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公开(公告)号:US10509722B2
公开(公告)日:2019-12-17
申请号:US15693178
申请日:2017-08-31
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: select a garbage collection (GC) source block storing valid data, calculate a valid data measure for the GC source block for representing an amount of the valid data within the GC source block, and designate a storage mode for an available memory block based on the valid data measure, wherein the storage mode is for controlling a number of bits stored per each of the memory cells for subsequent or upcoming data writes.
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公开(公告)号:US12216573B2
公开(公告)日:2025-02-04
申请号:US18395363
申请日:2023-12-22
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: designate a storage mode for a target set of memory cells based on valid data in a source block, wherein the target set of memory cells are configured with a capacity to store up to a maximum number of bits per cell, and the storage mode is for dynamically configuring the target set of memory cells in as cache memory that stores a number of bits less per cell than the corresponding maximum capacity.
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公开(公告)号:US11593261B2
公开(公告)日:2023-02-28
申请号:US17374906
申请日:2021-07-13
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: designate a storage mode for a target set of memory cells based on valid data in a source block, wherein the target set of memory cells are configured with a capacity to store up to a maximum number of bits per cell, and the storage mode is for dynamically configuring the target set of memory cells in as cache memory that stores a number of bits less per cell than the corresponding maximum capacity.
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公开(公告)号:US20220068422A1
公开(公告)日:2022-03-03
申请号:US17521785
申请日:2021-11-08
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Sampath K. Ratnam , Scott A. Stoller , Preston A. Thomson , Kevin R. Brandt , Marc S. Hamilton , Christopher S. Hale
Abstract: A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device further designates the block as a quarantined block, performs a stress test on the block, and depending on whether the stress test on the block satisfies a testing criterion, either designates the block as usable by the memory component or retires the block of the memory component.
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公开(公告)号:US20250156319A1
公开(公告)日:2025-05-15
申请号:US19026306
申请日:2025-01-16
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: designate a storage mode for a target set of memory cells based on valid data in a source block, wherein the target set of memory cells are configured with a capacity to store up to a maximum number of bits per cell, and the storage mode is for dynamically configuring the target set of memory cells in as cache memory that stores a number of bits less per cell than the corresponding maximum capacity.
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公开(公告)号:US20230195615A1
公开(公告)日:2023-06-22
申请号:US18172205
申请日:2023-02-21
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
IPC: G06F12/02 , G06F12/0891 , G06F3/06 , G06F12/06 , G06F12/00
CPC classification number: G06F12/0253 , G06F12/0891 , G06F3/0689 , G06F12/0646 , G06F12/00 , G06F3/0629 , G06F3/0688 , G06F3/0634 , G06F3/064 , G11C11/5621
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: designate a storage mode for a target set of memory cells based on valid data in a source block, wherein the target set of memory cells are configured with a capacity to store up to a maximum number of bits per cell, and the storage mode is for dynamically configuring the target set of memory cells in as cache memory that stores a number of bits less per cell than the corresponding maximum capacity.
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公开(公告)号:US11093385B2
公开(公告)日:2021-08-17
申请号:US16697724
申请日:2019-11-27
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: select a garbage collection (GC) source block storing valid data, and designate a storage mode for an available memory block based on the valid data, wherein the storage mode is for configuring memory cells in the available memory block as cache memory that stores a number of bits less than maximum storage capacities thereof for subsequent or upcoming data writes.
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公开(公告)号:US11093164B2
公开(公告)日:2021-08-17
申请号:US16552750
申请日:2019-08-27
Applicant: Micron Technology, Inc.
Inventor: Daniel J. Hubbard , Marc S. Hamilton , Kevin R. Brandt , William Akin
Abstract: A memory component includes multiple fuses, a memory array having a multiple blocks, and control logic operatively coupled with the memory array and the plurality of fuses. The control logic is to receive an erase command associated with the memory array and attempt to erase, in response to receipt of the erase command, a block of the multiple blocks from the memory array. The control logic is further to detect a failure to completely erase the block. The control logic is further to receive a blow fuse command in response to the failure to completely erase the block. The control logic is to blow a fuse, of the multiple fuses, which is coupled with the block, to make the block of the multiple blocks inaccessible to the control logic.
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公开(公告)号:US20240126690A1
公开(公告)日:2024-04-18
申请号:US18395363
申请日:2023-12-22
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Peter Feeley , Ashutosh Malshe , Daniel J. Hubbard , Christopher S. Hale , Kevin R. Brandt , Sampath K. Ratnam , Yun Li , Marc S. Hamilton
IPC: G06F12/02 , G06F3/06 , G06F12/00 , G06F12/06 , G06F12/0891
CPC classification number: G06F12/0253 , G06F3/0629 , G06F3/0634 , G06F3/064 , G06F3/0688 , G06F3/0689 , G06F12/00 , G06F12/0646 , G06F12/0891 , G11C11/5621
Abstract: A memory system includes a memory array having a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: designate a storage mode for a target set of memory cells based on valid data in a source block, wherein the target set of memory cells are configured with a capacity to store up to a maximum number of bits per cell, and the storage mode is for dynamically configuring the target set of memory cells in as cache memory that stores a number of bits less per cell than the corresponding maximum capacity.
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公开(公告)号:US11688483B2
公开(公告)日:2023-06-27
申请号:US17521785
申请日:2021-11-08
Applicant: Micron Technology, Inc.
Inventor: Kishore Kumar Muchherla , Sampath K. Ratnam , Scott A. Stoller , Preston A. Thomson , Kevin R. Brandt , Marc S. Hamilton , Christopher S. Hale
Abstract: A processing device in a memory system detects a data loss occurrence in a block of a memory component. The processing device further designates the block as a quarantined block, performs a stress test on the block, and depending on whether the stress test on the block satisfies a testing criterion, either designates the block as usable by the memory component or retires the block of the memory component.
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