公开(公告)号：US20240329083A1

公开(公告)日：2024-10-03

申请号：US18592773

申请日：2024-03-01

Applicant: MPI CORPORATION

Inventor： CHIA-NAN CHOU ,  Chung-Yen Huang ,  Wen-Chin Yang ,  Wen-Hung LO ,  Wei-Lwen Yeh ,  Chih-Hao Ho

IPC: G01R1/067 ,  G01R1/073

CPC classification number: G01R1/06772 ,  G01R1/0675 ,  G01R1/07314

Abstract: A position-adjustable probing device comprises a stationary probe comprising a first coaxial structure having a first needle core, a first dielectric layer, and a first exterior conductive layer, and a first and a second movable probes. The first movable probe arranged at a first side of the stationary probe comprises a ground needle core, and a first extending structure comprising a first planar structure electrically contacted with the stationary probe through a first movement, a first top surface and a first bottom surface. The second movable probe arranged at a second side of the stationary needle comprises a second coaxial structure comprising a second needle core, a second dielectric layer, and a second exterior conductive layer, and a second extending structure comprising a second planar structure electrically contacted with the stationary probe through a second movement, a second top surface, and a second bottom surface.

公开(公告)号：US20210311095A1

公开(公告)日：2021-10-07

申请号：US17221368

申请日：2021-04-02

Applicant: MPI Corporation

Inventor： Chung-Yen Huang ,  Chih-Wei Wen ,  Sheng-Feng Xu ,  Fuh-Chyun Tang ,  Chih-Hao Ho

IPC: G01R1/073

Abstract: A probe card and a probe module thereof are provided. The probe card includes a first strengthening board, a fixed frame, a probe module, and a slidable frame. The first strengthening board includes a top surface, a bottom surface, and a mounting hole. An inner wall of the mounting hole is formed with an inner flange. The fixed frame is disposed on the top surface of the first strengthening board and surrounds the mounting hole. The probe module is disposed in the mounting hole and includes an outer flange including a physical region and multiple gap regions. The physical region abuts against the inner flange of the first strengthening board. The slidable frame is disposed on an inner wall of the fixed frame and is slidable between a released position and a fixed position. Multiple pressing portions are disposed on an inner wall of the slidable frame.

公开(公告)号：US11585832B2

公开(公告)日：2023-02-21

申请号：US17221368

申请日：2021-04-02

Applicant: MPI Corporation

Inventor： Chung-Yen Huang ,  Chih-Wei Wen ,  Sheng-Feng Xu ,  Fuh-Chyun Tang ,  Chih-Hao Ho

IPC: G01R1/073

Abstract: A probe card and a probe module thereof are provided. The probe card includes a first strengthening board, a fixed frame, a probe module, and a slidable frame. The first strengthening board includes a top surface, a bottom surface, and a mounting hole. An inner wall of the mounting hole is formed with an inner flange. The fixed frame is disposed on the top surface of the first strengthening board and surrounds the mounting hole. The probe module is disposed in the mounting hole and includes an outer flange including a physical region and multiple gap regions. The physical region abuts against the inner flange of the first strengthening board. The slidable frame is disposed on an inner wall of the fixed frame and is slidable between a released position and a fixed position. Multiple pressing portions are disposed on an inner wall of the slidable frame.

公开(公告)号：US11460498B2

公开(公告)日：2022-10-04

申请号：US17034741

申请日：2020-09-28

Applicant: MPI CORPORATION

Inventor： Yang-Hung Cheng ,  Ya-Hung Lo ,  Chien-Hsun Chen ,  Chia-Nan Chou ,  Chung-Yen Huang ,  Shou-Jen Tsai ,  Fuh-Chyun Tang

IPC: G01R31/28 ,  G01R1/073

Abstract: An adjustable probe device includes fixed and movable probes, at least one of which is a signal probe having a coaxial structure. The movable probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. Another adjustable probe device includes a first movable probe for being grounded, and fixed and second movable probes both having a coaxial structure. Any of the two movable probes is selectable to be a functioning probe in a way that the contact ends of the functioning and fixed probes are located on a same plane for contacting two pads of a DUT at the same time, and the functioning probe is linearly slidable with a ground unit thereof abutted against a ground unit of the fixed probe. As a result, the probe interval is adjustable, lowering the cost of the impedance testing apparatus for circuit boards.