公开(公告)号：US09400214B1

公开(公告)日：2016-07-26

申请号：US14183088

申请日：2014-02-18

Applicant: Joseph R. Demers

Inventor： Joseph R. Demers ,  Ronald T. Logan, Jr. ,  Bryon Kasper

IPC: G01J5/02 ,  G01J3/28 ,  G01J3/42 ,  G01J3/02 ,  G01J3/10 ,  G01N21/3581 ,  G01N21/3586

CPC classification number: G01J3/42 ,  G01J3/0256 ,  G01J3/10 ,  G01J3/108 ,  G01N21/3581 ,  G01N21/3586

Abstract: There is described an apparatus for analyzing, identifying or imaging a target. The apparatus comprises a laser system which generates first and second laser beams having respective different frequencies, and directs the first and second laser beams along an optical path to a photoconductive material. An antenna structure is formed on the photoconductive material, the antenna structure comprises a first antenna for emitting electromagnetic radiation having a frequency dependent on the difference between said respective different frequencies of the first and second laser beams and a second antenna for generating a detection signal. A processor processes the detection signal to analyze, identify or image the target. The laser system is arranged such that the first and second laser beams overlap in a region of a surface of the photoconductive material having at least part of the first and second antennas formed thereon.

Abstract translation: 描述了用于分析，识别或成像目标的装置。 该装置包括产生具有各自不同频率的第一和第二激光束并将第一和第二激光束沿着光路引导到光电导材料的激光系统。 天线结构形成在光电导材料上，天线结构包括用于发射具有取决于第一和第二激光束的各个不同频率之间的差异的频率的电磁辐射的第一天线和用于产生检测信号的第二天线。 处理器处理检测信号以分析，识别或成像目标。 激光系统被布置成使得第一和第二激光束在其中形成有第一和第二天线的至少一部分的光电导材料的表面的区域中重叠。