公开(公告)号：US20190066991A1

公开(公告)日：2019-02-28

申请号：US16101647

申请日：2018-08-13

Applicant: Purdue Research Foundation

Inventor： Robert Graham Cooks ,  Alan Keith Jarmusch ,  Valentina Pirro

IPC: H01J49/04 ,  A61B5/145 ,  A61B5/00 ,  A61B10/02 ,  A61F13/38 ,  H01J49/16

Abstract: The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.

公开(公告)号：US11710626B2

公开(公告)日：2023-07-25

申请号：US17222194

申请日：2021-04-05

Applicant: Purdue Research Foundation

Inventor： Robert Graham Cooks ,  Alan Keith Jarmusch ,  Valentina Pirro

IPC: G01N30/72 ,  H01J49/04 ,  A61B5/145 ,  A61B5/00 ,  H01J49/16 ,  A61F13/38 ,  A61B10/02 ,  G01N1/02

CPC classification number: H01J49/0459 ,  A61B5/14503 ,  A61B5/7282 ,  A61B10/02 ,  A61F13/38 ,  G01N30/72 ,  H01J49/0409 ,  H01J49/165 ,  G01N2001/028

Abstract: The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.

公开(公告)号：US12125691B2

公开(公告)日：2024-10-22

申请号：US18208116

申请日：2023-06-09

Applicant: Purdue Research Foundation

Inventor： Robert Graham Cooks ,  Alan Keith Jarmusch ,  Valentina Pirro

IPC: H01J49/04 ,  A61B5/00 ,  A61B5/145 ,  A61B10/02 ,  A61F13/38 ,  G01N30/72 ,  H01J49/16 ,  G01N1/02

CPC classification number: H01J49/0459 ,  A61B5/14503 ,  A61B5/7282 ,  A61B10/02 ,  A61F13/38 ,  G01N30/72 ,  H01J49/0409 ,  H01J49/165 ,  G01N2001/028

Abstract: The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.

公开(公告)号：US20230386816A1

公开(公告)日：2023-11-30

申请号：US18208116

申请日：2023-06-09

Applicant: Purdue Research Foundation

Inventor： Robert Graham Cooks ,  Alan Keith Jarmusch ,  Valentina Pirro

IPC: H01J49/04 ,  A61B5/145 ,  A61B5/00 ,  H01J49/16 ,  A61F13/38 ,  A61B10/02 ,  G01N30/72

CPC classification number: H01J49/0459 ,  A61B5/14503 ,  A61B5/7282 ,  H01J49/165 ,  A61F13/38 ,  H01J49/0409 ,  A61B10/02 ,  G01N30/72 ,  G01N2001/028

Abstract: The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.

公开(公告)号：US20220005681A1

公开(公告)日：2022-01-06

申请号：US17222194

申请日：2021-04-05

Applicant: Purdue Research Foundation

Inventor： Robert Graham Cooks ,  Alan Keith Jarmusch ,  Valentina Pirro

IPC: H01J49/04 ,  A61B5/145 ,  A61B5/00 ,  H01J49/16 ,  A61F13/38 ,  A61B10/02 ,  G01N30/72

Abstract: The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.

公开(公告)号：US10998178B2

公开(公告)日：2021-05-04

申请号：US16101647

申请日：2018-08-13

Applicant: Purdue Research Foundation

Inventor： Robert Graham Cooks ,  Alan Keith Jarmusch ,  Valentina Pirro

IPC: H01J49/04 ,  A61B5/145 ,  A61B5/00 ,  H01J49/16 ,  A61F13/38 ,  A61B10/02 ,  G01N30/72 ,  G01N1/02

Abstract: The invention generally relates to systems and methods for sample analysis using swabs. In certain aspects, the invention provides systems that include a probe having a conductive proximal portion coupled to a porous material at a distal portion of the probe that is configured to retain a portion of a sample that has contacted the porous material, and a mass spectrometer having an inlet. The system is configured such that the porous material at a distal portion of the probe is aligned over the inlet of the mass spectrometer.