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Patent Agency Ranking
1.发明申请公开(公告)号：US20150044463A1
公开(公告)日：2015-02-12
申请号：US14210359
申请日：2014-03-13
Applicant: University of Central Florida Research Foundation, , Massachusetts Institute of Technology
Inventor： Yoel Fink , Ayman F. Abouraddy , Silvija Gradecak , Benjamin Jean-Baptiste Grena , Alexander Gumennik , Xiaoting Jia , John D. Joannopoulos , Steven G. Johnson , Guillame R. Lestoquoy , Xiangdong Liang , Paul H. Rekemeyer , Matthew J. Smith , Alexander M. Stolyarov , Lei Wei
CPC classification number: B29B9/10 , B22F9/04 , B22F2009/045 , B29C55/005 , B29K2105/162 , B29K2995/0005 , B29K2995/0041 , B29L2009/00 , B29L2031/731 , C01B33/02 , C04B35/62849 , D01D5/34 , D01F9/08 , Y10T428/2927 , Y10T428/2933 , Y10T428/296 , Y10T428/2982 , Y10T428/2991
Abstract: A fiber is provided that has been thermally drawn from a fiber preform, having a longitudinal-axis length and including at least one core that has a longitudinal core axis parallel to the longitudinal axis and internally disposed to at least one outer fiber cladding material layer along the fiber length. The fiber is fed through a localized heating site having a heating site temperature, T, that is above a melting temperature of the fiber core, with a feed speed, υf, that melts a portion of the fiber core at the heating site, causing molten droplets to pinch off of fiber core material, one droplet at a time, with a time period of molten droplet formation set by the fiber feed speed, υf. The fiber is fed through the localized heating site to move the molten droplets out of the heating site and solidify the molten droplets into solid in-fiber particles.
Abstract translation: 提供了一种已经从纤维预成型件热拉伸的纤维，其具有纵轴长度并且包括至少一个具有纵向轴线平行于纵向轴线的芯部，并且内部设置在至少一个外部纤维包层材料层上 纤维长度。 纤维通过局部加热部位进料，该加热部位的加热部位温度T高于纤维芯的熔融温度，进料速度在熔融部分的纤维芯处熔化。 液滴夹住纤维芯材料，一次一滴，熔融液滴形成时间由纤维进料速度设定。 纤维通过局部加热部位进料，将熔融液滴移出加热部位，并将熔融液固化成固体纤维颗粒。
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公开(公告)号：US10605662B2
公开(公告)日：2020-03-31
申请号：US16279181
申请日：2019-02-19
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US20190250038A1
公开(公告)日：2019-08-15
申请号：US16279181
申请日：2019-02-19
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
CPC classification number: G01J3/433 , G01J3/108 , G01J3/2823 , G01J3/447 , G01N21/1717 , G01N21/636 , G01N2021/1725
Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US10228284B2
公开(公告)日：2019-03-12
申请号：US15186682
申请日：2016-06-20
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US20170211977A1
公开(公告)日：2017-07-27
申请号：US15186682
申请日：2016-06-20
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
CPC classification number: G01J3/433 , G01J3/108 , G01J3/2823 , G01J3/447 , G01N21/1717 , G01N21/636 , G01N2021/1725
Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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