公开(公告)号：US20220125301A1

公开(公告)日：2022-04-28

申请号：US17424056

申请日：2020-03-19

Applicant: Leica Microsystems Inc.

Inventor： Robert H. Hart ,  Dorothy M. Branco ,  Eric L. Buckland ,  Micaela R. Mendlow

IPC: A61B3/10 ,  A61B3/00 ,  G06T7/33

Abstract: Systems for determining an apex of curvature In an image, obtained from, a sample are provided. The systems include—an imaging system configured to obtain a plurality of scans of a sample using a radial pattern; and a processor associated with the imaging system. The processor is configured to segment and curve fit each of the plurality of scans to a surface of the sample; determine an apex. for each curve associated with each of the plurality of scans; determine a true apex, among all determined apexes using a derivative of least value; calculate an XY offset based on the determined true apex; map the true apex to an origin where X and Y are equal to zero; and adjust the coordinates associated with remaining apexes not determined to be the true apex based on the calculated offset.