公开(公告)号：US11280677B2

公开(公告)日：2022-03-22

申请号：US16316727

申请日：2017-07-05

Applicant: KONICA MINOLTA, INC.

Inventor： Hiroki Aomatsu ,  Shinichi Iida ,  Wataru Yamaguchi ,  Yoshitaka Teraoka ,  Yoshihisa Abe

IPC: G01J3/50 ,  G01N21/25 ,  G01J3/02 ,  G01J3/46 ,  G01J3/10

Abstract: Colorimeter having first and second illumination units disposed symmetrically to a reference line in a prescribed plane, first and second light-receiving parts disposed symmetrically to the reference line in the prescribed plane, a calculation unit for determining color information about a measurement object, and an opposing wall that opposes the measurement object when it is measured. The opposing wall has an abutting part that abuts the measurement object when it is measured. The abutting part has a pair of first abutting parts disposed on two sides of a measurement opening to flank the measurement opening; and a pair of second abutting parts disposed on an orthogonal line orthogonal to a first-abutting-part connection line that connects the pair of first abutting parts to each other, the pair of second abutting parts being disposed on two sides of the first-abutting-part connection line to flank the first-abutting-part connection line.

公开(公告)号：US09885668B2

公开(公告)日：2018-02-06

申请号：US15506613

申请日：2015-07-21

Applicant: Konica Minolta, Inc.

Inventor： Takafumi Komatsu ,  Yoshihisa Abe ,  Wataru Yamaguchi ,  Yosuke Takebe

IPC: G01N21/55 ,  G01N21/95

CPC classification number: G01N21/95 ,  G01N21/8806

Abstract: A surface inspection device includes an opening defining an aperture plane, one or more optical transceivers, and a processor. Each optical transceiver includes a light emitter and a light receiver that are arranged in different directions with respect to the aperture plane when viewed from above a virtual normal line of the aperture plane. The processor acquires detection values from the optical transceivers and calculates an evaluation value of a degree of variation in the detection values.

公开(公告)号：US11089225B2

公开(公告)日：2021-08-10

申请号：US16091446

申请日：2017-04-05

Applicant: KONICA MINOLTA, INC.

Inventor： Koji Yamamoto ,  Satoshi Yokota ,  Norimasa Kubota ,  Yoshihisa Abe ,  Yuta Yamanoi ,  Masaaki Chigasaki ,  Osamu Toyama

IPC: H04N5/232 ,  G01N21/27 ,  G03B5/08 ,  G03B15/00 ,  G03B5/04 ,  G01B11/30 ,  G01N21/55

Abstract: An optical measuring device comprises: a lens to form an image with reflected light from a measuring object; an image sensor to receive the reflected light that has passed through the lens and generate an image representing the measuring object; a driver to drive a drive object, the drive object being at least one of the lens and the image sensor; and a controller to control the optical measuring device. The controller acquires, from the image sensor, a plurality of images generated by the image sensor successively imaging the measuring object while the driver is driving the drive object in accordance with a predetermined driving pattern, and outputs the plurality of images.

公开(公告)号：US09976905B2

公开(公告)日：2018-05-22

申请号：US15313514

申请日：2015-04-20

Applicant: Konica Minolta, Inc.

Inventor： Yosuke Takebe ,  Yoshihisa Abe

IPC: G01N21/00 ,  G01J3/50 ,  G01N21/57 ,  G01N21/27

CPC classification number: G01J3/50 ,  G01N21/251 ,  G01N21/255 ,  G01N21/27 ,  G01N21/57 ,  G01N2021/556

Abstract: Since both gloss and a reflection characteristic are measured by one surface characteristic measurement device, a gloss measurement target area and a reflection characteristic measurement target area are appropriately set. A gloss measurement instrument and a color measurement instrument are integrated with a gloss colorimeter. The gloss measurement instrument illuminates an illumination target face by illumination light, receives reflected light generated by a regular reflection of the illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the gloss measurement target area can be changed. The color measurement instrument illuminates the illumination target face by annular illumination light, receives reflected light generated by a reflection of the annular illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the reflection characteristic measurement target area can be changed.

公开(公告)号：US20170261439A1

公开(公告)日：2017-09-14

申请号：US15506613

申请日：2015-07-21

Applicant: Konica Minolta, Inc.

Inventor： Takafumi Komatsu ,  Yoshihisa Abe ,  Wataru Yamaguchi ,  Yosuke Takebe

IPC: G01N21/95

CPC classification number: G01N21/95 ,  G01N21/8806

Abstract: A surface inspection device includes an opening defining an aperture plane, one or more optical transceivers, and a processor. Each optical transceiver includes a light emitter and a light receiver that are arranged in different directions with respect to the aperture plane when viewed from above a virtual normal line of the aperture plane. The processor acquires detection values from the optical transceivers and calculates an evaluation value of a degree of variation in the detection values.

公开(公告)号：US20170199079A1

公开(公告)日：2017-07-13

申请号：US15313514

申请日：2015-04-20

Applicant: Konica Minolta, Inc.

Inventor： Yosuke Takebe ,  Yoshihisa Abe

IPC: G01J3/50 ,  G01N21/27 ,  G01N21/57

CPC classification number: G01J3/50 ,  G01N21/251 ,  G01N21/255 ,  G01N21/27 ,  G01N21/57 ,  G01N2021/556

Abstract: Since both gloss and a reflection characteristic are measured by one surface characteristic measurement device, a gloss measurement target area and a reflection characteristic measurement target area are appropriately set. A gloss measurement instrument and a color measurement instrument are integrated with a gloss colorimeter. The gloss measurement instrument illuminates an illumination target face by illumination light, receives reflected light generated by a regular reflection of the illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the gloss measurement target area can be changed. The color measurement instrument illuminates the illumination target face by annular illumination light, receives reflected light generated by a reflection of the annular illumination light on the illumination target face, and outputs a measurement result for the reflected light. A size of the reflection characteristic, measurement target area can be changed.