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公开(公告)号：US20240264460A1
公开(公告)日：2024-08-08
申请号：US18289878
申请日：2022-05-09
Applicant: THE REGENTS OF THE UNIVERSITY OF COLORADO, A BODY CORPORATE , TRUSTEES OF BOSTON UNIVERSITY
Inventor： Kelvin Wagner , Nathan Dostart , Michael P. Brand , Milos Popovic , Bohan Zhang
CPC classification number: G02B27/4272 , G01J3/0259 , G01J3/1804 , G01J3/2803 , G02B5/188
Abstract: A serpentine integrated grating spectrometer includes a serpentine delay line and a plurality of grating couplers. The serpentine delay line includes a plurality of parallel waveguide segments that are coplanar in a delay-line plane. The serpentine delay line serially connects each of the plurality of grating couplers. Each of the plurality of grating couplers (i) is located at a respective one of the plurality of parallel waveguide segments, and (ii) direct light propagating in the serpentine delay line out of the delay-line plane. The plurality of waveguide segments is M in number and impart a total group delay time ry on light propagating therethrough. Each of the plurality of grating couplers impart a grating coupler delay tx on light propagating therethrough that exceeds (ty/M), the time delay for a single segment of the M parallel segments.
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公开(公告)号：US20190219445A1
公开(公告)日：2019-07-18
申请号：US16317941
申请日：2017-07-05
Inventor： Mohammadreza MADI , Edoardo ALBERTI , Ivan SHORUBALKO
CPC classification number: G01J3/0259 , G01J3/02 , G01J3/2803 , G01J3/4531 , G02B6/4291
Abstract: A waveguide spectrometer includes at least one substrate layer with at least one waveguide. Each waveguide extends from an inlet face proceeding partly through the substrate layer to a reflecting element. A multiplicity of photo detectors is arranged on a front side of the substrate layer, while the photo detectors are electrically connected to an electronic read out system. The spectrometer can be made lightweight and easier to produce by forming the waveguides as surface waveguides, each showing a longitudinal opening with a width to the front side of the substrate layer between the inlet face and the reflecting element. The photo detectors are in print distributed at the front side on top of the substrate layer at least partly overlapping the longitudinal opening along an overall length of sampled region and the electrical connection of the photo detectors with the electronic read out system is achieved by a multiplicity of printed electrical conductors.
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公开(公告)号：US20180249555A1
公开(公告)日：2018-08-30
申请号：US15902227
申请日：2018-02-22
Applicant: Fujitsu Optical Components Limited
Inventor： Masaki Sugiyama
IPC: H05B37/02
CPC classification number: H05B37/0227 , G01J3/0259 , G02B6/00 , H01S5/00 , H01S5/0265 , H01S5/0612 , H01S5/0687 , H01S5/1032 , H01S5/142
Abstract: A wavelength tunable light source has a light source, a wavelength monitor circuit that receives a portion of light emitted from the light source, and a processor that controls a wavelength of the light emitted from the light source based upon an output value of the wavelength monitor circuit, wherein the wavelength monitor circuit has a wavelength filter that outputs four light components with optical phases shifted by 90 degrees from one another and multiple photo detectors that detects the four light components output from the wavelength filter, and wherein the processor selects at least one of the four light components, calculates a ratio of a monitor value of the selected light component to a total sum of monitor values of the four light components, and adjusts the wavelength of the light source so as to bring the ratio to be closer to a target ratio at a designated wavelength.
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公开(公告)号：US10060791B2
公开(公告)日：2018-08-28
申请号：US15623961
申请日：2017-06-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Diaa Abdel Maged Khalil , Mostafa Medhat , Hisham Haddara , Bassam Saadany , Khaled Hassan
CPC classification number: G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/0256 , G01J3/0259 , G01J3/0291 , G01J3/26 , G01J3/45 , G01J3/4532
Abstract: Aspects of the disclosure relate to an integrated spectral unit including a micro-electro-mechanical systems (MEMS) interferometer fabricated within a first substrate and a light redirecting structure integrated on a second substrate, where the second substrate is coupled to the first substrate. The light redirecting structure includes at least one mirror for receiving an input light beam propagating in an out-of-plane direction with respect to the first substrate and redirecting the input light beam to an in-plane direction with respect to the first substrate towards the MEMS interferometer.
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公开(公告)号：US09964440B2
公开(公告)日：2018-05-08
申请号：US14860598
申请日：2015-09-21
Applicant: KLA Tencor Corporation
Inventor： Earl M. Jensen , Mei H. Sun , Kevin O'Brien
IPC: H01L27/142 , G01J3/02 , G01J1/58 , G01J3/36 , G01J3/12
CPC classification number: G01J3/0259 , G01J1/58 , G01J3/0205 , G01J3/021 , G01J3/0256 , G01J3/0262 , G01J3/36 , G01J2003/1213
Abstract: A sensor apparatus has a substrate and a spectrally selective detection system, and a cover. The spectrally sensitive detection system is sandwiched between the substrate and the cover. The spectrally selective detection system includes a generally laminar array of wavelength selectors optically coupled to a corresponding array of optical detectors located within the substrate. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.
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Patent Agency Ranking
公开(公告)号：US20180090531A1
公开(公告)日：2018-03-29
申请号：US15823842
申请日：2017-11-28
Applicant: Sony Corporation
Inventor： Sozo Yokogawa
IPC: H01L27/146 , H04N5/374 , G01J3/02
CPC classification number: H01L27/14621 , G01J3/0259 , G01J3/027 , G01J3/12 , G01J3/18 , G01J3/2803 , G01J3/2823 , G01J2003/1213 , G01J2003/2806 , G01J2003/2816 , G01J2003/282 , G01J2003/2826 , G02B5/008 , G02B5/201 , H01L27/14629 , H04N5/332 , H04N5/374 , H04N5/378 , H04N9/07
Abstract: A solid-state image sensor and an imaging system with a two-dimensional pixel array, and a plurality of types of filters that are arranged facing a pixel region of the two-dimensional pixel array, the filters each including a spectrum function and a periodic fine pattern shorter than a wavelength to be detected, wherein each of the filters forms a unit which is larger than the photoelectric conversion device of each pixel on the two-dimensional pixel array, where one type of filter is arranged for a plurality of adjacent photoelectric conversion device groups, wherein the plurality of types of filters are arranged for adjacent unit groups to form a filter bank, and wherein the filter banks are arranged in a unit of N×M, where N and M are integers of one or more, facing the pixel region of the two-dimensional pixel array.
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公开(公告)号：US09929206B2
公开(公告)日：2018-03-27
申请号：US15191412
申请日：2016-06-23
Applicant: IMEC VZW
Inventor： Bart Vereecke , Deniz Sabuncuoglu Tezcan , Philippe Soussan , Nicolaas Tack
CPC classification number: H01L27/14685 , G01J3/0259 , G01J3/50 , G01J3/513 , G01J2003/1226 , H01L27/1461 , H01L27/14623 , H01L27/14625 , H01L27/14629 , H01L27/14643
Abstract: An integrated circuit for an imaging device including an array of photo-sensitive areas is disclosed. In one aspect the integrated circuit includes a first multi-layer structure and a second multi-layer structure arranged over a first and a second photo-sensitive area, respectively. The second multi-layer structures each have a bottom and a top reflective structure and a spacer layer arranged therebetween. The spacer layer has a thickness such that the multi-layer structure selectively transmits a narrow range of wavelengths of electro-magnetic radiation. The bottom and top reflective structures include a stack of alternating layers of a first and a second material. Thickness and/or material of the alternating layers of the first multi-layer structure differ from thickness and/or material of the alternating layers of the second multi-layer structure.
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公开(公告)号：US09903758B2
公开(公告)日：2018-02-27
申请号：US15606298
申请日：2017-05-26
Applicant: Junichi Azumi , Hidetaka Noguchi , Hidenori Kato , Masashi Suematsu , Masayuki Fujishima
Inventor： Junichi Azumi , Hidetaka Noguchi , Hidenori Kato , Masashi Suematsu , Masayuki Fujishima
CPC classification number: G01J3/18 , G01J3/021 , G01J3/0256 , G01J3/0259 , G01J3/0264 , G01J3/06 , G01J3/28
Abstract: A spectral measurement device includes a light reflection grating having a plurality of movable gratings and a movable grating drive unit that displaces the movable gratings to alter a grating pattern of the light reflection grating, a light detecting element that detects light incident on the light reflection grating, a storage unit storing a relationship between a light quantity to be detected by the light detecting element and corresponding light intensities at differing wavelengths for different grating patterns, and a computation unit that calculates light intensities at the differing wavelengths of the light incident on the light reflection grating based on the light quantity of the incident light detected by the light detecting element for each of the different grating patterns by altering the grating pattern based on the relationship between the light quantity and the corresponding light intensities for the different grating patterns stored in the storage unit.
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公开(公告)号：US20180045562A1
公开(公告)日：2018-02-15
申请号：US15546917
申请日：2015-04-30
Applicant: Hewlett-Packard Development Company, L.P.
Inventor： Charles M. Santori , Alexander Govyadinov
CPC classification number: G01J3/0218 , B01L3/502715 , B01L3/50273 , B01L2300/0654 , B01L2400/0442 , G01J3/0259 , G01N15/1436 , G01N15/1459 , G01N15/1484 , G01N21/05 , G01N21/648 , G01N2021/6482 , G02B6/00
Abstract: Provided in one example is an apparatus, including a microfluidic channel supported by a substrate. An optical spectrometer includes a waveguide supported by the substrate. The waveguide includes a coupler and outcouplers. A light source directs light to the coupler of the waveguide. Optical sensors are supported by the substrate. Each of the optical sensors is optically coupled to one of the outcouplers.
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公开(公告)号：US20180024001A1
公开(公告)日：2018-01-25
申请号：US15706440
申请日：2017-09-15
Applicant: STC.UNM
Inventor： Steven R.J. BRUECK , Alexander NEUMANN , Payman ZARKESH-HA
IPC: G01J1/06 , G01J3/18 , G01J1/44 , H01L27/144 , H01L31/0232 , H01L31/02 , H01L31/0216 , G02B6/122 , G02B6/12 , G02B6/124 , G01J3/28 , H01L31/103
CPC classification number: G01J1/06 , G01J1/44 , G01J3/0218 , G01J3/0259 , G01J3/18 , G01J3/1895 , G01J3/2803 , G01J2001/448 , G02B6/12004 , G02B6/122 , G02B6/124 , G02B2006/12061 , G02B2006/12107 , G02B2006/12138 , H01L27/1446 , H01L31/02019 , H01L31/02164 , H01L31/02327 , H01L31/103
Abstract: A 2-D sensor array includes a semiconductor substrate and a plurality of pixels disposed on the semiconductor substrate. Each pixel includes a coupling region and a junction region, and a slab waveguide structure disposed on the semiconductor substrate and extending from the coupling region to the region. The slab waveguide includes a confinement layer disposed between a first cladding layer and a second cladding layer. The first cladding and the second cladding each have a refractive index that is lower than a refractive index of the confinement layer. Each pixel also includes a coupling structure disposed in the coupling region and within the slab waveguide. The coupling structure includes two materials having different indices of refraction arranged as a grating defined by a grating period. The junction region comprises a p-n junction in communication with electrical contacts for biasing and collection of carriers resulting from absorption of incident radiation.
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