Load-lock gauge
    3.
    发明授权

    公开(公告)号:US12055452B2

    公开(公告)日:2024-08-06

    申请号:US18475515

    申请日:2023-09-27

    Abstract: A load lock pressure gauge comprises a housing configured to be coupled to a load lock vacuum chamber. The housing supports an absolute vacuum pressure sensor that provides instantaneous high vacuum pressure signal over a range of high vacuum pressures and a differential diaphragm pressure sensor that provides an instantaneous differential pressure signal between load lock pressure and ambient pressure. The housing further supports an absolute ambient pressure sensor. A low vacuum absolute pressure is computed from the instantaneous differential pressure signal and the instantaneous ambient pressure signal. A controller in the housing is able to recalibrate the differential diaphragm pressure sensor based on measured voltages of the sensor and a measured ambient pressure during normal operation of the pressure gauge with routine cycling of pressure in the load lock.

    MEMS MODULE
    4.
    发明公开
    MEMS MODULE 审中-公开

    公开(公告)号:US20240116750A1

    公开(公告)日:2024-04-11

    申请号:US18480936

    申请日:2023-10-04

    Applicant: ROHM CO., LTD.

    Inventor: Takashi NAIKI

    CPC classification number: B81B7/0048 B81B2201/0264 B81B2207/07

    Abstract: A MEMS module includes: a substrate; a semiconductor chip in which a MEMS including a mechanical movable portion is formed; and a soft member that is interposed between the substrate and the semiconductor chip and has a lower hardness than the substrate, wherein the soft member is disposed in a partial region of a first main surface of the semiconductor chip facing the substrate.

    Micromechanical sensor unit and method for manufacturing a micromechanical sensor unit

    公开(公告)号:US11912565B2

    公开(公告)日:2024-02-27

    申请号:US17282331

    申请日:2019-12-17

    Abstract: A micromechanical sensor unit, including: a substrate and an edge layer, which is situated on the substrate and laterally frames an inner area above the substrate; at least one diaphragm, which spans the inner area and forms a covered cavity above the substrate; at least one support point, which is situated between the substrate and the diaphragm inside the cavity and attaches the diaphragm to the edge layer and/or to the at least one support point. The support point separates the diaphragm into at least one measuring area that is movable through force action and at least one reference area that is not movable through force action. The substrate and the diaphragm, inside the cavity, include electrodes, which face one another in the measuring area and the reference area.

    Micro-electro-mechanical system acoustic sensor, micro-electro-mechanical system package structure and method for manufacturing the same

    公开(公告)号:US11905164B2

    公开(公告)日:2024-02-20

    申请号:US17468423

    申请日:2021-09-07

    Abstract: A micro-electro-mechanical system acoustic sensor, a micro-electro-mechanical system package structure and a method for manufacturing the same are provided. The micro-electro-mechanical system acoustic sensor comprises a substrate, a cantilever structure and a diaphragm sensor. The cantilever structure is formed on the substrate, and comprises a fixed end and a free cantilever portion extended from the fixed end. The free cantilever portion comprises a free end. The free end and the fixed end are respectively at opposing sides of the free cantilever portion. The free cantilever portion is capable of generating a vibration wave in an empty space. The diaphragm sensor is formed on the substrate, and comprises a diaphragm film, a back plate, and at least one electrical contact point. The back plate and the diaphragm film have a first empty gap there between. The empty space and the first empty gap communicate to each other.

    Differential mems device and methods

    公开(公告)号:US11892465B2

    公开(公告)日:2024-02-06

    申请号:US17667180

    申请日:2022-02-08

    Applicant: Movella Inc.

    Abstract: A MEMS device includes a first MEMS sensor associated with a first spatial plane and a second MEMS sensor is associated with a spatial second plane not co-planar with the first spatial plane, wherein the first MEMS sensor is configured to provide a first interrupt and a first data in response to a physical perturbation, wherein the second MEMS sensor is configured to provide a second interrupt and second data in response to the physical perturbation, and a controller configured to receive the first interrupt at a first time and the second interrupt at a second time different from the first time, wherein the controller is configured to determine a latency between the first time and the second time, and wherein the controller is configured to determine motion data in response to the first data, to the second data, and to the latency.

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