公开(公告)号：US12061116B2

公开(公告)日：2024-08-13

申请号：US17876250

申请日：2022-07-28

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Mohamed H. Al Haron ,  Bassem Mortada ,  Ahmed Othman ,  Diaa Khalil ,  Bassam Saadany ,  Ahmed Shebl ,  Botros George Iskander Shenouda

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/28 ,  G01J3/45 ,  G01J3/453 ,  G01N33/483

CPC classification number: G01J3/0256 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0286 ,  G01J3/108 ,  G01J3/45 ,  G01J3/4532 ,  G01N33/4833 ,  G01J2003/283 ,  G01J2003/2873 ,  G01J2003/4534

Abstract: Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (AI) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.

公开(公告)号：US20230036551A1

公开(公告)日：2023-02-02

申请号：US17876250

申请日：2022-07-28

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Mohamed H. Al Haron ,  Bassem Mortada ,  Ahmed Othman ,  Diaa Khalil ,  Bassam Saadany ,  Ahmed Shebl ,  Botros George Iskander Shenouda

IPC: G01J3/02 ,  G01J3/45 ,  G01J3/10 ,  G01N33/483

Abstract: Aspects relate to a spectral analyzer that can be used for biological sample detection. The spectral analyzer includes an optical window configured to receive a sample and a spectral sensor including a chassis having various component assembled thereon. Examples of components may include a light source, a light modulator, illumination and collection optical elements, a detector, and a processor. The spectral analyzer is configured to obtain spectral data representative of a spectrum of the sample using, for example, an artificial intelligence (AI) engine. The spectral analyzer further includes a thermal separator positioned between the light modulator and the light source.

公开(公告)号：US11841268B2

公开(公告)日：2023-12-12

申请号：US17590781

申请日：2022-02-01

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Bassem A. Mortada ,  Khaled Hassan ,  Abdelrahman Ahmed Maher Mohamed Elsayed Salem ,  Diaa Khalil ,  Mohamed H. Al Haron ,  Mohammed Ahmed Elsheikh ,  Ahmed Shebl ,  Bassam Saadany ,  Mostafa Medhat ,  Botros George Iskander Shenouda

IPC: G01J3/02 ,  G02B19/00

CPC classification number: G01J3/0256 ,  G01J3/0216 ,  G02B19/0019

Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.

公开(公告)号：US20220244101A1

公开(公告)日：2022-08-04

申请号：US17590781

申请日：2022-02-01

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Bassem A. Mortada ,  Khaled Hassan ,  Abdelrahman Ahmed Maher Mohamed Elsayed Salem ,  Diaa Khalil ,  Mohamed H. Al Haron ,  Mohammed Ahmed Elsheikh ,  Ahmed Shebl ,  Bassam Saadany ,  Mostafa Medhat ,  Botros George Iskander Shenouda

IPC: G01J3/02 ,  G02B19/00

Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.

公开(公告)号：US20230393173A1

公开(公告)日：2023-12-07

申请号：US18204853

申请日：2023-06-01

Applicant: Si-Ware Systems

Inventor： Tarek Mohamed Zeinah ,  Bassem Mortada ,  Momen Anwar ,  Mohamed Ramadan ,  Mohamed Hamouda ,  Yasser M. Sabry ,  Diaa Khalil ,  Ahmed Shebl ,  Bassam Saadany ,  Ahmed Emad ,  Mohamed Badr ,  Moez ElMassry

IPC: G01R1/073 ,  G06T7/00 ,  G06T7/73

CPC classification number: G01R1/07342 ,  G06T7/0004 ,  G06T7/73 ,  G06T2207/30148 ,  G08B21/182

Abstract: Aspects of the disclosure relate to an apparatus including an opto-electrical probe card platform for wafer-level testing of optical micro-electro-mechanical-systems (MEMS) structures. The probe card platform includes an electrical probe card including alignment needles for aligning with an optical MEMS structure during testing thereof. The probe card platform further includes an optical head configured to direct input light to towards the optical MEMS structure through the electrical probe card and an optical positioner attached to the electrical probe card and configured to align the optical head. The apparatus may further include a camera and a processor configured to process at least one image obtained by the camera and to generate alignment assistance data to assist the optical positioner in aligning the optical head.

公开(公告)号：US20220397458A1

公开(公告)日：2022-12-15

申请号：US17575591

申请日：2022-01-13

Applicant: Si-Ware Systems

Inventor： Yasser M. Sabry ,  Erik R. Deutsch ,  Bassam Saadany ,  Bassem A. Mortada ,  Mohamed H. Al Haron ,  Mazen Erfan ,  Moustafa Mohamed ,  Mohammed Sadek ,  Mostafa Medhat ,  Ahmed Shebl

IPC: G01J3/45 ,  G01J3/02 ,  G01N21/31

Abstract: Aspects relate to mechanisms for mass screening of samples. A portable laboratory device based on spectroscopic analysis of samples containing analytes under test can facilitate the mass screening. The portable laboratory device can include a sample head including a structure configured to facilitate application of the sample to the sample head and an optical measurement device including one or more light sources and a spectrometer. Light from the light source(s) incident on the sample may be directed to the spectrometer to obtain a spectrum of the sample. The optical measurement device can further include a data transfer device configured to provide the spectrum obtained by the spectrometer to a spectrum analyzer to produce a result from the spectrum.

公开(公告)号：US11085825B2

公开(公告)日：2021-08-10

申请号：US16368771

申请日：2019-03-28

Applicant: Si-Ware Systems

Inventor： Mostafa Medhat ,  Bassem Mortada ,  Yasser Sabry ,  Mohamed Hossam ,  Momen Anwar ,  Ahmed Shebl ,  Hisham Haddara ,  Bassam A. Saadany

IPC: G01J3/45 ,  G01J3/02 ,  G01J3/10 ,  G01J3/42 ,  G01J3/453 ,  G01J3/26

Abstract: Aspects of the disclosure relate to a self-referenced spectrometer for providing simultaneous measurement of a background or reference spectral density and a sample or other spectral density. The self-referenced spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interfering beam and a second optical path to produce a second interfering beam, where each interfering beam is produced prior to an output of the interferometer. The spectrometer further includes a detector optically coupled to simultaneously detect a first interference signal produced from the first interfering beam and a second interference signal produced from the second interfering beam, and a processor configured to process the first interference signal and the second interference signal and to utilize the second interference signal as a reference signal in processing the first interference signal.

公开(公告)号：US10782342B2

公开(公告)日：2020-09-22

申请号：US15818736

申请日：2017-11-20

Applicant: Si-Ware Systems

Inventor： Bassam Saadany ,  Mostafa Medhat ,  Muhammad Nagi ,  Ahmed Shebl ,  Yasser M. Sabry ,  Bassem Mortada ,  Diaa Khalil

IPC: G01R31/308 ,  G01M11/00 ,  B81C99/00 ,  G01R1/07 ,  G01R31/28 ,  G02B6/42 ,  G02B26/00

Abstract: Aspects relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.

公开(公告)号：US20190301939A1

公开(公告)日：2019-10-03

申请号：US16368771

申请日：2019-03-28

Applicant: Si-Ware Systems

Inventor： Mostafa Medhat ,  Bassem Mortada ,  Yasser Sabry ,  Mohamed Hossam ,  Momen Anwar ,  Ahmed Shebl ,  Hisham Haddara ,  Bassam A. Saadany

IPC: G01J3/45 ,  G01J3/10 ,  G01J3/02 ,  G01J3/42

Abstract: Aspects of the disclosure relate to a self-referenced spectrometer for providing simultaneous measurement of a background or reference spectral density and a sample or other spectral density. The self-referenced spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interfering beam and a second optical path to produce a second interfering beam, where each interfering beam is produced prior to an output of the interferometer. The spectrometer further includes a detector optically coupled to simultaneously detect a first interference signal produced from the first interfering beam and a second interference signal produced from the second interfering beam, and a processor configured to process the first interference signal and the second interference signal and to utilize the second interference signal as a reference signal in processing the first interference signal.

公开(公告)号：US20180143245A1

公开(公告)日：2018-05-24

申请号：US15818736

申请日：2017-11-20

Applicant: Si-Ware Systems

Inventor： Bassam Saadany ,  Mostafa Medhat ,  Muhammad Nagi ,  Ahmed Shebl ,  Yasser M. Sabry ,  Bassem Mortada ,  Diaa Khalil

IPC: G01R31/308 ,  B81C99/00 ,  G02B26/00 ,  G02B6/42 ,  G01R31/28 ,  G01R1/07

Abstract: Aspects of the disclosure relate to an integrated optical probe card and a system for performing wafer testing of optical micro-electro-mechanical systems (MEMS) structures with an in-plane optical axis. On-wafer optical screening of optical MEMS structures may be performed utilizing one or more micro-optical bench components to redirect light between an out-of-plane direction that is perpendicular to the in-plane optical axis to an in-plane direction that is parallel to the in-plane optical axis to enable testing of the optical MEMS structures with vertical injection of the light.