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1.
公开(公告)号:US20240136391A1
公开(公告)日:2024-04-25
申请号:US18047978
申请日:2022-10-18
Applicant: Micron Technology, Inc.
Inventor: Sanket S. Kelkar , Michael Mutch , Luca Fumagalli , Hisham Abdussamad Abbas , Brenda D. Kraus , Dojun Kim , Christopher W. Petz , Darwin Franseda Fan
IPC: H01L49/02 , H01G4/008 , H01G4/12 , H01L27/108
CPC classification number: H01L28/75 , H01G4/008 , H01G4/1218 , H01L27/10814 , H01L27/10852
Abstract: A microelectronic device comprises an access device comprising a source region and a drain region spaced from the source region, an insulative material vertically adjacent to the access device, and a capacitor within the insulative material and in electrical communication with the access device. The capacitor comprises a material comprising silicon oxynitride or titanium silicon nitride over surfaces of the insulative material, a first electrode comprising titanium nitride on the material, a dielectric material over the first electrode, and a second electrode on the dielectric material. Related methods of forming the microelectronic device and an electronic system including the microelectronic devices are also described.
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2.
公开(公告)号:US20240234482A9
公开(公告)日:2024-07-11
申请号:US18047978
申请日:2022-10-19
Applicant: Micron Technology, Inc.
Inventor: Sanket S. Kelkar , Michael Mutch , Luca Fumagalli , Hisham Abdussamad Abbas , Brenda D. Kraus , Dojun Kim , Christopher W. Petz , Darwin Franseda Fan
IPC: H01L49/02 , H01G4/008 , H01G4/12 , H01L27/108
CPC classification number: H01L28/75 , H01G4/008 , H01G4/1218 , H01L27/10814 , H01L27/10852
Abstract: A microelectronic device comprises an access device comprising a source region and a drain region spaced from the source region, an insulative material vertically adjacent to the access device, and a capacitor within the insulative material and in electrical communication with the access device. The capacitor comprises a material comprising silicon oxynitride or titanium silicon nitride over surfaces of the insulative material, a first electrode comprising titanium nitride on the material, a dielectric material over the first electrode, and a second electrode on the dielectric material. Related methods of forming the microelectronic device and an electronic system including the microelectronic devices are also described.
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