公开(公告)号：US20160231174A1

公开(公告)日：2016-08-11

申请号：US14843310

申请日：2015-09-02

Applicant: Sekonic Corporation

Inventor： Tomohide KANZAWA ,  Hiroshi HARADA ,  Yasushi FUKAZAWA ,  Eigo YOSHIKAWA ,  Hirohiko OKABE

IPC: G01J3/50 ,  G01J3/02

CPC classification number: G01J3/0272 ,  G01J1/0233 ,  G01J1/0403 ,  G01J1/0411 ,  G01J1/0418 ,  G01J1/0422 ,  G01J1/0448 ,  G01J1/0474 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0213 ,  G01J3/0216 ,  G01J3/0237 ,  G01J3/46

Abstract: Disclosed is a photometric apparatus improved in measurement precision by improving the state of light incident to a sensor. The photometric apparatus 1 includes a photometric sensor 30 into which light which is an object to be measured is incident, a signal processing element for processing a sensor output by the photometric sensor, and optical systems 50, 100, 92, 93 and 150 which introduces external light into the photometric sensor, wherein a columnar fiber rod 100 in which a center axis is provided along a direction perpendicular to a light receiving surface of the photometric sensor is provided at a part of the optical system.

Abstract translation: 公开了一种通过改善入射到传感器的光的状态来提高测量精度的测光装置。 测光装置1包括测光传感器30，测量对象物入射到该测光传感器30中，用于处理由测光传感器输出的传感器的信号处理元件以及引入了光测量传感器的光学系统50,100,92,93和150 外部光进入光度传感器，其中在光学系统的一部分处设置有沿着与测光传感器的光接收表面垂直的方向设置中心轴的柱状纤维杆100。