公开(公告)号：US20240331134A1

公开(公告)日：2024-10-03

申请号：US18623870

申请日：2024-04-01

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  John James Shedletsky ,  Isaac Sukin ,  Simon Kozlov ,  Juyong Do ,  Arseni Kravchenko ,  Ken Hua ,  Nic Weidinger

IPC: G06T7/00 ,  G06V10/75

CPC classification number: G06T7/001 ,  G06T7/0006 ,  G06V10/751 ,  G06T2200/24 ,  G06T2207/20092 ,  G06T2207/30108

Abstract: A method includes: identifying a first set of key features in a first inspection image characterizing geometric properties of a set of predefined features; extracting a first set of real dimensions of the first set of key features from the first inspection image; projecting the first set of real dimensions proximal the first set of key features onto the first inspection image; receiving confirmation of a first subset of key features, in the first set of key features, from a user; identifying the first subset of key features in a second inspection image; identifying a second set of key features in the second inspection image characterizing properties of the set of predefined features, the second set of key features distinct from unconfirmed features in the first set of key features; and extracting a second set of real dimensions of the second set of key features from the second inspection image.

公开(公告)号：US20230152785A1

公开(公告)日：2023-05-18

申请号：US17988697

申请日：2022-11-16

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  Rustem Feyzkhanov ,  Isaac Sukin ,  Jack Robbins ,  Juyong Do ,  Prerna Dhareshwar

IPC: G05B19/418 ,  G06T7/00

CPC classification number: G05B19/4184 ,  G05B19/41805 ,  G05B19/4188 ,  G06T7/0004

Abstract: A method includes accessing feature values representing a historical population of assembly units assembled on an assembly line; and accessing a failure status of the assembly unit at a target test on the assembly line. The method also includes, for each feature: deriving a correlation between values of the feature and failure status at the target test; deriving an effective limit of the feature based on scope of feature values in the historical population of assembly units; and calculating an action score for the feature based on the correlation and a width of the effective limit. The method further includes: selecting a particular feature exhibiting greatest action score; defining a preemptive test for the particular feature upstream of the target test during a next assembly period; and assigning a target limit, narrower than an effective limit of the particular feature, to the preemptive test.

公开(公告)号：US20240257427A1

公开(公告)日：2024-08-01

申请号：US18623890

申请日：2024-04-01

Applicant: Instrumental, Inc.

Inventor： Samuel Bruce Weiss ,  Anna-Katrina Shedletsky ,  John James Shedletsky ,  Isaac Sukin ,  Simon Kozlov ,  Juyong Do ,  Arseni Kravchenko ,  Ken Hua ,  Nic Weidinger

IPC: G06T11/60 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T7/00 ,  G06T7/11 ,  G06T7/13 ,  G06T7/60 ,  G06V10/44

CPC classification number: G06T11/60 ,  G06F3/04842 ,  G06F3/04845 ,  G06F3/0485 ,  G06T7/0004 ,  G06T7/001 ,  G06T7/11 ,  G06T7/13 ,  G06T7/60 ,  G06V10/44 ,  G06F2203/04806 ,  G06T2200/24 ,  G06T2207/10004 ,  G06T2207/10016 ,  G06T2207/20092 ,  G06T2207/20164 ,  G06T2207/20221 ,  G06T2207/30108 ,  G06V2201/06

Abstract: A method includes: identifying a first set of key features in a first inspection image characterizing geometric properties of a set of predefined features; extracting a first set of real dimensions of the first set of key features from the first inspection image; projecting the first set of real dimensions proximal the first set of key features onto the first inspection image; receiving confirmation of a first subset of key features, in the first set of key features, from a user; identifying the first subset of key features in a second inspection image; identifying a second set of key features in the second inspection image characterizing properties of the set of predefined features, the second set of key features distinct from unconfirmed features in the first set of key features; and extracting a second set of real dimensions of the second set of key features from the second inspection image.