公开(公告)号：US11796490B2

公开(公告)日：2023-10-24

申请号：US17366759

申请日：2021-07-02

Applicant: UNIVERSITY OF WASHINGTON

Inventor： Gerald Todd Seidler ,  Oliver Hoidn ,  William Holden

IPC: G01N23/207 ,  G01N23/20025 ,  G01N23/20091 ,  G01N23/20008 ,  G01T7/10 ,  G02B26/08 ,  G01T1/29 ,  G02B27/09 ,  G01N23/20

CPC classification number: G01N23/2076 ,  G01N23/207 ,  G01N23/20008 ,  G01N23/20025 ,  G01N23/20091 ,  G01N23/20 ,  G01N2223/052 ,  G01N2223/307 ,  G01N2223/309 ,  G01N2223/32 ,  G01N2223/5015 ,  G01N2291/045 ,  G01T1/2978 ,  G01T7/10 ,  G02B26/0816 ,  G02B27/0983 ,  G21K2201/062 ,  G21K2201/064

Abstract: A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.

公开(公告)号：US11054375B2

公开(公告)日：2021-07-06

申请号：US16333405

申请日：2017-09-15

Applicant: UNIVERSITY OF WASHINGTON

Inventor： Gerald Todd Seidler ,  Oliver Hoidn ,  William Holden

IPC: G01N23/207 ,  G01N23/20025 ,  G01N23/20091 ,  G01N23/20008 ,  G01T7/10 ,  G02B26/08 ,  G01T1/29 ,  G02B27/09 ,  G01N23/20

Abstract: A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, an x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.