembly unit represented in the first image; receiving selection of a measurement type for the particular feature; extracting a first real dimension of the particular feature in the first assembly unit from the first image according to the measurement type; for each image in a set of images, identifying a feature—analogous to the particular feature—in an assembly unit represented in the image and extracting a real dimension of the feature in the assembly unit from the image according to the measurement type; and aggregating the first real dimension and a set of real dimensions extracted from the set of images into a digital container.

公开(公告)号：US20240087104A1

公开(公告)日：2024-03-14

申请号：US18230105

申请日：2023-08-03

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Simon Kozlov ,  Tilmann Bruckhaus ,  Shilpi Kumar ,  Isaac Sukin ,  Ian Theilacker ,  Brendan Green

IPC: G06T7/00 ,  G06F18/213 ,  G06F18/40 ,  G06V10/25 ,  G06V10/40 ,  G06V10/771

CPC classification number: G06T7/0004 ,  G06F18/213 ,  G06F18/40 ,  G06T7/001 ,  G06V10/25 ,  G06V10/40 ,  G06V10/771 ,  G06T2207/30116 ,  G06T2207/30164

Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.

公开(公告)号：US20220375056A1

公开(公告)日：2022-11-24

申请号：US17880440

申请日：2022-08-03

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Reilly Hayes ,  Spencer Purdy ,  Molly McShane ,  Anna-Katrina Shedletsky

IPC: G06T7/00 ,  G06V10/44 ,  G06T7/11 ,  G06T7/13 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T11/60 ,  G06T7/60

Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.

公开(公告)号：US20220222808A1

公开(公告)日：2022-07-14

申请号：US17708993

申请日：2022-03-30

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky

IPC: G06T7/00 ,  H04N9/82 ,  G01B11/02 ,  G01N21/88 ,  H04N5/225 ,  H04N5/247 ,  H04N5/76

Abstract: One variation of an optical inspection kit includes: an enclosure defining an imaging volume; an optical sensor adjacent the imaging volume and defining a field of view directed toward the imaging volume; a nest module defining a receptacle configured to locate a surface of interest on a first unit of a first part within the imaging volume at an image plane of the optical sensor; a dark-field lighting module adjacent and perpendicular to the nest module and including a dark-field light source configured to output light across a light plane and a directional light filter configured to pass light output by the dark-field light source normal to the light plane and to reject light output by the dark-field light source substantially nonparallel to the light plane; and a bright-field light source proximal the optical sensor and configured to output light toward the surface of interest.

公开(公告)号：US10789701B2

公开(公告)日：2020-09-29

申请号：US15953206

申请日：2018-04-13

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Simon Kozlov ,  Ana Ulin ,  Mikhail Okunev ,  Isaac Sukin

IPC: G06K9/00 ,  G06T7/00 ,  G06T7/10 ,  G06T3/00

Abstract: One variation of a method for predicting manufacturing defects includes: accessing a set of inspection images of a set of assembly units recorded by an optical inspection station; for each inspection image in the set of inspection images, detecting a set of features in the inspection image and generating a vector representing the set of features in a multi-dimensional feature space; grouping neighboring vectors in the multi-dimensional feature space into a set of vector groups; and, in response to receipt of a first inspection result indicting a defect in a first assembly unit, in the set of assembly units, associated with a first vector in a first vector group, in the set of vector groups, labeling the first vector group with the defect and flagging a second assembly unit associated with a second vector, in the first vector group, as exhibiting characteristics of the defect.

公开(公告)号：US20190114756A1

公开(公告)日：2019-04-18

申请号：US15953216

申请日：2018-04-13

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Simon Kozlov ,  Ana Ulin ,  Mikhail Okunev ,  Isaac Sukin

IPC: G06T7/00

Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.

公开(公告)号：US12205274B2

公开(公告)日：2025-01-21

申请号：US18197571

申请日：2023-05-15

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Simon Kozlov ,  Ana Ulin ,  Mikhail Okunev ,  Isaac Sukin

IPC: G06T7/00 ,  G06T7/10 ,  G06T3/14

Abstract: One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features extracted from the first set of inspection images; grouping neighboring vectors in a multi-dimensional feature space into a set of vector groups; accessing a second inspection image of a second assembly recorded by the optical inspection station at a second time succeeding the first period of time; detecting a second set of features in the second inspection image; generating a second vector representing the second set of features in the multi-dimensional feature space; and, in response to the second vector deviating from the set of vector groups by more than a threshold difference, flagging the second assembly unit.

公开(公告)号：US12020415B2

公开(公告)日：2024-06-25

申请号：US17855130

申请日：2022-06-30

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Simon Kozlov ,  Tilmann Bruckhaus ,  Shilpi Kumar ,  Isaac Sukin ,  Ian Theilacker ,  Brendan Green

IPC: G06T7/00 ,  G06F18/213 ,  G06F18/40 ,  G06V10/25 ,  G06V10/40 ,  G06V10/771

CPC classification number: G06T7/0004 ,  G06F18/213 ,  G06F18/40 ,  G06T7/001 ,  G06V10/25 ,  G06V10/40 ,  G06V10/771 ,  G06T2207/30116 ,  G06T2207/30164

Abstract: One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.

公开(公告)号：US11989872B2

公开(公告)日：2024-05-21

申请号：US17708993

申请日：2022-03-30

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky

IPC: G06T7/90 ,  G01B11/02 ,  G01N21/88 ,  G06T7/00 ,  H04N5/76 ,  H04N9/82 ,  H04N23/56 ,  H04N23/90 ,  G01N21/93 ,  G01N21/956 ,  H05B47/16

CPC classification number: G06T7/0004 ,  G01B11/022 ,  G01N21/8806 ,  G01N21/8851 ,  H04N5/76 ,  H04N9/8205 ,  H04N23/56 ,  H04N23/90 ,  G01N2021/8825 ,  G01N21/93 ,  G01N2021/95638 ,  H05B47/16

Abstract: One variation of an optical inspection kit includes: an enclosure defining an imaging volume; an optical sensor adjacent the imaging volume and defining a field of view directed toward the imaging volume; a nest module defining a receptacle configured to locate a surface of interest on a first unit of a first part within the imaging volume at an image plane of the optical sensor; a dark-field lighting module adjacent and perpendicular to the nest module and including a dark-field light source configured to output light across a light plane and a directional light filter configured to pass light output by the dark-field light source normal to the light plane and to reject light output by the dark-field light source substantially nonparallel to the light plane; and a bright-field light source proximal the optical sensor and configured to output light toward the surface of interest.