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Patent Agency Ranking
公开(公告)号：US20150293339A1
公开(公告)日：2015-10-15
申请号：US14437508
申请日：2013-10-22
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Christian Schuman , Ralf Krueger , Tobias Bauer , Arnold Mueller-Rentz , Klaus Hermanns , Christian Schulz
CPC classification number: G02B21/06 , F21V33/0068 , F21Y2103/00 , F21Y2105/00 , F21Y2115/15 , F21Y2115/20 , G01N21/31 , G01N2201/061 , G01N2201/0628 , G02B21/088 , G02B21/18
Abstract: An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.
Abstract translation: 用于光学装置，显微镜或宏观显微镜的照明装置包括：第一照明源，被配置为发射经由照明光束路径引导到被布置在物体平面中的被照射物体上的光。 至少一个第二照明源可定位在照明光束路径中，并且是透明的或半透明的以及自发光的。 至少一个第二照明源被配置为允许从第一照明源发射的光至少部分地通过。 具有被照明物体的物体被配置为由第一照明源和至少一个第二照明光源照亮。
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公开(公告)号：US11002978B2
公开(公告)日：2021-05-11
申请号：US15329624
申请日：2015-07-28
Applicant: Leica Microsystems CMS GmbH , Gabriele Petri
Inventor： Peter Euteneuer , Ralf Krueger
Abstract: A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).
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公开(公告)号：US20170212356A1
公开(公告)日：2017-07-27
申请号：US15329624
申请日：2015-07-28
Applicant: Leica Microsystems CMS GmbH
Inventor： Peter Euteneuer , Ralf Krueger
CPC classification number: G02B27/141 , G02B21/0004 , G02B21/0032 , G02B21/082 , G02B21/245
Abstract: A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).
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公开(公告)号：US09772482B2
公开(公告)日：2017-09-26
申请号：US14437508
申请日：2013-10-22
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Christian Schumann , Ralf Krueger , Tobias Bauer , Arnold Mueller-Rentz , Klaus Hermanns , Christian Schulz
IPC: G02B21/06 , G02B21/08 , G02B21/18 , F21V33/00 , G01N21/31 , F21Y103/00 , F21Y105/00 , F21Y115/20 , F21Y115/15
CPC classification number: G02B21/06 , F21V33/0068 , F21Y2103/00 , F21Y2105/00 , F21Y2115/15 , F21Y2115/20 , G01N21/31 , G01N2201/061 , G01N2201/0628 , G02B21/088 , G02B21/18
Abstract: An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.
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公开(公告)号：US09671601B2
公开(公告)日：2017-06-06
申请号：US13962136
申请日：2013-08-08
Applicant: Leica Microsystems CMS GmbH
Inventor： Ralf Krueger , Tobias Bauer
CPC classification number: G02B21/06 , G02B21/006 , G02B21/242 , G02B21/244 , G02B21/245 , G03B13/36 , G03F9/7026
Abstract: A method for autofocusing in microscopic examination of a specimen located at the focus of a microscope objective uses an autofocus beam path, the autofocus beam path being directed, via a deflection device arranged on the side of the microscope objective facing away from the specimen, toward the microscope objective, and from there onto a reflective autofocus interface in the specimen region. The autofocus beam path is reflected at the autofocus interface and directed via the microscope objective and the deflection device toward an autofocus detector. The deflection device comprises two regions spaced apart from one another in a propagation direction of the autofocus beam path. Each region reflects the autofocus beam path. The autofocus detector is arranged in a plane conjugated with the microscope objective pupil to acquire an interference pattern. The focus of the microscope is adjusted as a function of the acquired interference pattern.
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