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    PROSTHETIC HAND SYSTEM WITH AN INTEGRATED IMAGE RECOGNITION SUBSYSTEM
    2.
    发明公开
    PROSTHETIC HAND SYSTEM WITH AN INTEGRATED IMAGE RECOGNITION SUBSYSTEM 审中-公开

    公开(公告)号：US20240277491A1

    公开(公告)日：2024-08-22

    申请号：US18444401

    申请日：2024-02-16

    Applicant: Purdue Research Foundation

    Inventor： Soumya Bandyopadhyay ,  Justin A. Weibel

    IPC: A61F2/58 ,  A61F2/70 ,  G06T1/00 ,  G06T7/00

    CPC classification number: A61F2/586 ,  G06T1/0007 ,  G06T7/0002 ,  A61F2002/704

    Abstract: A prosthetic hand assembly includes a hand structure including an actuatable wrist, a palm, and a plurality of actuatable fingers coupled with a plurality of actuators each configured to selectively direct movement of the actuatable wrist, a camera disposed on one side of the hand structure, the camera is selectively operable to generate a plurality of successive images of an object positioned adjacent the hand structure, a processor coupled with the plurality of actuators, the processor is communicatively coupled with the camera and configured to receive the plurality of successive images of the object, wherein the processor is configured to determine one or more characteristic of the object from the plurality of successive images of the object, the processor is configured to selectively drive the plurality of actuators to affect the actuatable wrist and plurality of actuatable fingers based on the one or more characteristics.

    SYSTEMS AND METHODS FOR IN-PLANE CHARACTERIZATION OF ISOTROPIC AND ANISOTROPIC MATERIALS
    4.
    发明申请
    SYSTEMS AND METHODS FOR IN-PLANE CHARACTERIZATION OF ISOTROPIC AND ANISOTROPIC MATERIALS 有权

    公开(公告)号：US20250130187A1

    公开(公告)日：2025-04-24

    申请号：US18921393

    申请日：2024-10-21

    Applicant: Purdue Research Foundation

    Inventor： Aalok U. Gaitonde ,  Aaditya A. Candadai ,  Justin A. Weibel ,  Amy M. Marconnet

    IPC: G01N25/18 ,  G01J5/00 ,  G01J5/0806

    Abstract: An apparatus for measuring a property of a material sample includes a heatsink, a heat source, and a two-dimensional transient thermal imaging system. The heatsink is configured to support a material sample at a fixed position thereon and to maintain a preconfigured contact temperature with the material sample. The heat source is configured to direct an input heat signal at a fixed position toward an opening of the heatsink toward the material sample. The two-dimensional transient thermal imaging system is configured to generate a resultant two-dimensional transient temperature distribution dataset associated with the material sample upon the heat source directing the input heat signal toward the opening to heat the material sample.

    VAPOR CHAMBER DEVICES AND METHODS OF DISSIPATING HEAT THEREWITH
    7.
    发明申请
    VAPOR CHAMBER DEVICES AND METHODS OF DISSIPATING HEAT THEREWITH 有权

    公开(公告)号：US20210372709A1

    公开(公告)日：2021-12-02

    申请号：US17330842

    申请日：2021-05-26

    Applicant: Purdue Research Foundation

    Inventor： Soumya Bandyopadhyay ,  Amy Marie Marconnet ,  Justin A. Weibel

    IPC: F28D15/02 ,  F28D15/04

    Abstract: A vapor chamber device having a first vapor core configured to passively spread heat from a localized first input area to a relatively larger first output area adjacent to and in thermal contact with a heat output side of the vapor chamber device, and a second vapor core configured to passively spread heat from a localized second input area adjacent to and in thermal contact with a heat input side of the vapor chamber device to a relatively larger second output area in thermal contact with the first input area of the first vapor core. The second vapor core is configured to attenuate high heat flux hotspots on the first input area before the heat fluxes thereof pass through the second output area of the second vapor core to the first input area of the first vapor core.

    METHODS AND APPARATUSES FOR IMPEDANCE-BASED GAS DETECTION FOR MICROFLUIDIC SYSTEMS
    9.
    发明申请
    METHODS AND APPARATUSES FOR IMPEDANCE-BASED GAS DETECTION FOR MICROFLUIDIC SYSTEMS 有权
    用于微流体系统阻抗气体检测的方法和装置

    公开(公告)号：US20160287772A1

    公开(公告)日：2016-10-06

    申请号：US15085673

    申请日：2016-03-30

    Applicant: Purdue Research Foundation

    Inventor： Pierre Valiorgue ,  Justin A. Weibel ,  Suresh V. Garimella

    IPC: A61M1/16 ,  G01N27/02

    CPC classification number: A61M1/16 ,  A61M1/3626 ,  A61M2205/0244 ,  A61M2205/3317 ,  A61M2205/702 ,  B01L3/5027 ,  B01L2300/0645 ,  B01L2300/0816

    Abstract: Methods and apparatuses for detection of gas bubbles in a microchannel configured for a conductive fluid to flow therethrough. The methods and apparatuses utilize a plate and at least two aligned electrodes embedded within the plate. The plate is configured to be located over the microchannel such that the at least two aligned electrodes are located along a length of the microchannel in the flow direction. Impedance is measured between the electrodes, and the percentage of gas within the fluid flowing through the microchannel is measured based on the measured impedance between the electrodes.

    Abstract translation: 用于检测微通道中的气泡的方法和装置，其构造成用于使导电流体流过其中。 所述方法和装置利用板和嵌入板内的至少两个排列的电极。 板被配置为位于微通道上方，使得至少两个对准的电极沿着流动方向上的微通道的长度定位。 在电极之间测量阻抗，并且基于测量的电极之间的阻抗测量流过微通道的流体内的气体百分比。

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