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公开(公告)号:US12217794B2
公开(公告)日:2025-02-04
申请号:US18425619
申请日:2024-01-29
Applicant: Micron Technology, Inc.
Inventor: Murong Lang , Zhenming Zhou , Jian Huang , Tingjun Xie , Jiangli Zhu , Nagendra Prasad Ganesh Rao , Sead Zildzic
IPC: G11C11/56
Abstract: A difference between a recorded time stamp for a first set of memory cells comprised by an open translation unit (TU) of memory cells and a current time stamp for the open TU is determined, wherein the first set of memory cells comprises a most recently programmed set of memory cells. It is determined, based on a current temperature for the open TU and the difference between the recorded time stamp and the current time stamp, that a second set of memory cells comprised by the open TU is in a coarse programming state. A programming operation is performed on the second set of memory cells using a reduced programming state verify level and a reduced programming state gate step size associated with the second set of memory cells.
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公开(公告)号:US20250006269A1
公开(公告)日:2025-01-02
申请号:US18647554
申请日:2024-04-26
Applicant: Micron Technology, Inc.
Inventor: Yu-Chung Lien , Zhenming Zhou , Shyam Sunder Raghunathan , Tingjun Xie
Abstract: A processing device, operatively coupled with a memory device, receives a request to perform a programming operation on a first set of a block addressable by a first wordline of a first die of the memory device, wherein the first die comprises a plurality of decks of the memory device. The processing device identifies, based on a predefined usage type associated with the first die, a deck of the plurality of decks for performing the programming operation; and performing the programming operation on a second set of cells of the block addressable by the first wordline residing on the identified deck of the first die.
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公开(公告)号:US20240393969A1
公开(公告)日:2024-11-28
申请号:US18662952
申请日:2024-05-13
Applicant: Micron Technology, Inc.
Inventor: Fanqi Wu , Kevin R. Brandt , Zhenlei Shen , Tingjun Xie , Yang Liu , Jiangli Zhu
IPC: G06F3/06
Abstract: A processing device in a memory sub-system determines a total power-off time of a memory sub-system and identifies a configurable power-off time threshold for the memory sub-system. The processing device determines whether the total power-off time satisfies a threshold criterion based on the configurable power-off time threshold, responsive to determining that the total power-off time satisfies the threshold criterion, causes the memory sub-system to enter a relaxed block retirement mode of operation.
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公开(公告)号:US11966591B2
公开(公告)日:2024-04-23
申请号:US17938307
申请日:2022-10-05
Applicant: Micron Technology, Inc.
Inventor: Murong Lang , Tingjun Xie , Fangfang Zhu , Zhenming Zhou , Jiangli Zhu
IPC: G06F3/06
CPC classification number: G06F3/0619 , G06F3/0629 , G06F3/0679
Abstract: Methods, apparatuses and systems related to managing deck-specific read levels are described. The apparatus may include a memory array having the memory cells organized into two or more decks. The apparatus can determine a delay between programming the decks. The apparatus can derive and implement the deck-specific read levels by selectively adjusting a base read level with an offset level according to the delay and/or the targeted read location.
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公开(公告)号:US20230395162A1
公开(公告)日:2023-12-07
申请号:US17938153
申请日:2022-10-05
Applicant: Micron Technology, Inc.
Inventor: Murong Lang , Tingjun Xie , Fangfang Zhu , Jiangli Zhu , Zhenming Zhou
CPC classification number: G11C16/26 , G11C16/102 , G11C16/12
Abstract: Methods, apparatuses and systems related to protecting an apparatus against unauthorized accesses or usages are described. The apparatus may include a data protection circuit that protects an operating state of the apparatus, data stored in the apparatus, or a combination thereof when a temperature of the apparatus is outside of an operating range thereof.
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公开(公告)号:US20230395152A1
公开(公告)日:2023-12-07
申请号:US17876346
申请日:2022-07-28
Applicant: Micron Technology, Inc.
Inventor: Tingjun Xie , Murong Lang , Fangfang Zhu , Jiangli Zhu , Zhenming Zhou
CPC classification number: G11C16/102 , G11C16/26 , G11C16/32 , G11C16/08
Abstract: A method includes performing, over a time period, a quantity of write operations associated with a quad-level cell (QLC) memory block, determining the time period exceeds a threshold time, designating the QLC memory block as a bimodal, determining a voltage threshold level of a last successful read operation associated with the QLC memory block, and setting a read threshold level of at least a portion of the QLC memory block at the voltage threshold level of the last successful read operation.
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公开(公告)号:US11790998B2
公开(公告)日:2023-10-17
申请号:US17411278
申请日:2021-08-25
Applicant: Micron Technology, Inc.
Inventor: Tingjun Xie , Zhenming Zhou , Zhenlei Shen , Charles See Yeung Kwong
CPC classification number: G11C16/3418 , G11C16/08 , G11C16/102 , G11C16/24 , G11C16/26
Abstract: A plurality of memory units residing in a first location of a memory device is identified, wherein the first location of the memory device corresponds to a first layer of a plurality of layers of the memory device. It is determined whether a write disturb capability associated with the first location of the memory device satisfies a threshold criterion. Responsive to determining that the write disturb capability associated with the first location of the memory device satisfies the threshold criterion, a plurality of logical addresses associated with the plurality of memory units is remapped to a second location of the memory device, wherein the second location of the memory device corresponds to a second layer of the plurality of layers of the memory device, and wherein a write disturb capability associated with the second location of the memory device does not satisfy the threshold criterion.
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公开(公告)号:US11742029B2
公开(公告)日:2023-08-29
申请号:US17402279
申请日:2021-08-13
Applicant: MICRON TECHNOLOGY, INC.
Inventor: Zhongguang Xu , Tingjun Xie , Murong Lang , Zhenming Zhou
CPC classification number: G11C16/26 , G11C16/102 , G11C16/30 , G11C16/32 , G11C16/3404
Abstract: A method includes performing a first write operation that writes data to a first memory unit of a group of memory units in a memory device, determining a write-to-write (W2W) delay based on a time difference between the first write operation and a second write operation on a memory unit in the group of memory units, wherein the second write operation occurred prior to the first write operation, identifying a threshold time criterion that is satisfied by the W2W delay, identifying a first read voltage level associated with the threshold time criterion, and associating the first read voltage level with a second memory unit of the group of memory units. The second memory unit can be associated with a second read voltage level that satisfies a selection criterion based on a comparison of the second read voltage level to the first read voltage level.
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公开(公告)号:US20230207041A1
公开(公告)日:2023-06-29
申请号:US18117583
申请日:2023-03-06
Applicant: Micron Technology, Inc.
Inventor: Zhenlei Shen , Tingjun Xie , Zhenming Zhou
CPC classification number: G11C29/42 , G06F11/1068 , G06F3/0619 , G06F3/0679 , G11C13/004 , G11C13/0069 , G06F3/0659 , G11C2029/0407
Abstract: A system includes a memory device having groups of managed units and a processing device coupled to the memory device. The processing device, during power on of the memory device, causes a read operation to be performed at a subset of a group of managed units and determines a bit error rate related to data read from the subset of the group of managed units. The bit error rate is a directional bit error rate resulting from an erroneously determined state compared to a programmed state that transitions between two opposing states. In response to the bit error rate satisfying a threshold criterion, the processing device causes a rewrite of the data stored at the group of managed units.
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公开(公告)号:US20230120838A1
公开(公告)日:2023-04-20
申请号:US18086580
申请日:2022-12-21
Applicant: Micron Technology, Inc.
Inventor: Tingjun Xie , Zhenming Zhou , Zhenlei Shen , Chih-Kuo Kao
Abstract: A processing device in a memory sub-system initiates read operations on each of a plurality of segments in a first region of the memory device during a first time interval, wherein at least a subset of the plurality of segments in the first region of the memory device are storing host data. The processing device further receives, as a result of at least one read operation, at least one data signal from a corresponding one of the plurality of segments in the first region of the memory device, and performs a signal calibration operation using the at least one data signal to synchronize one or more relevant signals with a reference clock signal used by the processing device.
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