MINIATURIZED WAVEGUIDE IMAGING SPECTROMETER
    1.
    发明申请

    公开(公告)号:US20190219445A1

    公开(公告)日:2019-07-18

    申请号:US16317941

    申请日:2017-07-05

    CPC classification number: G01J3/0259 G01J3/02 G01J3/2803 G01J3/4531 G02B6/4291

    Abstract: A waveguide spectrometer includes at least one substrate layer with at least one waveguide. Each waveguide extends from an inlet face proceeding partly through the substrate layer to a reflecting element. A multiplicity of photo detectors is arranged on a front side of the substrate layer, while the photo detectors are electrically connected to an electronic read out system. The spectrometer can be made lightweight and easier to produce by forming the waveguides as surface waveguides, each showing a longitudinal opening with a width to the front side of the substrate layer between the inlet face and the reflecting element. The photo detectors are in print distributed at the front side on top of the substrate layer at least partly overlapping the longitudinal opening along an overall length of sampled region and the electrical connection of the photo detectors with the electronic read out system is achieved by a multiplicity of printed electrical conductors.

    WAVEGUIDE SPECTROMETER TO CARRY OUT THE INTEGRATED INTERFEROGRAM SCANNING

    公开(公告)号:US20200278248A1

    公开(公告)日:2020-09-03

    申请号:US16317969

    申请日:2017-07-04

    Abstract: A waveguide spectrometer includes at least one substrate layer with at least one surface waveguide extending from an inlet face to guide the received light; at least one evanescent field sampler in the waveguide to out-couple light along the waveguide; at least one light sensing unit to detect the out-coupled light, each electrically connected to an electronic read out system; and means to achieve counter propagating optical signals inside the waveguide to obtain interference between the counter propagating optical signals generating an interference pattern along the waveguide. A compact and simple construction with improved spectral range/bandwidth of the spectrometer can be achieved with at least one modulator integrated into the sampling waveguide structure to enable conditioning of the guided optical signals and for changing the refractive index. The integrated modulator is realized by electrodes placed aside directly neighboured to the guiding core resp. waveguide generating an optical phases shift required for scanning the interferogram.

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