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公开(公告)号:US20190041268A1
公开(公告)日:2019-02-07
申请号:US16075346
申请日:2017-02-02
Applicant: JASCO CORPORATION
Inventor: Tetsuji SUNAMI , Takashi SHIMAMURA , Norio WAKIMOTO , Jun KOSHOBU
Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength λ1 of a semi-conductor laser, and a step of interpolating intensity signals (I1′, I2′, . . . ) that would be obtained when the interference wave is sampled at positions (D1′, D2′, . . . ) of the movable mirror set on the basis of a wavelength λ0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1′, I2′, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength λ0.