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公开(公告)号:US20170322147A1
公开(公告)日:2017-11-09
申请号:US15525327
申请日:2014-11-11
Applicant: SHIMADZU CORPORATION
Inventor: Kazuo SUGIHARA
CPC classification number: G01N21/3103 , G01J3/10 , G01J3/42 , G01N2021/3111
Abstract: There are provided an atomic absorption photometer and an atomic absorption measurement method which can easily perform background correction in a short time period by using a plurality of types of methods while suppressing the amount of samples consumed. Background correction is performing by using each of the D2 lamp method, the Zeeman method, and a self-reversal method, according to measurement data in each of measurement periods T41 to T46 obtained in one data acquisition cycle. Background correction is performed on the common measurement data (atomic absorption data) obtained in the atomic absorption measurement period T41, by using the measurement data (background data) obtained in each of the first to third background measurement periods T44, T46, and T42.
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公开(公告)号:US20200225148A1
公开(公告)日:2020-07-16
申请号:US16641816
申请日:2017-08-31
Applicant: Shimadzu Corporation
Inventor: Kazuo SUGIHARA
Abstract: A storage unit stores first and second calibration curves. The first calibration curve represents a relationship between an absorbance of a first standard sample for light at a wavelength λ1 and a concentration of a target composition in the first standard sample. The second calibration curve represents a relationship between an absorbance of a second standard sample for light at a wavelength λ2 and a concentration of the target composition in the second standard sample. The second standard sample has a higher concentration than that of the first standard sample. When the absorbance of the unknown sample for the light at the wavelength λ1 is less than a threshold, a concentration measurement processing unit measures a concentration of the target composition in the unknown sample, based on the absorbance of the unknown sample for the light at the wavelength λ1 and the first calibration curve.
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