公开(公告)号：US10317283B2

公开(公告)日：2019-06-11

申请号：US16075346

申请日：2017-02-02

Applicant: JASCO CORPORATION

Inventor： Tetsuji Sunami ,  Takashi Shimamura ,  Norio Wakimoto ,  Jun Koshobu

IPC: G01J5/02 ,  G01J3/45 ,  G01N21/35 ,  G01J3/28 ,  G01J3/453 ,  G01N21/31 ,  G01N21/25 ,  G01N21/00 ,  G01J3/02

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength λ1 of a semi-conductor laser, and a step of interpolating intensity signals (I1′, I2′, . . . ) that would be obtained when the interference wave is sampled at positions (D1′, D2′, . . . ) of the movable mirror set on the basis of a wavelength λ0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1′, I2′, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength λ0.