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公开(公告)号:US09862600B2
公开(公告)日:2018-01-09
申请号:US14718152
申请日:2015-05-21
Applicant: ams International AG
Inventor: Roel Daamen , Hendrik Bouman , Kailash Vijayakumar
CPC classification number: B81C1/00825 , B81B7/0016 , B81B2201/0264 , B81B2203/0127 , B81B2207/015 , B81B2207/03 , B81C2201/0104 , B81C2201/0146 , B81C2203/0735 , H01L23/642
Abstract: One example discloses an chip, comprising: a substrate; a first side of a passivation layer coupled to the substrate; a device, having a device height and a cavity, wherein a first device surface is coupled to a second side of the passivation layer which is opposite to the first side of the passivation layer; and a set of structures coupled to the second side of the passivation layer and configured to have a structure height greater than or equal to the device height.
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公开(公告)号:US20160340180A1
公开(公告)日:2016-11-24
申请号:US14718152
申请日:2015-05-21
Applicant: ams International AG
Inventor: Roel Daamen , Hendrik Bouman , Kailash Vijayakumar
CPC classification number: B81C1/00825 , B81B7/0016 , B81B2201/0264 , B81B2203/0127 , B81B2207/015 , B81B2207/03 , B81C2201/0104 , B81C2201/0146 , B81C2203/0735 , H01L23/642
Abstract: One example discloses an chip, comprising: a substrate; a first side of a passivation layer coupled to the substrate; a device, having a device height and a cavity, wherein a first device surface is coupled to a second side of the passivation layer which is opposite to the first side of the passivation layer; and a set of structures coupled to the second side of the passivation layer and configured to have a structure height greater than or equal to the device height.
Abstract translation: 一个实例公开了一种芯片,包括:基板; 耦合到所述衬底的钝化层的第一侧; 具有器件高度和空腔的器件,其中第一器件表面耦合到钝化层的与钝化层的第一侧相对的第二侧; 以及耦合到钝化层的第二侧并且被配置为具有大于或等于器件高度的结构高度的一组结构。
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