公开(公告)号：US20250149426A1

公开(公告)日：2025-05-08

申请号：US18895309

申请日：2024-09-24

Applicant: Unimicron Technology Corp.

Inventor： An-Sheng Lee ,  Chen-Hao Lin ,  Kai-Ming Yang ,  Pu-Ju Lin ,  Cheng-Ta Ko ,  Chin-Sheng Wang ,  Tzyy-Jang Tseng

IPC: H01L23/498 ,  H01L23/00 ,  H01L25/00 ,  H01L25/16

Abstract: A package structure includes a package substrate, an organic interposer and an electronic unit. The package substrate includes a plurality of first pads. The organic interposer is disposed on the package substrate and includes a plurality of second pads. The second pads are directly connected to the first pads to electrically connected the organic interposer to the package substrate. At least one of each of the first pads and each of the second pads includes a pad portion and a plurality of contact portions connecting the pad portion. A first extension direction of the pad portion is different from a second extension direction of the contact portions. The electronic unit is disposed on the organic interposer, wherein the electronic unit is electrically connected to the package substrate through the organic interposer.

公开(公告)号：US20240237202A9

公开(公告)日：2024-07-11

申请号：US17992933

申请日：2022-11-23

Applicant: Unimicron Technology Corp.

Inventor： Kai-Ming Yang ,  Chia-Yu Peng ,  Cheng-Ta Ko ,  Pu-Ju Lin

IPC: H05K1/02 ,  H05K1/11 ,  H05K3/46

CPC classification number: H05K1/0298 ,  H05K1/11 ,  H05K3/4644 ,  H05K2203/041

Abstract: A circuit board structure includes a carrier, a thin film redistribution layer disposed on the carrier, solder balls electrically connected to the thin film redistribution layer and the carrier, and a surface treatment layer. The thin film redistribution layer includes a first dielectric layer, pads, a first metal layer, a second dielectric layer, a second metal layer, and a third dielectric layer. A top surface of the first dielectric layer is higher than an upper surface of each pad. The first metal layer is disposed on a first surface of the first dielectric layer. The second dielectric layer has second openings exposing part of the first metal layer. The second metal layer extends into the second openings and is electrically connected to the first metal layer. The third dielectric layer has third openings exposing part of the second metal layer. The surface treatment layer is disposed on the upper surfaces.

公开(公告)号：US11943877B2

公开(公告)日：2024-03-26

申请号：US17684421

申请日：2022-03-02

Applicant: Unimicron Technology Corp.

Inventor： Wen-Yu Lin ,  Kai-Ming Yang ,  Chen-Hao Lin ,  Pu-Ju Lin ,  Cheng-Ta Ko ,  Chin-Sheng Wang ,  Guang-Hwa Ma ,  Tzyy-Jang Tseng

IPC: H05K3/24 ,  H01L21/56 ,  H01L23/15 ,  H01L23/31 ,  H01L23/488 ,  H01L23/544 ,  H05K1/11 ,  H05K3/46

CPC classification number: H05K3/467 ,  H05K1/112 ,  H05K2201/0191

Abstract: A circuit board structure includes a circuit substrate having opposing first and second sides, a redistribution structure disposed at the first side, and a dielectric structure disposed at the second side. The circuit substrate includes a first circuit layer disposed at the first side and a second circuit layer disposed at the second side. The redistribution structure is electrically coupled to the circuit substrate and includes a first leveling dielectric layer covering the first circuit layer, a first thin-film dielectric layer disposed on the first leveling dielectric layer and having a material different from the first leveling dielectric layer, and a first redistributive layer disposed on the first thin-film dielectric layer and penetrating through the first thin-film dielectric layer and the first leveling dielectric layer to be in contact with the first circuit layer. The dielectric structure includes a second leveling dielectric layer disposed below the second circuit layer.

公开(公告)号：US20220336333A1

公开(公告)日：2022-10-20

申请号：US17233551

申请日：2021-04-19

Applicant: Unimicron Technology Corp.

Inventor： John Hon-Shing Lau ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Kai-Ming Yang ,  Chia-Yu Peng ,  Chi-Hai Kuo ,  Tzyy-Jang Tseng

IPC: H01L23/498 ,  H01L21/48 ,  H01L23/00

Abstract: A package structure includes at least one first redistribution layer, at least one second redistribution layer, a chip pad, a solder ball pad, a chip, a solder ball, and a molding compound. The first redistribution layer includes a first dielectric layer and a first redistribution circuit that fills a first opening and a second opening of the first dielectric layer. The first dielectric layer is aligned with the first redistribution circuit. The second redistribution layer includes a second and a third dielectric layers and a second redistribution circuit. The third dielectric layer is aligned with the second redistribution circuit. The chip pad and the solder ball pad are electrically connected to the first and the second redistribution circuits respectively. The chip and the solder ball are disposed on the chip pad and the solder ball pad respectively. The molding compound at least covers the chip and the chip pad.

公开(公告)号：US20220246810A1

公开(公告)日：2022-08-04

申请号：US17209110

申请日：2021-03-22

Applicant: Unimicron Technology Corp.

Inventor： Tzyy-Jang Tseng ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Chi-Hai Kuo ,  Kai-Ming Yang

IPC: H01L33/62 ,  H01L23/31 ,  H01L23/538 ,  H01L21/683 ,  H01L21/48 ,  H01L21/56 ,  H01L33/54

Abstract: A manufacturing method of a package structure is provided, which includes the following steps. A carrier having a surface is provided. A copper foil layer is laminated on the surface of the carrier. A subtractive process is performed on the copper foil layer to form a copper foil circuit layer on the carrier. The copper foil circuit layer exposes a part of the surface of the carrier. A build-up structure layer is formed on the copper foil circuit layer and the surface of the carrier. A first surface of the copper foil circuit layer is aligned with a second surface of the build-up structure layer. At least one electronic component is disposed on the build-up structure layer. A package colloid is formed to cover the electronic component and the build-up structure layer. The carrier is removed to expose the first surface of the copper foil circuit layer.

公开(公告)号：US20220208630A1

公开(公告)日：2022-06-30

申请号：US17155094

申请日：2021-01-22

Applicant: Unimicron Technology Corp.

Inventor： Kai-Ming Yang ,  Chia-Yu Peng ,  Pei-Chi Chen ,  Pu-Ju Lin ,  Cheng-Ta Ko

IPC: H01L23/31 ,  H01L23/498 ,  H01L21/56 ,  H01L21/78

Abstract: A chip packaging structure includes a chip, a redistribution layer, a solder ball, an encapsulant, and a stress buffer layer. The chip has an active surface and a back surface opposite to each other, and a peripheral surface connected to the active surface and the back surface. The redistribution layer is disposed on the active surface of the chip. The solder ball is disposed on the redistribution layer, and the chip is electrically connected to the solder ball through the redistribution layer. The encapsulant encapsulates the active surface and the back surface of the chip, the redistribution layer, and part of the solder ball. The stress buffer layer at least covers the peripheral surface of the chip. An outer surface of the stress buffer layer is aligned with a side surface of the encapsulant.

公开(公告)号：US10588214B2

公开(公告)日：2020-03-10

申请号：US16543609

申请日：2019-08-18

Applicant: Unimicron Technology Corp.

Inventor： Tzyy-Jang Tseng ,  Kai-Ming Yang ,  Pu-Ju Lin ,  Cheng-Ta Ko ,  Yu-Hua Chen

IPC: H05K1/02 ,  H05K1/11

Abstract: A stacked structure includes a circuit board, an electronic component, metallic cores, and insulating cladding layers. The circuit board includes first bonding pads. The electronic component includes second bonding pads that are opposite to the first bonding pads. Each metallic core is connected to a corresponding first bonding pad and a corresponding second bonding pad. The metallic cores have a curved surface interposed between the corresponding first bonding pad and the corresponding second bonding pad. The insulating cladding layers are separated from each other and cover the curved surfaces of the metallic cores.

公开(公告)号：US20180070452A1

公开(公告)日：2018-03-08

申请号：US15256757

申请日：2016-09-06

Applicant: Unimicron Technology Corp.

Inventor： Pu-Ju Lin ,  Shih-Lian Cheng ,  Yu-Hua Chen ,  Cheng-Ta Ko ,  Jui-Jung Chien ,  Wei-Tse Ho

IPC: H05K3/06 ,  H05K3/10 ,  H05K3/42 ,  H05K3/24 ,  G03F7/16 ,  G03F7/20 ,  G03F7/09 ,  G03F7/32 ,  G03F7/40 ,  G03F1/50 ,  G03F1/76

CPC classification number: G03F1/50 ,  G01K7/24 ,  G01K15/007 ,  G03F7/2032 ,  G03F7/2047 ,  H05K3/0023 ,  H05K3/064 ,  H05K3/107 ,  H05K3/1275 ,  H05K3/182 ,  H05K3/241 ,  H05K3/422

Abstract: A manufacturing method of a circuit substrate is provided. A substrate is provided. A positive photoresist layer is coated on the substrate. Once exposure process is performed on the positive photoresist layer disposed on the substrate so as to simultaneously form concaves with at least two different depths.

公开(公告)号：US12218017B2

公开(公告)日：2025-02-04

申请号：US17586106

申请日：2022-01-27

Applicant: UNIMICRON TECHNOLOGY CORP.

Inventor： Wen Yu Lin ,  Kai-Ming Yang ,  Pu-Ju Lin

IPC: C03C17/00 ,  C03C17/22 ,  C03C17/42 ,  H01L23/10 ,  H01L23/15 ,  H01L23/29 ,  H05K1/03

Abstract: The invention discloses a glass carrier having a protection structure, comprising a glass body and a protection layer. The glass body has a top surface, a bottom surface, and a lateral surface. The protection layer covers the lateral surface of the glass body. The protection layer is a hard material with a stiffness coefficient higher than a stiffness coefficient of the glass body. The invention further discloses a manufacturing method of a glass carrier having a protection structure, comprising the following steps: covering the protection layer around the lateral surface of the glass body, wherein the protection layer is the hard material with the stiffness coefficient higher than the stiffness coefficient of the glass body.

公开(公告)号：US11991824B2

公开(公告)日：2024-05-21

申请号：US17448893

申请日：2021-09-26

Applicant: Unimicron Technology Corp.

Inventor： Tzyy-Jang Tseng ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Chi-Hai Kuo ,  Shao-Chien Lee ,  Ming-Ru Chen ,  Cheng-Chung Lo

IPC: H05K1/02 ,  G02F1/1333 ,  G02F1/1368 ,  H05K1/03 ,  H05K1/11 ,  H05K3/00 ,  H10K59/12 ,  H10K59/123 ,  H10K59/124 ,  H10K59/131

CPC classification number: H05K1/115 ,  H05K1/0306 ,  H05K3/0067 ,  H05K3/0094

Abstract: A circuit board structure includes a first sub-circuit board, a second sub-circuit board, and a third sub-circuit board. The first sub-circuit board has an upper surface and a lower surface opposite to each other, and includes at least one first conductive through hole. The second sub-circuit board is disposed on the upper surface of the first sub-circuit board and includes at least one second conductive through hole. The third sub-circuit board is disposed on the lower surface of the first sub-circuit board and includes at least one third conductive through hole. At least two of the first conductive through hole, the second conductive through hole, and the third conductive through hole are alternately arranged in an axial direction perpendicular to an extending direction of the first sub-circuit board. The first, second and third sub-circuit boards are electrically connected to one another.