PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME AND TESTED DEVICE

    公开(公告)号:US20250147067A1

    公开(公告)日:2025-05-08

    申请号:US18938623

    申请日:2024-11-06

    Abstract: A probe system for double side probing includes a chuck having a through hole for a substrate including a DUT to be disposed on the chuck and defined with an edge part supported by the chuck and a central part located correspondingly to the through hole, upper and lower probe devices, including electrical and optical probe devices, disposed above and below the through hole respectively for testing the DUT on top and bottom sides of the substrate, and a support device disposed on the side of the chuck opposite to the electrical probe device. When an electrical probe of the electrical probe device contacts the top or bottom side of the substrate, a supporter of the support device contacts the other side and is located adjacent to the electrical probe with the substrate located therebetween to resist the force from the electrical probe to avoid substrate deformation.

    OPTICAL PATH CORRECTION SUBASSEMBLY, OPTICAL DETECTION ASSEMBLY, AND OPTICAL DETECTION SYSTEM

    公开(公告)号:US20230147804A1

    公开(公告)日:2023-05-11

    申请号:US17979748

    申请日:2022-11-02

    CPC classification number: G01N15/0205 G11B7/135 H01S5/005

    Abstract: An optical path correction subassembly, an optical detection assembly, and an optical detection system are provided. The optical path correction subassembly can be optionally configured to be applied to a light detector. The optical path correction subassembly includes a holder structure and an optical path correction structure carried by the holder structure, and the optical path correction structure has a light beam guiding surface arranged as a reverse inclination inclined relative to a vertical line. The light beam guiding surface of the optical path correction structure can be configured to effectively or accurately guide a predetermined light beam to a light receiving surface of the light detector so as to facilitate collection of the predetermined light beam. The light beam guiding surface of the optical path correction structure can be arranged at an acute angle relative to the light receiving surface of the light detector.

Patent Agency Ranking