公开(公告)号：US20190041268A1

公开(公告)日：2019-02-07

申请号：US16075346

申请日：2017-02-02

Applicant: JASCO CORPORATION

Inventor： Tetsuji SUNAMI ,  Takashi SHIMAMURA ,  Norio WAKIMOTO ,  Jun KOSHOBU

IPC: G01J3/45 ,  G01N21/35

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength λ1 of a semi-conductor laser, and a step of interpolating intensity signals (I1′, I2′, . . . ) that would be obtained when the interference wave is sampled at positions (D1′, D2′, . . . ) of the movable mirror set on the basis of a wavelength λ0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1′, I2′, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength λ0.

公开(公告)号：US20190086332A1

公开(公告)日：2019-03-21

申请号：US16089146

申请日：2017-03-23

Applicant: JASCO CORPORATION

Inventor： Noriaki SOGA ,  Tetsuji SUNAMI ,  Tsubasa ASATSUMA ,  Hiroshi SUGIYAMA ,  Jun KOSHOBU

IPC: G01N21/552 ,  G01N21/3563

CPC classification number: G01N21/552 ,  G01N21/3563

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle θc inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle θc′ of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.