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公开(公告)号：US20190025440A1
公开(公告)日：2019-01-24
申请号：US15748750
申请日：2016-07-29
Applicant: Koninklijke Philips N.V.
Inventor： Roger STEADMAN BOOKER , Ewald ROESSL
CPC classification number: G01T1/17 , G01J2001/442 , G01T1/247 , G01T1/2928 , H04N5/3456
Abstract: The invention relates a photon counting device and method for counting photon interactions in a piece of converter material and addressing the issue of charge sharing. The occurrence of a charge sharing event is already detected upon the onset of the pulse, taking into consideration an onset of a pulse in a neighboring pixel within a preferably very short coincidence window. According to the invention, it is detected whether a pulse is being processed and one or more neighboring pixels are scouted to decide whether a simultaneous interaction has been registered within a very short coincidence window.
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2.发明申请公开(公告)号：US20180228455A1
公开(公告)日：2018-08-16
申请号：US15312693
申请日：2016-04-25
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Thomas KOEHLER , Ewald ROESSL , Gerhard MARTENS , Heiner DAERR
IPC: A61B6/00 , G01N23/041 , A61B6/03
CPC classification number: A61B6/484 , A61B6/032 , A61B6/4035 , A61B6/405 , A61B6/4241 , A61B6/4291 , A61B6/482 , A61B6/5205 , G01N23/04 , G01N23/041
Abstract: Apparatus and related method for dark-field imaging. The apparatus operates on projective intensities detected at a detector in different energy channels. An energy weighting is used to improve the signal to noise ratio. The model operates in a logarithmic domain.
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公开(公告)号：US20170332984A1
公开(公告)日：2017-11-23
申请号：US15525079
申请日：2015-11-11
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Bernhard Johannes BRENDEL , Roland PROKSA , Thomas KOEHLER , Ewald ROESSL , Heiner DAERR , Michael GRASS , Axel THRAN
Abstract: An imaging system includes a radiation source (108) configured to rotate about an examination region (106)and emit radiation that traverses the examination region. The imaging system further includes an array of radiation sensitive pixels (112) configured to detect radiation traversing the examination region and output a signal indicative of the detected radiation. The array of radiation sensitive pixels is disposed opposite the radiation source, across the examination region. The imaging system further includes a rigid flux filter device (130) disposed in the examination region between the radiation source and the radiation sensitive detector array of photon counting pixels. The rigid flux filter device is configured to filter the radiation traversing the examination region and incident thereon. The radiation leaving the rigid flux filter device has a predetermined flux.
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公开(公告)号：US20170285186A1
公开(公告)日：2017-10-05
申请号：US15114444
申请日：2015-12-09
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Ewald ROESSL , Heiner DAERR
Abstract: The present invention relates to an X-ray detector comprising a directly converting semiconductor layer (60) having a plurality of pixels for converting incident radiation into electrical measurement signals with a band gap energy characteristic of the semiconductor layer, wherein said incident radiation is x-ray radiation emitted by an x-ray source (2) or light emitted by at least one light source (30, 33). Further, an evaluation unit (67) is provided for calculating evaluation signals per pixel or group of pixels from first electrical measurement signals generated per pixel or group of pixels when light from said at least one light source at a first intensity is coupled into the semiconductor layer and second electrical measurement signals generated per pixel or group of pixels when light from said at least one light source at a second intensity is coupled into the semiconductor layer, wherein said evaluation unit is configured to detect per pixel or group of pixels a noise peak in said first and second electrical measurement signals and to determine offset and gain per pixel or group of pixels from the detected noise peaks. A detection unit (69) is provided for determining detection signals from electrical measurement signals generated when x-ray radiation is incident onto the semiconductor layer, and a calibration unit (68) is provided for calibrating the detection unit on the basis of the evaluation signals.
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公开(公告)号：US20160324494A1
公开(公告)日：2016-11-10
申请号：US15104024
申请日：2014-12-16
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Ewald ROESSL , Heiner DAERR , Thomas KOEHLER
CPC classification number: A61B6/4241 , A61B6/032 , A61B6/035 , A61B6/405 , A61B6/482 , A61B6/542 , G01T1/247 , H01J35/06 , H01J35/10 , H01J2235/086 , H05G1/56 , H05G1/60
Abstract: An imaging system (100) includes a radiation source (110) with a focal spot (204) that emits a beam of x-ray photons that traverses an examination region (106). The imaging system further includes a photon counting detector array (122) that detects a sub-set of the x-ray photons that traverse an examination region. The imaging system further includes a controller (116) that generates and transmits a pause signal, in response to a calculated drop in an intensity of the emitted the beam of x-ray photons below a predetermined intensity level, which causes the photon counting detector array to pause detecting the sub-set of the x-ray photons. The imaging system further includes a counter (136) that counts, for each of a plurality of counting periods, the x-ray photons of the sub-set detected by the photon counting detector array in the corresponding counting period.
Abstract translation: 成像系统（100）包括具有发射穿过检查区域（106）的x射线光子束的焦点（204）的辐射源（110）。 成像系统还包括光子计数检测器阵列（122），其检测穿过检查区域的x射线光子的子集。 成像系统还包括控制器（116），其响应于计算出的低于预定强度水平的x射线光子束的发射强度的下降，产生和发送暂停信号，这导致光子计数检测器阵列 暂停检测x射线光子的子集。 成像系统还包括计数器（136），对于多个计数周期中的每个计数周期，计数在相应的计数周期内由光子计数检测器阵列检测的子集的x射线光子。
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Patent Agency Ranking
公开(公告)号：US20190146098A1
公开(公告)日：2019-05-16
申请号：US16300107
申请日：2017-06-07
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Ewald ROESSL , Roger STEADMAN BOOKER
Abstract: The invention relates to a correction device (8) for a radiation detector (2) including detector elements each for detecting incident photons. The correction device (8) is configured to read detection signals representative of an incident photon flux detected by the detector elements for different incident photon fluxes, and an evaluation unit (11) configured to determine for each detector element a dead time of the detector element and a parameter representative of an effective area of the detector element on the basis of a collective evaluation of the detection signals of the respective detector element. Further, the correction device (8) is configured to determine for each detector element correction parameters to compensate for differences in the effective areas and in the dead times of the detector elements on the basis of the determined parameters representative of the effective area and the determined dead times of the detector elements.
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公开(公告)号：US20180214093A1
公开(公告)日：2018-08-02
申请号：US15743304
申请日：2016-07-12
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Gerhard MARTENS , Ewald ROESSL
Abstract: The invention relates to an X-ray imaging apparatus (2), comprising: a source (4) for generating X-ray radiation, an object receiving space (6) for arranging an object of interest for X-ray imaging, an X-ray collimator arrangement (8) arranged between the source (4) and the collimator arrangement (8), and an X-ray mirror arrangement (10). The mirror arrangement (10) comprises for example two tapered mirrors (22) facing each other and adapted for guiding X-ray radiation of the source (4) to the collimator arrangement (8). Consequently, the X-ray intensity at the object receiving space (6) is increased. In order to limit the X-ray radiation to an area, where the X-ray radiation can be utilized form imaging, an angle of spread Θm between the mirrors (22) and a length LM of each mirror (22) is adapted, such that a number of total reflections of X-ray radiation, provided by the source (4), at the mirrors (22) is limited. The limitation provides the effect that an angle of reflection Θr of the totally reflected X-ray radiation is limited. Consequently, an X-ray intensity at the object receiving space (6) is increased while constrains are provided, which prevent a large increase of a width of the X-ray radiation provided at the object receiving space (6), which effectively improves an imaging quality of an object of interest being arrangeable at the object receiving space (6).
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公开(公告)号：US20170322329A1
公开(公告)日：2017-11-09
申请号：US15534528
申请日：2015-12-10
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Ewald ROESSL
Abstract: The present invention relates to determining baseline shift of an electrical signal generated by a photon detector (102) of an X-ray examination device (101). For this purpose, the photon detector comprises a processing unit (103) that is configured to determine a first crossing frequency of a first pulse height threshold by the electrical signal generated by the photon detector. The first pulse height threshold is located at a first edge of a noise peak in the pulse height spectrum of the electrical signal.
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公开(公告)号：US20170196524A1
公开(公告)日：2017-07-13
申请号：US15036521
申请日：2015-09-22
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Thomas KOEHLER , Roland PROKSA , Bernhard Johannes BRENDEL , Ewald ROESSL
CPC classification number: A61B6/4291 , A61B6/032 , A61B6/4241 , A61B6/54 , A61B6/542 , G21K1/025
Abstract: The present invention relates to an imaging apparatus and a corresponding imaging method. To avoid the disadvantages of a pile-up effect in the detection unit, an imaging apparatus is proposed comprising a radiation source (2) for emitting radiation from a focal region (20) through an imaging area (5), a detection unit (6) for detecting radiation from said imaging area (5), said detection unit comprising an anti-scatter grid (62) and a detector (61), a gantry (1) to which said radiation source (2) and said detection unit (6) are mounted and which allows rotation of said radiation source (2) and said detection unit (6) around said imaging area, and a controller (9) for controlling said detection unit (6) to detect radiation at a plurality of projection positions during rotation around said imaging area and for manipulating the position, setting and/or orientation of at least a part of said radiation source (2) and/or said detection unit (6) at first projection positions (80) so that the radiation incident on the detector (61) at said first projection positions is attenuated by anti-scatter grid (62) to a larger extent compared to second projection positions (80) representing the remaining projection positions.
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公开(公告)号：US20150305698A1
公开(公告)日：2015-10-29
申请号：US14647568
申请日：2013-11-28
Applicant: KONINKLIJKE PHILIPS N.V.
Inventor： Tsvi KATCHALSKI , Ewald ROESSL , Reuven LEVINSON
Abstract: An imaging system (500) includes a focal spot (510) that rotates along a path around an examination region (506) and emits radiation. A collimator (512) collimates the radiation, producing a radiation beam (516) that traverses a field of view (520) of the examination region and a subject or object therein. A detector array (522), located opposite the radiation source, across the examination region, detects radiation traversing the field of view and produces a signal indicative of the detected radiation. A beam shaper (524), located between the radiation source and the collimator, rotates in coordination with the focal spot and defines an intensity profile of the radiation beam. The beam shaper includes a plurality of elongate x-ray absorbing elements (606) arranged parallel to each other along a transverse direction with respect to a direction of the beam, separated from each other by a plurality of material free regions (604).
Abstract translation: 成像系统（500）包括沿检查区域（506）周围的路径旋转并发射辐射的焦点（510）。 准直器（512）准直辐射，产生穿过检查区域的视野（520）的辐射束（516）以及其中的被摄体或物体。 跨越检查区域位于辐射源相对的检测器阵列（522）检测穿过视野的辐射，并产生指示检测到的辐射的信号。 位于辐射源和准直仪之间的光束整形器（524）与焦斑协调旋转并且限定辐射束的强度分布。 光束整形器包括多个细长的x射线吸收元件（606），该多个细长x射线吸收元件（606）相对于梁的横向方向彼此平行布置，该多个细长x射线吸收元件彼此间隔开多个材料自由区域（604）。
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