公开(公告)号：US20160172177A1

公开(公告)日：2016-06-16

申请号：US14908629

申请日：2014-07-31

Applicant: SMITHS DETECTION INC.

Inventor： Vadym BERKOUT

IPC: H01J49/06 ,  H01J49/26 ,  H01J49/04

Abstract: An intermittent sample inlet device and methods for use of the intermittent sample inlet device are described that include an orifice plate with an entrance orifice and a rotating skimmer with a skimmer orifice, where the rotating skimmer is disposed between the orifice plate and a vacuum chamber wall. The rotating skimmer rotates so that the skimmer orifice intermittently aligns with the entrance orifice and allows an ion sample to pass through to a mass analyzer.

Abstract translation: 描述间歇式样品入口装置和使用间歇式样品入口装置的方法，其包括具有入口孔的孔板和具有撇渣器孔的旋转撇渣器，其中旋转撇渣器设置在孔板和真空室壁之间 。 旋转分离器旋转，使得分离器孔口与入口孔间歇地对准，并允许离子样品通过质量分析器。