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公开(公告)号：US10605662B2
公开(公告)日：2020-03-31
申请号：US16279181
申请日：2019-02-19
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US20190250038A1
公开(公告)日：2019-08-15
申请号：US16279181
申请日：2019-02-19
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
CPC classification number: G01J3/433 , G01J3/108 , G01J3/2823 , G01J3/447 , G01N21/1717 , G01N21/636 , G01N2021/1725
Abstract: A device, and corresponding method, can include a pump light source configured to irradiate a target specimen. The device can also include a sensor configured to observe a probe speckle pattern based on light from a probe light source reflected from the target specimen. The device further may include a correlator configured to determine a material property of the target specimen by analyzing changes in images of the probe speckle pattern as a function of the irradiation with the pump light source. Advantages of the device and method can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US10228284B2
公开(公告)日：2019-03-12
申请号：US15186682
申请日：2016-06-20
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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公开(公告)号：US20170211977A1
公开(公告)日：2017-07-27
申请号：US15186682
申请日：2016-06-20
Applicant: Massachusetts Institute of Technology
Inventor： Thomas H. Jeys , William D. Herzog , Brian G. Saar , Alexander M. Stolyarov , Ryan Sullenberger , David Crompton , Shawn Michael Redmond
CPC classification number: G01J3/433 , G01J3/108 , G01J3/2823 , G01J3/447 , G01N21/1717 , G01N21/636 , G01N2021/1725
Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.
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